Sample holder unit for single-crystal x-ray structure analysis apparatus
US-2021396690-A1 · Dec 23, 2021 · US
diffraction
diffraction · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01N2223/056 |
| Official title | diffraction |
| Display label | diffraction |
| Total patents | 144 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 3 |
| 2016 | 5 |
| 2017 | 11 |
| 2018 | 8 |
| 2019 | 10 |
| 2020 | 9 |
| 2021 | 14 |
| 2022 | 27 |
| 2023 | 19 |
| 2024 | 19 |
| 2025 | 17 |
| 2026 | 2 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Electron diffraction holography
US-2021302333-A1 · Sep 30, 2021 · US
X-ray spectrometer
US-11112371-B2 · Sep 7, 2021 · US
X-ray inspection device
US-11079345-B2 · Aug 3, 2021 · US
Control apparatus, system, method, and program
US-2021181126-A1 · Jun 17, 2021 · US
Selecting Supplemental Cementitious Materials For Specific Performance Characteristic
US-2021147305-A1 · May 20, 2021 · US
System and method for beam position visualization
US-10998166-B2 · May 4, 2021 · US
X-ray measurement apparatus and system
US-2021102908-A1 · Apr 8, 2021 · US
X-ray spectroscopic analysis apparatus and elementary analysis method
US-10948434-B2 · Mar 16, 2021 · US
X-ray inspection device
US-2021063326-A1 · Mar 4, 2021 · US
Sample holding device for x-ray analysis
US-2021048398-A1 · Feb 18, 2021 · US
System and method for beam position visualization
US-2021035775-A1 · Feb 4, 2021 · US
Electron microscopy analysis method
US-2021010956-A1 · Jan 14, 2021 · US
A system and method for high-resolution high contrast x-ray ghost diffraction
US-2021010955-A1 · Jan 14, 2021 · US
Estimating wear for bha components using borehole hardness
US-2020386905-A1 · Dec 10, 2020 · US
Method for measuring residual stress
US-2020340933-A1 · Oct 29, 2020 · US
Full Beam Metrology For X-Ray Scatterometry Systems
US-2020300790-A1 · Sep 24, 2020 · US
Full beam metrology for X-ray scatterometry systems
US-10775323-B2 · Sep 15, 2020 · US
Processing apparatus, method, and program
US-10748253-B2 · Aug 18, 2020 · US
X-ray spectrometer
US-2020225172-A1 · Jul 16, 2020 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01N2223/056?
- CPC G01N2223/056 is the Cooperative Patent Classification code for “diffraction.”
- How many patents are filed under CPC G01N2223/056 (diffraction)?
- Our database includes 144 publications tagged with this CPC code.
- Is patent activity under CPC G01N2223/056 growing?
- Publication counts under this code: 19 in 2024 vs 17 in 2025 (latest complete years).