Method of evaluating cleanliness, method of determining cleaning condition, and method of manufacturing silicon wafer
US-2019106810-A1 · Apr 11, 2019 · US
Semiconductive materials
Semiconductive materials · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01N33/0095 |
| Official title | {Semiconductive materials} |
| Display label | Semiconductive materials |
| Total patents | 185 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 26 |
| 2016 | 11 |
| 2017 | 17 |
| 2018 | 5 |
| 2019 | 18 |
| 2020 | 13 |
| 2021 | 17 |
| 2022 | 15 |
| 2023 | 21 |
| 2024 | 19 |
| 2025 | 20 |
| 2026 | 3 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Photoinduced carrier lifetime measurement device and photoinduced carrier lifetime measurement method
US-10126253-B2 · Nov 13, 2018 · US
Coating tester using gas sensors
US-2018224412-A1 · Aug 9, 2018 · US
Analysis device
US-2018088100-A1 · Mar 29, 2018 · US
Simultaneous multi-angle spectroscopy
US-9921104-B2 · Mar 20, 2018 · US
Generation and analysis of chemical compound libraries
US-2018059078-A1 · Mar 1, 2018 · US
Small-angle scattering X-ray metrology systems and methods
US-9846132-B2 · Dec 19, 2017 · US
Simultaneous Multi-Angle Spectroscopy
US-2017356800-A1 · Dec 14, 2017 · US
Method and apparatus for non-contact measurement of internal quantum efficiency in light emitting diode structures
US-9823198-B2 · Nov 21, 2017 · US
Methods for in situ monitoring and control of defect formation or healing
US-2017299537-A1 · Oct 19, 2017 · US
Predicting semiconductor package warpage
US-2017284913-A1 · Oct 5, 2017 · US
Generation and analysis of chemical compound libraries
US-9778234-B2 · Oct 3, 2017 · US
Method for controlling the size of solid-state nanopores
US-9777390-B2 · Oct 3, 2017 · US
Fabrication of nanopores using high electric fields
US-9777389-B2 · Oct 3, 2017 · US
Predicting semiconductor package warpage
US-9772268-B2 · Sep 26, 2017 · US
Inflatable Bladder Based Mechanical Testing for Stretchable Electronics
US-2017269017-A1 · Sep 21, 2017 · US
Apparatus and method for accurate measurement and mapping of forward and reverse-bias current-voltage characteristics of large area lateral p-n junctions
US-9746514-B2 · Aug 29, 2017 · US
Method for evaluating semiconductor wafer and apparatus for evaluating semiconductor wafer
US-9746400-B2 · Aug 29, 2017 · US
Display device and a method of measuring a strain of the display device
US-9658145-B2 · May 23, 2017 · US
Gas sensor package
US-9618490-B2 · Apr 11, 2017 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01N33/0095?
- CPC G01N33/0095 is the Cooperative Patent Classification code for “Semiconductive materials.”
- How many patents are filed under CPC G01N33/0095 (Semiconductive materials)?
- Our database includes 185 publications tagged with this CPC code.
- Is patent activity under CPC G01N33/0095 growing?
- Publication counts under this code: 19 in 2024 vs 20 in 2025 (latest complete years).