Substrate processing method and substrate processing system

US9953840B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9953840-B2
Application numberUS-201615371707-A
CountryUS
Kind codeB2
Filing dateDec 7, 2016
Priority dateDec 25, 2015
Publication dateApr 24, 2018
Grant dateApr 24, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A substrate processing method according to the present disclosure includes: a liquid processing process of supplying a processing liquid to a substrate having a surface on which a pattern having a plurality of convex portions is formed; a drying process of removing the processing liquid existing on the surface of the substrate dry the substrate, and a separating process of separating a sticking portion between adjacent ones of the convex portions after the drying process.

First claim

Opening claim text (preview).

What is claimed is: 1. A substrate processing method comprising: a liquid processing process of supplying a processing liquid to a substrate having a surface on which a pattern having a plurality of convex portions is formed; a drying process of removing the processing liquid existing on the surface of the substrate to dry the substrate; and a separating process of separating a sticking portion between adjacent ones of the convex portions after the drying process. 2. The substrate processing method of claim 1 , wherein the separating process separates the sticking portion by etching the sticking portion with an etching gas supplied to the substrate. 3. The substrate processing method of claim 2 , further comprising a thermal processing process of heating the substrate after the separating process. 4. The substrate processing method of claim 2 , wherein the etching gas is a mixture of ammonia gas and hydrogen fluoride gas. 5. The substrate processing method of claim 4 , wherein the surfaces of the convex portions where the sticking portion is formed are made of silicon or a silicon oxide. 6. The substrate processing method of claim 1 , wherein the liquid processing process includes a chemical liquid processing process of supplying a chemical liquid to the substrate, and a rinsing process of washing the chemical liquid from the surface of the substrate by supplying a rinse liquid to the substrate, and the drying process is performed after the rinsing process. 7. The substrate processing method of claim 1 , wherein the liquid processing process includes: a chemical liquid processing process of supplying a chemical liquid to the substrate; a rinsing process of washing the chemical liquid from the surface of the substrate by supplying a rinse liquid to the substrate; and a replacing process of replacing the rinse liquid on the surface of the substrate with a solvent having a higher volatility than that of the rinse liquid by supplying the solvent to the substrate, and the drying process is performed after the replacing process. 8. The substrate processing method of claim 2 , wherein the separating process is performed in a decompressed atmosphere. 9. The substrate processing method of claim 2 , wherein the etching gas is supplied by moving along the surface of the substrate. 10. The substrate processing method of claim 2 , wherein the separating process is performed in the decompressed atmosphere and at a higher temperature than a room temperature. 11. The substrate processing method of claim 1 , wherein the liquid processing process includes: a chemical liquid processing process of supplying a chemical liquid to the substrate; a rinsing process of washing the chemical liquid from the surface of the substrate by supplying a rinse liquid to the substrate; and a hydrophobization processing process of forming a hydrophobized protecting film on the substrate.

Assignees

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Classifications

  • Thermal treatments, e.g. annealing or sintering · CPC title

  • using mainly spraying means, e.g. nozzles · CPC title

  • for wet etching · CPC title

  • for drying etching · CPC title

  • for wet cleaning or washing · CPC title

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What does patent US9953840B2 cover?
A substrate processing method according to the present disclosure includes: a liquid processing process of supplying a processing liquid to a substrate having a surface on which a pattern having a plurality of convex portions is formed; a drying process of removing the processing liquid existing on the surface of the substrate dry the substrate, and a separating process of separating a sticking…
Who is the assignee on this patent?
Tokyo Electron Ltd
What technology area does this patent fall under?
Primary CPC classification H10P70/20. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Apr 24 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).