Integrated electronic device with transceiving antenna and magnetic interconnection
US-9530743-B2 · Dec 27, 2016 · US
Wireless interface with the DUT
Wireless interface with the DUT · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R31/3025 |
| Official title | {Wireless interface with the DUT} |
| Display label | Wireless interface with the DUT |
| Total patents | 290 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 41 |
| 2016 | 28 |
| 2017 | 28 |
| 2018 | 28 |
| 2019 | 24 |
| 2020 | 24 |
| 2021 | 30 |
| 2022 | 22 |
| 2023 | 27 |
| 2024 | 12 |
| 2025 | 23 |
| 2026 | 3 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Edge Crack Detection System
US-2016356846-A1 · Dec 8, 2016 · US
Integrated circuit comprising at least an integrated antenna
US-2016322269-A1 · Nov 3, 2016 · US
Probeless parallel test system and method for integrated circuit
US-2016320445-A1 · Nov 3, 2016 · US
Electric field sensor, system, and method for programming electronic devices on a wafer
US-2016306007-A1 · Oct 20, 2016 · US
Edge crack detection system
US-9454684-B2 · Sep 27, 2016 · US
Test systems for electronic devices with wireless communications capabilities
US-9448279-B2 · Sep 20, 2016 · US
Interface to full and reduced pin jtag devices
US-2016259003-A1 · Sep 8, 2016 · US
Semiconductor integrated circuit device including variable frequency type probe test pad and semiconductor system
US-2016252572-A1 · Sep 1, 2016 · US
Contactless signal testing
US-9423452-B2 · Aug 23, 2016 · US
Radio-frequency test system with tunable test antenna circuitry
US-9404965-B2 · Aug 2, 2016 · US
Method and Apparatus for RFID Tag Testing
US-2016187380-A1 · Jun 30, 2016 · US
Substrate with state machine circuitry and tap state monitor circuitry
US-9372230-B2 · Jun 21, 2016 · US
Non-contact test system for determining whether electronic device structures contain manufacturing faults
US-9372228-B2 · Jun 21, 2016 · US
System and method for facilitating comparison of radio frequency (RF) data signals transmitted by a device under test (DUT) and received by a test system
US-9325435-B2 · Apr 26, 2016 · US
Method for testing multiple data packet signal transceivers with a shared tester to maximize tester use and minimize test time
US-9319154-B2 · Apr 19, 2016 · US
Detector device for functional certification
US-2016069952-A1 · Mar 10, 2016 · US
Test platform
US-9267966-B2 · Feb 23, 2016 · US
System and method for testing a radio frequency (RF) multiple-input-multiple-output (MIMO) device under test (DUT)
US-9246606-B2 · Jan 26, 2016 · US
Method of Manufacturing a Semiconductor Device
US-2015348855-A1 · Dec 3, 2015 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R31/3025?
- CPC G01R31/3025 is the Cooperative Patent Classification code for “Wireless interface with the DUT.”
- How many patents are filed under CPC G01R31/3025 (Wireless interface with the DUT)?
- Our database includes 290 publications tagged with this CPC code.
- Is patent activity under CPC G01R31/3025 growing?
- Publication counts under this code: 12 in 2024 vs 23 in 2025 (latest complete years).