Probes, apparatuses and methods for use in scanning probe microscopy
US-2025208163-A1 · Jun 26, 2025 · US
Coarse scanning or positioning
Coarse scanning or positioning · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q10/02 |
| Official title | Coarse scanning or positioning |
| Display label | Coarse scanning or positioning |
| Total patents | 29 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 1 |
| 2016 | 3 |
| 2017 | 2 |
| 2018 | 6 |
| 2020 | 3 |
| 2021 | 5 |
| 2022 | 5 |
| 2023 | 1 |
| 2024 | 1 |
| 2025 | 2 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Scanning probe microscope
US-2025164522-A1 · May 22, 2025 · US
Atomic nano-positioning device
US-12174218-B2 · Dec 24, 2024 · US
Method and device for measuring dimension of semiconductor structure
US-11656245-B2 · May 23, 2023 · US
Surface analysis device
US-11499989-B2 · Nov 15, 2022 · US
Modular scanning probe microscope head
US-11474127-B2 · Oct 18, 2022 · US
Atomic nano-positioning device
US-2022299544-A1 · Sep 22, 2022 · US
Method and device for measuring dimension of semiconductor structure
US-2022229087-A1 · Jul 21, 2022 · US
Apparatus and method for a scanning probe microscope
US-2022146548-A1 · May 12, 2022 · US
Surface analysis device
US-2021349125-A1 · Nov 11, 2021 · US
Modular scanning probe microscope head
US-2021349127-A1 · Nov 11, 2021 · US
Feedback correction in sub-resonant tapping mode of an atomic force microscope
US-11099210-B2 · Aug 24, 2021 · US
Device and method for measuring and/or modifying surface features on a surface of a sample
US-10908179-B2 · Feb 2, 2021 · US
Scanner and scanning probe microscope
US-10884022-B2 · Jan 5, 2021 · US
Imaging devices for use with additive manufacturing systems and methods of imaging a build layer
US-10674101-B2 · Jun 2, 2020 · US
Coupled multiscale positioning of arrays of parallel, independently actuated and simultaneously driven modular scanning probe microscopes for high-throughput, in-line, nanoscale measurement of flexible, large area, and roll-to-roll processes
US-10649003-B2 · May 12, 2020 · US
Scanner and scanning probe microscope
US-2020049733-A1 · Feb 13, 2020 · US
Three-dimensional fine movement device
US-10161958-B2 · Dec 25, 2018 · US
Scanning probe microscope and probe contact detection method
US-10151773-B2 · Dec 11, 2018 · US
Coupled multiscale positioning of arrays of parallel, independently actuated and simultaneously driven modular scanning probe microscopes for high-throughput, in-line, nanoscale measurement of flexible, large area, and roll-to-roll processes
US-2018348254-A1 · Dec 6, 2018 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01Q10/02?
- CPC G01Q10/02 is the Cooperative Patent Classification code for “Coarse scanning or positioning.”
- How many patents are filed under CPC G01Q10/02 (Coarse scanning or positioning)?
- Our database includes 29 publications tagged with this CPC code.
- Is patent activity under CPC G01Q10/02 growing?
- Publication counts under this code: 1 in 2024 vs 2 in 2025 (latest complete years).