Image sensors with sinusoidal reset, noise cancellation, and nonpulsed charge transfer for inspection and metrology
US-2026032353-A1 · Jan 29, 2026 · US
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Contarato Devis patents
Contarato Devis is listed as an inventor on 15 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Contarato Devis |
| Total patents | 15 |
| First publication | Mar 3, 2016 |
| Latest publication | Jan 29, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Image sensor with oxide free wafer bonded structures and methods for fabricating image sensors
US-2025231114-A1 · Jul 17, 2025 · US
Image sensors with a tunable floating diffusion structure
US-2024250110-A1 · Jul 25, 2024 · US
Multiple column per channel CCD sensor architecture for inspection and metrology
US-10778925-B2 · Sep 15, 2020 · US
Dual-column-parallel CCD sensor and inspection systems using a sensor
US-10764527-B2 · Sep 1, 2020 · US
Scanning electron microscope and methods of inspecting and reviewing samples
US-10466212-B2 · Nov 5, 2019 · US
Dark-field inspection using a low-noise sensor
US-10462391-B2 · Oct 29, 2019 · US
Multiple Column Per Channel CCD Sensor Architecture For Inspection And Metrology
US-2019313044-A1 · Oct 10, 2019 · US
Dual-Column-Parallel CCD Sensor And Inspection Systems Using A Sensor
US-2019253652-A1 · Aug 15, 2019 · US
Dual-column-parallel CCD sensor and inspection systems using a sensor
US-10313622-B2 · Jun 4, 2019 · US
Recent patents
Latest publications not already listed above.
Scanning Electron Microscope And Methods Of Inspecting And Reviewing Samples
US-2017329025-A1 · Nov 16, 2017 · US
Dual-Column-Parallel CCD Sensor And Inspection Systems Using A Sensor
US-2017295334-A1 · Oct 12, 2017 · US
Scanning electron microscope and methods of inspecting and reviewing samples
US-9767986-B2 · Sep 19, 2017 · US
Dark-Field Inspection Using A Low-Noise Sensor
US-2017048467-A1 · Feb 16, 2017 · US
Scanning Electron Microscope And Methods Of Inspecting And Reviewing Samples
US-2016064184-A1 · Mar 3, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 12 |
| Kla Corp | 3 |
| Kla—Tencor Corp | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N21/9501 | 8 |
| H04N5/378 | 7 |
| H04N25/75 | 7 |
| G06T7/0008 | 6 |
| H04N25/713 | 6 |