Electrically conductive contact pin
US-2026086117-A1 · Mar 26, 2026 · US
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Ahn Bum Mo patents
Ahn Bum Mo is listed as an inventor on 259 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Ahn Bum Mo |
| Total patents | 259 |
| First publication | Feb 19, 2015 |
| Latest publication | Mar 26, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Electrically conductive contact pin
US-2026086116-A1 · Mar 26, 2026 · US
Electrically conductive contact pin
US-2026056232-A1 · Feb 26, 2026 · US
Test device capable of testing micro LED and manufacturing method thereof
US-12546812-B2 · Feb 10, 2026 · US
Guide plate and test device including same
US-12546818-B2 · Feb 10, 2026 · US
Electrically conductive contact pin and inspection apparatus comprising the same
US-2026036605-A1 · Feb 5, 2026 · US
Anodic aluminum oxide mold, mold structure including same, method of manufacturing molded article using anodic aluminum oxide mold, and molded article manufactured thereby
US-12540414-B2 · Feb 3, 2026 · US
Electrically conductive contact pin and method for manufacturing same
US-2026009821-A1 · Jan 8, 2026 · US
Electrically conductive contact pin and manufacturing method therefor
US-12517151-B2 · Jan 6, 2026 · US
Electrically conductive contact pin
US-2025389753-A1 · Dec 25, 2025 · US
Recent patents
Latest publications not already listed above.
Anodized film substrate base, anodized film substrate part having same, anodized film-based interposer having same, and semiconductor package having same
US-12506091-B2 · Dec 23, 2025 · US
Electrically conductive contact pin, inspection apparatus, and molded product
US-12493052-B2 · Dec 9, 2025 · US
Electrical connector
US-2025357694-A1 · Nov 20, 2025 · US
Electrical connector
US-2025341542-A1 · Nov 6, 2025 · US
Electrical connector and test device comprising the same
US-2025306088-A1 · Oct 2, 2025 · US
Electro-conductive contact pin and inspection device including same
US-2025306089-A1 · Oct 2, 2025 · US
Interposer and inspection apparatus comprising the same
US-2025264526-A1 · Aug 21, 2025 · US
Guide plate and pin block comprising the same
US-2025258197-A1 · Aug 14, 2025 · US
Metal molded article, manufacturing method therefor, and inspection device having same
US-2025199032-A1 · Jun 19, 2025 · US
Anodized film structure and inspection device comprising same
US-2025189560-A1 · Jun 12, 2025 · US
Electro-conductive contact pin and vertical probe card having same
US-2025180603-A1 · Jun 5, 2025 · US
Inductor and manufacturing method therefor
US-2025166876-A1 · May 22, 2025 · US
Method of manufacturing metal product and mold used therefor
US-12296378-B2 · May 13, 2025 · US
Probe card
US-12270828-B2 · Apr 8, 2025 · US
Probe head and probe card having same
US-12222370-B2 · Feb 11, 2025 · US
Contact pin assembly for kelvin test and kelvin test device comprising same
US-2025044321-A1 · Feb 6, 2025 · US
Electrically conductive contact pin and inspection device having same
US-2025035670-A1 · Jan 30, 2025 · US
Electro-conductive contact pin, manufacturing method therefor, and electro-conductive contact pin module
US-2025020691-A1 · Jan 16, 2025 · US
Guide member, inspection device, and electro-conductive contact pin
US-2025020690-A1 · Jan 16, 2025 · US
Anodic oxidation film structure
US-2025011939-A1 · Jan 9, 2025 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Point Engineering Co Ltd | 258 |
| Point Engineering Co Inc | 1 |
| Korea Inst Ind Tech | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10W90/00 | 72 |
| H10H20/857 | 55 |
| H10H20/01 | 54 |
| H01L33/62 | 41 |
| H10H20/8506 | 37 |