Integrated time dependent dielectric breakdown reliability testing
US-9557369-B2 · Jan 31, 2017 · US
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Shaw Thomas M patents
Shaw Thomas M holds 6 patents in our database, with recent filings and technology areas summarized below.
| Metric | Value |
|---|---|
| Total patents | 6 |
| Recent patents | 0 |
| First publication | Apr 14, 2015 |
| Latest publication | Jan 31, 2017 |
Filing trend
Year-over-year patent counts for this assignee.
Recent patents
Latest publications where this party is an assignee.
Integrated time dependent dielectric breakdown reliability testing
US-9448277-B2 · Sep 20, 2016 · US
Method and structure for determining thermal cycle reliability
US-9287186-B2 · Mar 15, 2016 · US
Low k porous SiCOH dielectric and integration with post film formation treatment
US-9219037-B2 · Dec 22, 2015 · US
Multiple step anneal method and semiconductor formed by multiple step anneal
US-9018089-B2 · Apr 28, 2015 · US
Notable patents
Representative or frequently cited publications from precomputed assignee stats.
Integrated time dependent dielectric breakdown reliability testing
US-9557369-B2 · Jan 31, 2017 · US
Integrated time dependent dielectric breakdown reliability testing
US-9448277-B2 · Sep 20, 2016 · US
Method and structure for determining thermal cycle reliability
US-9287186-B2 · Mar 15, 2016 · US
Low k porous SiCOH dielectric and integration with post film formation treatment
US-9219037-B2 · Dec 22, 2015 · US
Multiple step anneal method and semiconductor formed by multiple step anneal
US-9018089-B2 · Apr 28, 2015 · US
Top CPC classifications
Most common classification codes in this portfolio.
| CPC | Patents |
|---|---|
| H10P74/277 | 2 |
| H01L22/34 | 2 |
| H10W20/097 | 2 |
| H01L21/76828 | 2 |
| G01R31/2879 | 2 |
Technology areas
Mapped technology topics for this assignee.
| Technology | Patents |
|---|---|
| Electricity | 4 |
| Physics | 3 |
| Chemistry & Metallurgy | 1 |
| Cross-Sectional Technologies | 1 |