Active noise suppression for optical voltage sensor

Patent metadata

Field	Value
Publication number	US-10234501-B2
Application number	US-201615268184-A
Country	US
Kind code	B2
Filing date	Sep 16, 2016
Priority date	Feb 26, 2016
Publication date	Mar 19, 2019
Grant date	Mar 19, 2019

Abstract

A sensor head of a test and measurement instrument can include an input configured to receive an input signal from a device under test (DUT), an optical voltage sensor having signal input electrodes and control electrodes or one set of electrodes, wherein the input is connected to the signal input electrodes, and a bias control unit connected to the control electrodes and configured to reduce an error signal or the input signal bias control signal are electrically combined and applied to a single set of electrodes.

First claim

The invention claimed is:

1. A sensor head of a test and measurement instrument, comprising:
an input configured to receive an input signal from a device under test (DUT);
an optical voltage sensor connected to the input;
a photodiode configured to measure an optical output power V pd of the optical voltage sensor; and
a bias control unit connected to the optical voltage sensor and configured to reduce an error signal that is based on a voltage of the input signal and the optical output power.

2. The sensor head of claim 1 , wherein the bias control unit is configured to eliminate the error signal.

3. The sensor head of claim 1 , wherein the optical voltage sensor has signal input electrodes and control electrodes, wherein the input is connected to the signal input electrodes and wherein the bias control unit is connected to the control electrodes; or
the optical voltage sensor has one set of electrodes, wherein the input signal is configured to be combined with an error correction signal of the bias control unit and applied to the one set of electrodes.

4. The sensor head of claim 3 , further comprising a correction block configured to compare the measured optical output power V pd to a reference signal V in .

5. The sensor head of claim 4 , wherein the reference signal V in is the input signal.

6. The sensor head of claim 4 , wherein the correction block is further configured to identify the error signal based on the comparing.

7. The sensor head of claim 4 , further comprising a buffer coupled between the correction block and the input.

8. The sensor head of claim 1 , wherein the optical voltage sensor is configured to be coupled with a laser source of an external controller via an upstream fiber.

9. The sensor head of claim 1 , wherein the optical voltage sensor is a Mach-Zehnder optical sensor.

10. A measurement system, comprising:
a host;
a controller electrically coupled with the host;
a device under test (DUT);
a sensor head electrically coupled between the controller and the DUT, the sensor head including:
an input configured to receive an input signal from the DUT;
an optical voltage sensor connected to the input
a photodiode configured to measure an optical output power V pd of the optical voltage sensor; and
a bias control unit connected to the optical voltage sensor and configured to reduce an error signal that is based on a voltage of the input signal and the optical output power.

11. The measurement system of claim 10 , wherein:
the optical voltage sensor has signal input electrodes and control electrodes, wherein the input is connected to the signal input electrodes and wherein the bias control unit is connected to the control electrodes; or
the optical voltage sensor has one set of electrodes, wherein the input signal is configured to be combined with an error correction signal of the bias control unit and applied to the one set of electrodes.

12. The measurement system of claim 9 , further comprising a correction block configured to:
compare the measured optical output power V pd to the voltage of the input signal V in ; and
generate the error signal based on the comparison.

13. The measurement system of claim 12 , further comprising a correction block configured to identify the error signal based on the comparing.

14. The measurement system of claim 9 , wherein the optical voltage sensor is configured to be coupled with a laser source of the controller via an upstream fiber.

15. The measurement system of claim 9 , wherein the optical voltage sensor is a Mach-Zehnder optical sensor.

Assignees

• Tektronix Inc

Inventors

• Mende Michael J
• Booman Richard A

Classifications

• G01R15/241 Primary

  using electro-optical modulators, e.g. electro-absorption (probes containing electro-optic elements G01R1/071) · CPC title

• G01R15/247

  Details of the circuitry or construction of devices covered by G01R15/241 - G01R15/246 · CPC title

• G02F1/0123

  Circuits for the control or stabilisation of the bias voltage, e.g. automatic bias control [ABC] feedback loops · CPC title

• G01R15/22

  using light-emitting devices, e.g. LED, optocouplers {(G01R31/31901 takes precedence)} · CPC title

• G01R31/308 Primary

  using non-ionising electromagnetic radiation, e.g. optical radiation {(investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00)} · CPC title