Charged particle beam device and method for correcting astigmatism and numerical aperture
US-2026081098-A1 · Mar 19, 2026 · US
Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh patents
Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh holds 87 patents in our database, with recent filings and technology areas summarized below.
| Metric | Value |
|---|---|
| Total patents | 87 |
| Recent patents | 32 |
| First publication | Apr 24, 2018 |
| Latest publication | Mar 19, 2026 |
Filing trend
Year-over-year patent counts for this assignee.
Recent patents
Latest publications where this party is an assignee.
Apparatus for a charged particle beam device, charged particle beam device, method of analyzing a magnetic lens for a charged particle beam device, and non-transitory medium
US-2026066214-A1 · Mar 5, 2026 · US
Method of determining an energy spectrum or energy width of a charged particle beam, and charged particle beam imaging device
US-12562338-B2 · Feb 24, 2026 · US
Method of determining aberrations of a charged particle beam, method of determining cd information, corresponding generation of computational models, and corresponding systems
US-2026051029-A1 · Feb 19, 2026 · US
Charged particle optics, charged particle beam apparatus, and method for scanning a charged particle beam
US-12542253-B2 · Feb 3, 2026 · US
Notable patents
Representative or frequently cited publications from precomputed assignee stats.
Charged particle beam device and method for correcting astigmatism and numerical aperture
US-2026081098-A1 · Mar 19, 2026 · US
Apparatus for a charged particle beam device, charged particle beam device, method of analyzing a magnetic lens for a charged particle beam device, and non-transitory medium
US-2026066214-A1 · Mar 5, 2026 · US
Method of determining an energy spectrum or energy width of a charged particle beam, and charged particle beam imaging device
US-12562338-B2 · Feb 24, 2026 · US
Method of determining aberrations of a charged particle beam, method of determining cd information, corresponding generation of computational models, and corresponding systems
US-2026051029-A1 · Feb 19, 2026 · US
Charged particle optics, charged particle beam apparatus, and method for scanning a charged particle beam
US-12542253-B2 · Feb 3, 2026 · US
Technology areas
Mapped technology topics for this assignee.
| Technology | Patents |
|---|---|
| Electricity | 87 |
| Physics | 22 |
Frequently asked questions
Answers are generated from the same data shown on this page.
- How many patents does Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh have in patentsdb?
- Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh is linked to 87 publications as assignee in our database.
- What technology areas does Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh patent most?
- Top mapped technology areas by patent count: Electricity (87); Physics (22).
- Is Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh's patent activity growing?
- In our data, assignee counts were 7 in 2024 and 13 in 2025 (higher year over year).
- What are recent patents assigned to Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh?
- See the “Recent patents” section above for the latest 5 publications we attribute to this assignee.