Semiconductor wafer testing system and related method for improving external magnetic field wafer testing
US-12210055-B2 · Jan 28, 2025 · US
Magnets
Magnets · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R1/16 |
| Official title | Magnets |
| Display label | Magnets |
| Total patents | 32 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2016 | 2 |
| 2017 | 1 |
| 2018 | 2 |
| 2019 | 2 |
| 2020 | 6 |
| 2021 | 7 |
| 2022 | 5 |
| 2023 | 3 |
| 2024 | 3 |
| 2025 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Fault detection device and method for superconducting electrodynamic magnetic levitation (maglev) track
US-2024367700-A1 · Nov 7, 2024 · US
Fault detection device and method for superconducting electrodynamic magnetic levitation (maglev) track
US-12128936-B1 · Oct 29, 2024 · US
Magnetically retained replaceable contact plate for semiconductor handler
US-2024210468-A1 · Jun 27, 2024 · US
Semiconductor wafer testing system and related method for improving external magnetic field wafer testing
US-2023333157-A1 · Oct 19, 2023 · US
Semiconductor wafer testing system and related method for improving external magnetic field wafer testing
US-11719742-B2 · Aug 8, 2023 · US
Test apparatuses for semiconductor devices
US-11604220-B2 · Mar 14, 2023 · US
Semiconductor wafer testing system and related method for improving external magnetic field wafer testing
US-2022373594-A1 · Nov 24, 2022 · US
Electrical installation measuring system
US-11506716-B2 · Nov 22, 2022 · US
Semiconductor wafer testing system and related method for improving external magnetic field wafer testing
US-11506706-B2 · Nov 22, 2022 · US
Test apparatuses for semiconductor devices
US-2022146571-A1 · May 12, 2022 · US
Current sensor
US-11313884-B2 · Apr 26, 2022 · US
Magnetic field transducer mounting methods for MTJ device testers
US-11162981-B2 · Nov 2, 2021 · US
Current sensor
US-11105831-B2 · Aug 31, 2021 · US
Sensing of a magnetic target
US-11035672-B2 · Jun 15, 2021 · US
Electrical Installation Measuring System
US-2021156920-A1 · May 27, 2021 · US
Semiconductor wafer testing system and related method for improving external magnetic field wafer testing
US-2021109152-A1 · Apr 15, 2021 · US
Jig
US-10962568-B2 · Mar 30, 2021 · US
Current sensor
US-2021080489-A1 · Mar 18, 2021 · US
Semiconductor wafer testing system and related method for improving external magnetic field wafer testing
US-10877089-B2 · Dec 29, 2020 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R1/16?
- CPC G01R1/16 is the Cooperative Patent Classification code for “Magnets.”
- How many patents are filed under CPC G01R1/16 (Magnets)?
- Our database includes 32 publications tagged with this CPC code.
- Is patent activity under CPC G01R1/16 growing?
- Publication counts under this code: 3 in 2024 vs 1 in 2025 (latest complete years).