Method of determining aberrations of a charged particle beam, method of determining cd information, corresponding generation of computational models, and corresponding systems
US-2026051029-A1 · Feb 19, 2026 · US
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Baram Mor patents
Baram Mor is listed as an inventor on 11 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Baram Mor |
| Total patents | 11 |
| First publication | Feb 20, 2018 |
| Latest publication | Feb 19, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Optimization of a metrology algorithm for examination of semiconductor wafers
US-2025264814-A1 · Aug 21, 2025 · US
Optimization of a metrology algorithm for examination of semiconductor specimens
US-2024428395-A1 · Dec 26, 2024 · US
Electron beam spot shape reconstruction unit
US-2024386589-A1 · Nov 21, 2024 · US
Measuring height difference in patterns on semiconductor wafers
US-11301983-B2 · Apr 12, 2022 · US
Measuring height difference in patterns on semiconductor wafers
US-2020380668-A1 · Dec 3, 2020 · US
Measuring height difference in patterns on semiconductor wafers
US-10748272-B2 · Aug 18, 2020 · US
Evaluating an object
US-10504693-B2 · Dec 10, 2019 · US
Evaluating an object
US-2019088444-A1 · Mar 21, 2019 · US
Measuring height difference in patterns on semiconductor wafers
US-2018336675-A1 · Nov 22, 2018 · US
Recent patents
Latest publications not already listed above.
Resolving ambiguities in an energy spectrum
US-9899185-B1 · Feb 20, 2018 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 10 |
| Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T7/0004 | 6 |
| G06T2207/30148 | 6 |
| G06T7/60 | 6 |
| H10P74/203 | 6 |
| G06T7/0006 | 5 |