Probe guide plate and method for manufacturing the same
US-9523716-B2 · Dec 20, 2016 · US
Guide plate and test device including same
US12546818B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12546818-B2 |
| Application number | US-202318485262-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 11, 2023 |
| Priority date | Oct 11, 2022 |
| Publication date | Feb 10, 2026 |
| Grant date | Feb 10, 2026 |
How to read this patent
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
- Title
What the patent document calls the invention.
- Abstract
A short plain-language summary of the technical disclosure.
- Assignees and inventors
Who owns or filed the patent and who is credited as inventor.
- Key dates
Filing, priority, publication, and grant dates set the timeline.
- First independent claim
The legal scope of protection — read this for what is actually claimed.
- CPC / IPC classifications
Technology tags used to group this patent with similar filings.
- Citations and related patents
Prior art links and similar publications in this corpus.
Abstract
Official abstract text for this publication.
Proposed are a guide plate and a test device including the guide plate capable of being insulated from electrically conductive contact pins and capable of blocking signal interference between the electrically conductive contact pins.
First claim
Opening claim text (preview).
What is claimed is: 1 . A guide plate comprising: a metal body comprising a penetration hole passing through the metal body in up and down directions; a surface insulation layer formed on a surface of the metal body; and a ground metal layer connected to the metal body by passing through the surface insulation layer. 2 . The guide plate of claim 1 , wherein the surface insulation layer comprises an anodic oxide insulation film formed by anodizing the metal body. 3 . The guide plate of claim 1 , wherein the surface insulation layer comprises a deposition insulation film formed by atomic layer deposition. 4 . The guide plate of claim 1 , wherein the surface insulation layer comprises: an anodic oxide insulation film formed by anodizing the metal body; and a deposition insulation film formed on a surface of the anodic oxide insulation film by atomic layer deposition. 5 . A test device comprising: a guide plate comprising a metal body that comprises a penetration hole, a surface insulation layer formed on a surface of the metal body and a ground metal layer connected to the metal body by passing through the surface insulation layer; and an electrically conductive contact pin inserted into the penetration hole.
Assignees
Inventors
Classifications
- G01R1/07371Primary
using an intermediate card or back card with apertures through which the probes pass · CPC title
Testing of IC packages; Test features related to IC packages (containers per se H10W76/10, encapsulations per se H10W74/00) · CPC title
Contacting devices, e.g. sockets, burn-in boards or mounting fixtures (in general G01R1/04) · CPC title
concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding · CPC title
Interfaces, e.g. between probe and tester (G01R31/31905 and G01R1/07364 take precedence) · CPC title
Patent family
Related publications grouped by family.
External sources
Frequently asked questions
Answers are generated from the same data shown on this page.
- What does patent US12546818B2 cover?
- Proposed are a guide plate and a test device including the guide plate capable of being insulated from electrically conductive contact pins and capable of blocking signal interference between the electrically conductive contact pins.
- Who is the assignee on this patent?
- Point Engineering Co Ltd
- What technology area does this patent fall under?
- Primary CPC classification G01R1/07371. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Feb 10 2026 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).