Solder alloy, solder paste, and electronic circuit board
US-9445508-B2 · Sep 13, 2016 · US
US9931716B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9931716-B2 |
| Application number | US-201414442628-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 28, 2014 |
| Priority date | Jun 24, 2014 |
| Publication date | Apr 3, 2018 |
| Grant date | Apr 3, 2018 |
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A solder alloy is a tin-silver-copper solder alloy substantially consisting of tin, silver, copper, bismuth, nickel, cobalt, and indium. With respect to the total amount of the solder alloy, the content ratio of the silver is 2 mass % or more and 5 mass % or less; the content ratio of the copper is 0.1 mass % or more and 1 mass % or less; the content ratio of the bismuth is 0.5 mass % or more and 4.8 mass % or less; the content ratio of the nickel is 0.01 mass % or more and 0.15 mass % or less; the content ratio of the cobalt is 0.001 mass % or more and 0.008 mass % or less; the content ratio of the indium is above 6.2 mass % and 10 mass % or less; and the content ratio of the tin is the remaining ratio.
Opening claim text (preview).
The invention claimed is: 1. A solder alloy consisting of: tin, silver, copper, bismuth, nickel, cobalt, and indium, and optionally antimony, wherein with respect to the total amount of the solder alloy, the content ratio of the silver is 2 mass % or more and 5 mass % or less; the content ratio of the copper is 0.1 mass % or more and 1 mass % or less; the content ratio of the bismuth is 0.5 mass % or more and 4.8 mass % or less; the content ratio of the nickel is 0.01 mass % or more and 0.15 mass % or less; the content ratio of the cobalt is 0.001 mass % or more and 0.008 mass % or less; the content ratio of the indium is 6.3 mass % or more and 10 mass % or less; the content ratio of antimony, when present, being 0.4 mass % or more and 10 mass % or less; and the content ratio of the tin is the remaining ratio, and wherein the solder alloy satisfies 1) a crack resistance ranking of A or B, wherein ranking A corresponds to A: a size of an observed maximum structure is less than 50 μm and ranking B corresponds to B: a size of an observed maximum structure is 50 μm or more and 100 μm or less; 2) a durability ranking of A or B, wherein ranking A corresponds to A: a crack completely crossing a solder fillet portion does not occur until 2500 cycles and ranking B corresponds to B: a crack completely crossing a solder fillet portion occurs between 1501 and 2500 cycles; 3) a breakage of component ranking of A, wherein ranking A corresponds to A: a crack does not occur in a chip component. 2. A solder alloy consisting of: tin, silver, copper, bismuth, nickel, cobalt, indium, and antimony, wherein with respect to the total amount of the solder alloy, the content ratio of the silver is 2 mass % or more and 5 mass % or less; the content ratio of the copper is 0.1 mass % or more and 1 mass % or less; the content ratio of the bismuth is 0.5 mass % or more and 4.8 mass % or less; the content ratio of the nickel is 0.01 mass % or more and 0.15 mass % or less; the content ratio of the cobalt is 0.001 mass % or more and 0.008 mass % or less; the content ratio of the indium is 6.3 mass % or more and 10 mass % or less; the content ratio of antimony is 0.4 mass % or more and 10 mass % or less; and the content ratio of the tin is the remaining ratio, and wherein the solder alloy satisfies 1) a crack resistance ranking of A or B, wherein ranking A corresponds to A: a size of an observed maximum structure is less than 50 μm and ranking B corresponds to B: a size of an observed maximum structure is 50 μm or more and 100 μm or less; 2) a durability ranking of A or B, wherein ranking A corresponds to A: a crack completely crossing a solder fillet portion does not occur until 2500 cycles and ranking B corresponds to B: a crack completely crossing a solder fillet portion occurs between 1501 and 2500 cycles; 3) a breakage of component ranking of A, wherein ranking A corresponds to A: a crack does not occur in a chip component.
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