Electrically conductive contact pin and inspection apparatus comprising the same

Patent metadata

Field	Value
Publication number	US-2026036605-A1
Application number	US-202519287837-A
Country	US
Kind code	A1
Filing date	Aug 1, 2025
Priority date	Aug 5, 2024
Publication date	Feb 5, 2026
Grant date	—

Abstract

The present invention provides an inspection apparatus comprising an electrically conductive contact pin having one end contacting a connection pad of an inspection apparatus and another end contacting a connection pad of an inspection object to inspect the inspection object, and a guide plate having a guide hole into which the electrically conductive contact pin is inserted, wherein the electrically conductive contact pin comprises a body portion including a first metal layer and a second metal layer made of a metal having relatively higher electrical conductivity than the first metal layer, alternately stacked in a thickness direction, and an elastic portion including a plurality of unit elastic bodies spaced apart from each other in the thickness direction at one end, which can be easily elastically deformed by close contact and pressing by a connection object.

First claim

What is claimed is:

1 . An electrically conductive contact pin having one end contacting a connection pad of an inspection apparatus and another end contacting a connection pad of an inspection object to inspect the inspection object, comprising:
a body portion comprising a first metal layer and a second metal layer made of a metal having relatively higher electrical conductivity than the first metal layer, alternately stacked in a thickness direction; and an elastic portion provided at the one end to enable the one end to be pressed and compressed by the connection pad of the inspection apparatus when a guide plate is installed on the inspection apparatus side, thereby maintaining the one end in constant contact with the connection pad of the inspection apparatus, wherein the elastic portion comprises a plurality of unit elastic bodies spaced apart from each other in the thickness direction.

2 . The electrically conductive contact pin of claim 1 ,
wherein the one end comprises a closed-type elastic body having an internal space.

3 . The electrically conductive contact pin of claim 1 ,
wherein the one end comprises a closed-type unit elastic body having an internal space and a contact plane portion configured as a plane on top of the closed-type unit elastic body.

4 . The electrically conductive contact pin of claim 1 ,
wherein the one end comprises the unit elastic body having an internal space with an upper portion cut to provide at least two contact portions.

5 . The electrically conductive contact pin of claim 1 ,
wherein the one end comprises the unit elastic body having an internal space with an upper portion cut to provide at least two contact portions and a contact plane portion configured as a plane on top of the unit elastic body.

6 . The electrically conductive contact pin of claim 1 ,
wherein the one end comprises the unit elastic body having an internal space with a side portion cut.

7 . The electrically conductive contact pin of claim 1 ,
wherein the one end comprises a catching jaw formed larger than a size of the guide hole to prevent the unit elastic body from passing through the guide hole of the guide plate, wherein the unit elastic body is positioned above the catching jaw.

Assignees

• Point Engineering Co Ltd

Inventors

• Ahn Bum Mo
• Park Seung Ho
• Hong Chang Hee

Classifications

• G01R1/07314 Primary

  the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support (on an elastic support, e.g. a film, G01R1/0735) · CPC title

• G01R1/06716 Primary

  Elastic · CPC title

• G01R1/06733

  Geometry aspects (G01R1/06727 takes precedence) · CPC title

• G01R1/06761

  related to layers · CPC title

• G01R1/07357

  with flexible bodies, e.g. buckling beams · CPC title