Conductivity modulated drain extended MOSFET

Patent metadata

Field	Value
Publication number	US-9905558-B1
Application number	US-201615387992-A
Country	US
Kind code	B1
Filing date	Dec 22, 2016
Priority date	Dec 22, 2016
Publication date	Feb 27, 2018
Grant date	Feb 27, 2018

Abstract

An integrated circuit is fabricated on a semiconductor substrate. An insulated gate bipolar transistor (IGBT) is formed upon the semiconductor substrate in which the IGBT has an anode terminal, a cathode terminal, and a gate terminal, and a drift region. A diode is also formed on the semiconductor substrate and has an anode terminal and a cathode terminal, in which the anode of the diode is coupled to the anode terminal of the IGBT and the cathode of the diode is coupled to the drift region of the IGBT.

First claim

What is claimed is:

1. A transistor, comprising:
a semiconductor substrate;
a first p+ region formed within an n-type region adjacent a p-type dwell region that together form a pnp structure within the semiconductor substrate, wherein an intrinsic diode is formed by the p+ region and the n-type region;
a second n-type region formed within the p-type dwell region;
an insulated conductive gate lying above the p-type dwell region configured to control a channel region in the p-type dwell region;
a pad coupled to the first p+ region; and
a second diode coupled between the pad and an n-type drift region in parallel with the intrinsic diode.

2. The transistor of claim 1 , further including an n+ region formed in the n-type region, in which the second diode is connected to the n+ region.

3. The transistor of claim 1 , in which the second diode is formed by a second p+ region formed within a deep n-type ring that surrounds the power transistor formed in the semiconductor substrate.

4. The transistor of claim 3 , wherein the deep n-type ring overlaps a portion of the first p+ region, such that gain of the pnp structure is reduced.

5. The transistor of claim 1 in which the second diode is a discrete diode device formed in the semiconductor substrate.

6. The transistor of claim 1 , further comprising a resistive device coupled in series with the interface pad and the first p+ region.

7. The transistor of claim 1 having at least one finger, in which the at least one finger has a linear topology.

8. The transistor of claim 1 being an insulated gate bipolar transistor (IGBT) and further including a third p+ region formed in the second n-type region;
in which the first p+ region serves as an anode of the IGBT; and
in which the third p+ region serves as a cathode of the IGBT.

Assignees

• Texas Instruments Inc

Inventors

• Appaswamy Aravind C
• Di Sarro James P
• Farbiz Farzan

Classifications

• H01L29/7393

  Electricity · mapped topic

• H01L29/4916

  Electricity · mapped topic

• H01L27/0705

  Electricity · mapped topic

• H01L27/0722 Primary

  Electricity · mapped topic

• H01L27/0711

  Electricity · mapped topic