Method and system for imaging of a photomask through a pellicle
US-9842724-B2 · Dec 12, 2017 · US
Controlling environment of sample
Controlling environment of sample · Cooperative Patent Classification (CPC)
Electric circuits, power, telecommunications, and semiconductors.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | H01J2237/2002 |
| Official title | Controlling environment of sample |
| Display label | Controlling environment of sample |
| Total patents | 181 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 19 |
| 2016 | 35 |
| 2017 | 33 |
| 2018 | 23 |
| 2019 | 20 |
| 2020 | 14 |
| 2021 | 13 |
| 2022 | 3 |
| 2023 | 8 |
| 2024 | 8 |
| 2025 | 4 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Vacuum compatible fluid sampler
US-2017348686-A1 · Dec 7, 2017 · US
Device for monitoring environmental states of a microscope sample with an electron microscope sample holder
US-9818578-B2 · Nov 14, 2017 · US
Charged particle beam apparatus, electron microscope and sample observation method
US-2017323762-A1 · Nov 9, 2017 · US
Systems And Methods For Measuring Magnetic Fields Produced Within An Electron Microscope
US-2017309447-A1 · Oct 26, 2017 · US
Equipment protecting enclosures
US-9691510-B2 · Jun 27, 2017 · US
Stage Device and Charged Particle Beam Device Using the Same
US-2016365219-A1 · Dec 15, 2016 · US
Processing materials
US-2016358744-A1 · Dec 8, 2016 · US
Thin-ice grid assembly for cryo-electron microscopy
US-2016351374-A1 · Dec 1, 2016 · US
Protective agent for electron microscopic observation of biological sample in water-containing state, kit for electron microscopic observation, methods for observation, diagnosis, evaluation, and quantification by electron microscope, and sample stage
US-2016343539-A1 · Nov 24, 2016 · US
Equipment protecting enclosures
US-9499939-B2 · Nov 22, 2016 · US
Apparatus For Heating And Processing A Substrate
US-2016329190-A1 · Nov 10, 2016 · US
Inspection device
US-2016307726-A1 · Oct 20, 2016 · US
Processing materials
US-2016307728-A1 · Oct 20, 2016 · US
Apparatus and method for atomic force probing/SEM nano-probing/scanning probe microscopy and collimated ion milling
US-9470712-B1 · Oct 18, 2016 · US
Charged particle beam device, sample stage unit, and sample observation method
US-9472375-B2 · Oct 18, 2016 · US
Inspection of a lithographic mask that is protected by a pellicle
US-2016282714-A1 · Sep 29, 2016 · US
Processing materials
US-9455118-B1 · Sep 27, 2016 · US
Charged particle beam instrument and sample container
US-9449784-B2 · Sep 20, 2016 · US
Processing materials
US-9435076-B2 · Sep 6, 2016 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC H01J2237/2002?
- CPC H01J2237/2002 is the Cooperative Patent Classification code for “Controlling environment of sample.”
- How many patents are filed under CPC H01J2237/2002 (Controlling environment of sample)?
- Our database includes 181 publications tagged with this CPC code.
- Is patent activity under CPC H01J2237/2002 growing?
- Publication counts under this code: 8 in 2024 vs 4 in 2025 (latest complete years).