X-ray spectrometer

Patent metadata

Field	Value
Publication number	US-2020225172-A1
Application number	US-201716612092-A
Country	US
Kind code	A1
Filing date	May 18, 2017
Priority date	May 18, 2017
Publication date	Jul 16, 2020
Grant date	—

Abstract

An X-ray spectrometer is provided with: an excitation source configured to irradiate excitation rays onto an irradiation area of a sample, a diffraction member provided to face the irradiation area; a slit member provided between the irradiation area and the diffraction member, the slit member having a slit extending parallel to the irradiation area and a prescribed surface of the diffraction member; an X-ray linear sensor having a light-incident surface in which a plurality of detection elements are arranged in a direction perpendicular to a longitudinal direction of the slit; a first moving mechanism configured to change an angle between the sample surface and the prescribed surface, and/or a distance between the sample surface and the prescribed surface by moving the diffraction member within a plane perpendicular to the longitudinal direction; and a second moving mechanism configured to position the X-ray linear sensor on a path of characteristic X-rays passed through the slit and diffracted by the prescribed surface by moving the X-ray linear sensor within a plane perpendicular to the longitudinal direction.

First claim

1 . An X-ray spectrometer comprising:
a) an excitation source configured to irradiate excitation rays for generating characteristic X-rays onto a prescribed irradiation area of a sample, b) a diffraction member provided to face the irradiation area; c) a slit member provided between the irradiation area and the diffraction member, the slit member having a slit extending parallel to the irradiation area and a prescribed surface of the diffraction member; d) an X-ray linear sensor having a light-incident surface in which a plurality of detection elements are arranged in a direction perpendicular to a longitudinal direction of the slit; e) a first moving mechanism configured to change an angle between the sample surface and the prescribed surface, and/or a distance between the sample surface and the prescribed surface by moving the diffraction member within a plane perpendicular to the longitudinal direction; and f) a second moving mechanism configured to position the X-ray linear sensor on a path of the characteristic X-rays passed through the slit and diffracted by the prescribed surface by moving the X-ray linear sensor within the plane perpendicular to the longitudinal direction.

2 . The X-ray spectrometer as recited in claim 1 ,
wherein the first moving mechanism is provided with a rotation mechanism and a linear motion mechanism.

3 . The X-ray spectrometer as recited in claim 1 ,
wherein the second moving mechanism is provided with a rotation mechanism and a linear motion mechanism.

4 . The X-ray spectrometer as recited in claim 1 , wherein the diffraction member is selected from a plurality of diffraction members arranged switchably and different in diffractable X-ray wavelength range.

5 . The X-ray spectrometer as recited in claim 1 ,
wherein the X-ray linear sensor is selected from a plurality of X-ray linear sensors arranged switchably and different in detectable X-ray wavelength range.

6 . The X-ray spectrometer as recited in claim 1 ,
wherein the X-ray linear sensor is composed of detection elements arranged two-dimensionally in a direction perpendicular to the longitudinal direction and a direction orthogonal to the direction perpendicular to the longitudinal direction, and is configured to output an output signal of the detection elements arranged in the direction orthogonal to the direction perpendicular to the longitudinal direction as one output signal.

7 - 11 . (canceled)

12 . The X-ray spectrometer as recited in claim 1 , further comprising:
e) a parallel light slit member configured to pass only X-rays traveling in a specific direction among the X-rays emitted from the irradiation area; f) a concave diffraction member configured to diffract and collect light having a specific wavelength among X-rays passed through the parallel light slit member and advancing to the specific direction; and g) an X-ray detector placed so that a light receiving surface is positioned on the prescribed surface.

Assignees

• Shimadzu Corp

Inventors

• Sato Kenji
• Izumi Takuro

Classifications

• G01N2223/056

  diffraction · CPC title

• G01N23/225 Primary

  using electron or ion · CPC title

• G01N2223/321

  manipulator for positioning a part · CPC title

• G01N23/207

  Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions · CPC title

• G01N2223/076

  X-ray fluorescence · CPC title