Feedback correction in sub-resonant tapping mode of an atomic force microscope

Patent metadata

Field	Value
Publication number	US-11099210-B2
Application number	US-201816481759-A
Country	US
Kind code	B2
Filing date	Jan 30, 2018
Priority date	Jan 30, 2017
Publication date	Aug 24, 2021
Grant date	Aug 24, 2021

Abstract

A method of carrying out sub-resonant tapping in an atomic force microscope includes causing a probe that is disposed above a sample to be translated in a direction parallel to a horizontal plane defined by the sample and to oscillate in a vertical direction that is perpendicular to the horizontal plane about an equilibrium line that is separated from the horizontal plane by a vertical offset. As a result, the probe repeatedly taps a surface of the sample. Each tap begins with a first contact of the probe on the surface followed by a progressive increase in force exerted by the sample on the probe until a peak force is attained. The vertical offset is controlled by relying at least in part on a feature other than the peak force as a basis for controlling the vertical offset.

First claim

Having described the invention and a preferred embodiment thereof, what is claimed as new and secured by Letters Patent is:

1. A method comprising controlling a vertical offset by relying at least in part on a feature other than a peak value of a force that results from interaction of a microscope's probe with a sample, said force being a time-varying force and said feature being a feature other than a peak value of said force, wherein said force results from having disposed said probe above said sample and causing said probe to simultaneously translate along a plane above said sample and to oscillate towards and away from said sample about an equilibrium line that is separated from said plane by said vertical offset so as to cause said probe to repeatedly tap a surface of said sample at a frequency below said probe's resonance, wherein each tap begins with a first contact of said probe with said surface, and wherein, during each of said taps, said force, which is exerted by said sample on said probe, increases until a peak force associated with said tap has been attained.

2. The method of claim 1 , wherein controlling said vertical offset comprises causing an actuator to change said vertical offset in an attempt to reduce variation in peak forces of said taps.

3. The method of claim 1 , wherein controlling said vertical offset comprises controlling a first actuator during an interval and, upon completion of said interval, maintaining said first actuator at a first position and controlling a second actuator, wherein said first actuator moves said probe more rapidly than said second actuator but by no more than a first extent that is less than a second extent by which said second actuator is able to move said probe.

4. The method of claim 1 , wherein controlling said vertical offset comprises controlling a fine actuator and controlling a coarse actuator, wherein said fine actuator moves said probe by at most a first extent and said coarse actuator moves said probe by at most a second extent, wherein said second extent exceeds said first extent, and wherein said fine actuator moves said probe more quickly than said coarse actuator.

5. The method of claim 1 , wherein relying at least in part on a feature other than said peak force comprises relying on force that said sample exerts on said probe prior attainment of said peak force.

6. The method of claim 1 , wherein controlling said vertical offset comprises controlling a first actuator prior to attainment of said peak force and, no later than having attained said peak force, maintaining said first actuator at a first position and controlling a second actuator, wherein said first actuator moves said probe more rapidly than said second actuator but by no more than a first extent that is less than an second extent by which said second actuator is able to move said probe.

7. The method of claim 1 , wherein controlling said vertical offset comprises commencing control of a fine actuator no earlier than first contact of said probe with said surface, and, after having controlled said probe with said fine actuator, relinquishing control to a coarse actuator and maintaining said fine actuator at a first position, wherein said fine actuator moves said probe by at most a first extent, wherein said coarse actuator moves said probe by at most a second extent, said second extent exceeding said first extent, wherein said fine actuator moves said probe more quickly than said coarse actuator.

8. The method of claim 1 , wherein controlling said vertical offset comprises causing an actuator to change said vertical offset in an attempt to maintain a constant peak force from tap to tap.

9. The method of claim 1 , wherein controlling said vertical offset comprises controlling a fine actuator during an interval and, upon completion of said interval, maintaining said fine actuator at a first position and controlling a coarse actuator, wherein said fine actuator moves said probe by at most a first extent and said coarse actuator moves said probe by at most a second extent, wherein said second extent exceeds said first extent, and wherein said fine actuator moves said probe more quickly than said coarse actuator, said method further comprising using said maintained first position as a basis of setting said vertical offset.

10. The method of claim 1 , wherein controlling said vertical offset comprises relying at least in part on a feature of said force.

11. An apparatus comprising a microscope, said microscope comprising a cantilever, a probe disposed on said cantilever, a compound actuator that is configured to translate said probe along a plane defined by a surface of a sample and to oscillate said probe about an equilibrium line that extends parallel to said horizontal plane and that is separated from said horizontal plane by a vertical offset, wherein, while translating and oscillating, said probe repeatedly taps said sample at a frequency that is below resonance of said probe, and wherein, during each tap, said sample exerts a force on said probe, said force being a time-varying force having a peak value, and wherein said microscope further comprises a control system that is configured to control said vertical offset based at least in part on a feature other than said peak value.

12. The apparatus of claim 11 , wherein said compound actuator comprises a fine actuator and a coarse actuator, wherein said fine actuator moves said probe by at most a first extent and said coarse actuator moves said probe by at most a second extent, wherein said second extent exceeds said first extent, and wherein said fine actuator moves said probe more quickly than said coarse actuator.

13. The apparatus of claim 11 , wherein said compound actuator comprises first and second actuators, wherein said control system is configured to control said first actuator prior to attainment of said peak force and to thereafter maintain said first actuator at a first position and control said second actuator, wherein said first actuator moves said probe by at most a first extent and said second actuator moves said probe by at most a second extent that exceeds said first extent, and wherein said first actuator moves said probe more quickly than said second actuator.

14. The apparatus of claim 11 , wherein said compound actuator comprises a fine actuator and a coarse actuator, wherein said control system is configured to begin controlling said fine actuator no earlier than first contact of said probe with said surface, to maintain control of said fine actuator during a first interval, and at the end of said interval, to maintain said fine actuator at a first position and to begin controlling said coarse actuator, wherein said fine actuator moves said probe by at most a first extent and said coarse actuator moves said probe by at most a second extent, wherein said second extent exceeds said first extent, and wherein said fine actuator moves said probe more quickly than said coarse actuator.

15. The apparatus of claim 11 , wherein said compound actuator comprises a fine actuator and a coarse actuator, wherein said control system is configured to control said fine actuator during an interval and, upon completion of said interval, to maintain said fine actuator at a particular position and to begin controlling said coarse actuator, wherein said control system is configured to use said maintained particular position as a basis of setting said vertical offset, wherein said fine actuator moves said probe by at most a first extent and said coarse actuator moves said probe by at most a second extent, wherein said second extent exceeds said first extent, and wherein sa

Assignees

• Tufts College

Inventors

• Echols-Jones Piers
• Messner William C
• Sokolov Igor

Classifications

• G01Q60/34 Primary

  Tapping mode · CPC title

• G01Q10/02

  Coarse scanning or positioning · CPC title

• G01Q10/065 Primary

  Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself · CPC title