Gain calibration for an imaging system
US-10128808-B2 · Nov 13, 2018 · US
Electrical features thereof
Electrical features thereof · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01J5/22 |
| Official title | Electrical features thereof |
| Display label | Electrical features thereof |
| Total patents | 220 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 19 |
| 2016 | 21 |
| 2017 | 18 |
| 2018 | 15 |
| 2019 | 15 |
| 2020 | 17 |
| 2021 | 18 |
| 2022 | 23 |
| 2023 | 22 |
| 2024 | 25 |
| 2025 | 18 |
| 2026 | 9 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Resistive environmental sensor and resistive environmental sensor array
US-2018136266-A1 · May 17, 2018 · US
Infrared sensor
US-2017356806-A1 · Dec 14, 2017 · US
Semiconductor device for a system for measuring the temperature, and manufacturing method thereof
US-9806216-B2 · Oct 31, 2017 · US
Measurement circuit for bolometric detector
US-9791322-B2 · Oct 17, 2017 · US
Bolometric detector with MIM structures of different dimensions
US-9784623-B2 · Oct 10, 2017 · US
Detector, preamplifier selection apparatus, systems, and methods
US-9766369-B2 · Sep 19, 2017 · US
Device for detecting electromagnetic radiation comprising a raised electrical connection pad
US-2017241840-A1 · Aug 24, 2017 · US
Self-assembled nanostructure bolometers and methods of use thereof
US-2017234735-A1 · Aug 17, 2017 · US
Terahertz imager
US-9726548-B2 · Aug 8, 2017 · US
Gain calibration for an imaging system
US-2017179912-A1 · Jun 22, 2017 · US
Multi-reference correlated double sampling detection method and microbolometer using the same
US-2017089764-A1 · Mar 30, 2017 · US
Gain calibration for an imaging system
US-9595934-B2 · Mar 14, 2017 · US
Adaptive adjustment of the operating bias of an imaging system
US-9584750-B2 · Feb 28, 2017 · US
Electromagnetic wave oscillator, plasma wave power extractor and electromagnetic wave detector
US-2017052071-A1 · Feb 23, 2017 · US
THz radiation detection in standard CMOS technologies based on thermionic emission
US-9574945-B2 · Feb 21, 2017 · US
Graphene-based infrared single photon detector
US-2017038260-A1 · Feb 9, 2017 · US
Infrared detection device and method
US-9562936-B2 · Feb 7, 2017 · US
Semiconductor device, infrared imaging device equipped with the semiconductor device, and method for controlling semiconductor device
US-2017023413-A1 · Jan 26, 2017 · US
Semiconductor device for a system for measuring the temperature, and manufacturing method thereof
US-2017018674-A1 · Jan 19, 2017 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01J5/22?
- CPC G01J5/22 is the Cooperative Patent Classification code for “Electrical features thereof.”
- How many patents are filed under CPC G01J5/22 (Electrical features thereof)?
- Our database includes 220 publications tagged with this CPC code.
- Is patent activity under CPC G01J5/22 growing?
- Publication counts under this code: 25 in 2024 vs 18 in 2025 (latest complete years).