Scanning ion beam deposition and etch
US-12176178-B2 · Dec 24, 2024 · US
US9449784B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9449784-B2 |
| Application number | US-201414520754-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 22, 2014 |
| Priority date | Oct 28, 2013 |
| Publication date | Sep 20, 2016 |
| Grant date | Sep 20, 2016 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A charged particle beam instrument is offered which can introduce cooled samples easily into a sample chamber. The charged particle beam instrument ( 100 ) of the present invention has: a sample container ( 10 ) that accommodates samples (S) and a refrigerant ( 6 ) for cooling the samples (S); an evacuated sample chamber ( 20 ); a sample exchange chamber ( 30 ) connected with the sample chamber ( 20 ); a partition valve ( 40 ) disposed between the sample exchange chamber ( 30 ) and the sample container ( 10 ); and vacuum pumping equipment ( 50 ) for evacuating the sample container ( 10 ). The sample container ( 10 ) can be connected with the sample exchange chamber ( 30 ) via the partition valve ( 40 ). The sample container ( 10 ) is evacuated by the vacuum pumping equipment ( 50 ) while the partition valve ( 40 ) is closed.
Opening claim text (preview).
The invention claimed is: 1. A charged particle beam instrument comprising: a sample container that accommodates samples and a refrigerant for cooling the samples; an evacuated sample chamber; a sample exchange chamber connected with the sample chamber; a partition valve disposed between the sample exchange chamber and the sample container; and vacuum pumping equipment for evacuating the sample container; wherein the sample container can be connected by connecting means with the sample exchange chamber and brought into communication with the sample exchange chamber via the partition valve and can be evacuated by the vacuum pumping equipment while the partition valve is closed wherein said sample container has a sample-receiving space for receiving the samples, a liquefied gas refrigerant-receiving space for receiving the refrigerant, and a thermally conductive member that partitions the sample-receiving space and the refrigerant-receiving space from each other, and wherein the thermally conductive member is provided with communication holes for placing the sample-receiving space and the refrigerant-receiving space in communication with each other, such that when said refrigerant-receiving space is evacuated by said vacuum pumping equipment the refrigerant becomes solidified. 2. The charged particle beam instrument as set forth in claim 1 , wherein said sample exchange chamber has a sample storage portion capable of holding the samples, and wherein there is further provided a cooling portion for cooling the sample storage portion. 3. The charged particle beam instrument as set forth in claim 2 , further comprising a first transfer rod for conveying the samples between said sample container and said sample exchange chamber and a second transfer rod for conveying the samples between the first transfer rod and the sample storage portion. 4. The charged particle beam instrument as set forth in claim 3 , wherein said second transfer rod further operates to convey the samples between said sample storage portion and said sample chamber. 5. The charged particle beam instrument as set forth in claim 1 , wherein said refrigerant is any one of liquid nitrogen, liquid methane, liquid ethane, and liquid butane. 6. A sample container capable of being connected via a partition valve with a sample exchange chamber in a charged particle beam instrument, said sample container comprising: a sample-receiving space for receiving samples; a refrigerant-receiving space for receiving a refrigerant; and a thermally conductive member that partitions the sample-receiving space and the refrigerant-receiving space from each other, the thermally conductive member being provided with communication holes for placing the sample-receiving space and the refrigerant-receiving space in communication with each other such that when said refrigerant-receiving space is evacuated the refrigerant is solidified. 7. The sample container as set forth in claim 6 , wherein said refrigerant is any one of liquid nitrogen, liquid methane, liquid ethane, and liquid butane.
Electron or ion microscopes · CPC title
Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support · CPC title
Details · CPC title
Cooling arrangements · CPC title
Vacuum locks {; Means for obtaining or maintaining the desired pressure within the vessel} · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.