Jig

Patent metadata

Field	Value
Publication number	US-10962568-B2
Application number	US-201816483869-A
Country	US
Kind code	B2
Filing date	Feb 6, 2018
Priority date	Feb 7, 2017
Publication date	Mar 30, 2021
Grant date	Mar 30, 2021

Abstract

Provided is a jig enabling detachment and attachment of a probe head from and to an electric connecting apparatus without using a special holding device. A jig (50) is applied to an electric connecting apparatus (10) electrically connecting a device under test to a testing apparatus for the device under test. The electric connecting apparatus includes a wiring substrate (22) and a probe head (28) secured to the wiring substrate with a plurality of set screws (26) and including a plurality of probes (34) made of a magnetic body. The jig (50) includes a plate (52) and a magnet (54) attached to the plate. The plate can detachably be attached to the probe head, and the magnet is opposed to a lower end portion (34 b) of each of the probes.

First claim

What is claimed is:

1. A jig applied to an electric connecting apparatus, the electric connecting apparatus including a wiring substrate electrically connecting a device under test to a testing apparatus for the device under test, and a probe head secured to a surface of the wiring substrate opposed to the device under test with a plurality of set screws,
the probe head including a plurality of probes each including an upper end portion, a lower end portion, and an intermediate portion between the upper end portion and the lower end portion and made of a magnetic body and a support body supporting the plurality of probes,
the support body including an upper plate and a lower plate which are parallel to each other, the upper plate including a hole allowing the lower end portion, the intermediate portion, and the upper end portion of each of the probes to sequentially pass therethrough, the lower plate including a hole allowing the lower end portion of each of the probes to pass therethrough and preventing the intermediate portion of each of the probes from passing therethrough, the jig comprising:
a plate; and
a magnet attached to the plate,

wherein the plate includes a plurality of holes corresponding to a plurality of screw holes provided in the support body and can detachably be attached to the probe head via a plurality of screws screwed through the plurality of holes into the screw holes, and
wherein the magnet is opposed to the lower end portion of each of the probes.

2. The jig according to claim 1 , wherein the plate includes a plurality of holes respectively corresponding to the plurality of set screws.

3. The jig according to claim 1 , wherein the magnet is a permanent magnet or an electromagnet.

4. The jig according to claim 1 , wherein the probe includes a barrel including a spring portion that can expand and contract in an axial direction thereof and a plunger including a main body arranged in the barrel and secured to the barrel and a tip end portion protruded out of the barrel, and
wherein the barrel constitutes the upper end portion and the intermediate portion of each of the probes, and the tip end portion of the plunger constitutes the lower end portion of each of the probes.

5. The jig according to claim 2 , wherein the probe includes a barrel including a spring portion that can expand and contract in an axial direction thereof and a plunger including a main body arranged in the barrel and secured to the barrel and a tip end portion protruded out of the barrel, and
wherein the barrel constitutes the upper end portion and the intermediate portion of each of the probes, and the tip end portion of the plunger constitutes the lower end portion of each of the probes.

6. The jig according to claim 3 , wherein the probe includes a barrel including a spring portion that can expand and contract in an axial direction thereof and a plunger including a main body arranged in the barrel and secured to the barrel and a tip end portion protruded out of the barrel, and
wherein the barrel constitutes the upper end portion and the intermediate portion of each of the probes, and the tip end portion of the plunger constitutes the lower end portion of each of the probes.

Assignees

• Nihon Micronics Kk

Inventors

• SHUTO Akihiro

Classifications

• G01R31/2886 Primary

  Features relating to contacting the IC under test, e.g. probe heads; chucks (G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06) · CPC title

• G01R31/2865

  Holding devices, e.g. chucks; Handlers or transport devices (having contacts G01R31/2863) · CPC title

• G01R31/2863

  Contacting devices, e.g. sockets, burn-in boards or mounting fixtures (in general G01R1/04) · CPC title

• G01R31/2808

  Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards (probe, multiprobe, probe manipulator or probe fixture G01R1/067) · CPC title

• G01R1/073 Primary

  Multiple probes · CPC title