Method of extracting properties of a layer on a wafer
US-2024234216-A9 · Jul 11, 2024 · US
using non-ionising electromagnetic radiation, e.g. optical radiation {(investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00)}
using non-ionising electromagnetic radiation, e.g. optical radiation {(investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00)} · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R31/308 |
| Official title | using non-ionising electromagnetic radiation, e.g. optical radiation {(investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00)} |
| Display label | using non-ionising electromagnetic radiation, e.g. optical radiation {(investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00)} |
| Total patents | 247 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 11 |
| 2016 | 8 |
| 2017 | 15 |
| 2018 | 16 |
| 2019 | 22 |
| 2020 | 33 |
| 2021 | 26 |
| 2022 | 26 |
| 2023 | 33 |
| 2024 | 22 |
| 2025 | 31 |
| 2026 | 4 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Methods, test structures, and test systems for determining a surface characteristic of a chip facet
US-2019369029-A1 · Dec 5, 2019 · US
Methods, test structures, and test systems for determining a surface characteristic of a chip facet
US-10429313-B2 · Oct 1, 2019 · US
Test systems and methods for chips in wafer scale photonic systems
US-2019293866-A1 · Sep 26, 2019 · US
Semiconductor device inspection method and semiconductor device inspection device
US-2019265297-A1 · Aug 29, 2019 · US
System and method for detecting defects in an electronic device
US-2019257876-A1 · Aug 22, 2019 · US
Infrared sensor array circuit breaker monitoring
US-10371576-B2 · Aug 6, 2019 · US
Test apparatus and methods for arc mitigation device
US-2019195949-A1 · Jun 27, 2019 · US
Active noise suppression for optical voltage sensor
US-10234501-B2 · Mar 19, 2019 · US
Electro-optic sensor system
US-10225022-B2 · Mar 5, 2019 · US
Semiconductor device inspection device and semiconductor device inspection method
US-2018348297-A1 · Dec 6, 2018 · US
Splitting device and the methods of formation thereof
US-2018341061-A1 · Nov 29, 2018 · US
Image generation apparatus and image generation method
US-10139447-B2 · Nov 27, 2018 · US
Inspection device and method for disposing magneto-optical crystal
US-10139370-B2 · Nov 27, 2018 · US
Thermal non-contact voltage and non-contact current devices
US-10120021-B1 · Nov 6, 2018 · US
Ultrahigh Resolution Dynamic IC Chip Activity Detection for Hardware Security
US-2018284026-A1 · Oct 4, 2018 · US
Apparatus and method for detecting faults in multilayer semiconductors
US-10088522-B2 · Oct 2, 2018 · US
Evaluation method for oxide semiconductor thin film, quality control method for oxide semiconductor thin film, and evaluation element and evaluation device used in the evaluation method
US-10090208-B2 · Oct 2, 2018 · US
Semiconductor device inspection device and semiconductor device inspection method
US-10060975-B2 · Aug 28, 2018 · US
Methods, test structures, and test systems for determining a surface characteristic of a chip facet
US-2018224501-A1 · Aug 9, 2018 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R31/308?
- CPC G01R31/308 is the Cooperative Patent Classification code for “using non-ionising electromagnetic radiation, e.g. optical radiation {(investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00)}.”
- How many patents are filed under CPC G01R31/308 (using non-ionising electromagnetic radiation, e.g. optical radiation {(investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00)})?
- Our database includes 247 publications tagged with this CPC code.
- Is patent activity under CPC G01R31/308 growing?
- Publication counts under this code: 22 in 2024 vs 31 in 2025 (latest complete years).