Planar cavity MEMS and related structures, methods of manufacture and design structures

US9862598B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9862598-B2
Application numberUS-201514840422-A
CountryUS
Kind codeB2
Filing dateAug 31, 2015
Priority dateJun 25, 2010
Publication dateJan 9, 2018
Grant dateJan 9, 2018

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A method of forming at least one Micro-Electro-Mechanical System (MEMS) includes forming a beam structure and an electrode on an insulator layer, remote from the beam structure. The method further includes forming at least one sacrificial layer over the beam structure, and remote from the electrode. The method further includes forming a lid structure over the at least one sacrificial layer and the electrode. The method further includes providing simultaneously a vent hole through the lid structure to expose the sacrificial layer and to form a partial via over the electrode. The method further includes venting the sacrificial layer to form a cavity. The method further includes sealing the vent hole with material. The method further includes forming a final via in the lid structure to the electrode, through the partial via.

First claim

Opening claim text (preview).

What is claimed: 1. A method in a computer-aided design system for generating a functional design model of a MEMS, the method comprising: generating a functional representation of a beam structure; generating a functional representation of an electrode on an insulator layer, remote from the beam structure; generating a functional representation of at least one sacrificial layer over the beam structure, and remote from the electrode; generating a functional representation of a lid structure over the at least one sacrificial layer and the electrode; generating a functional representation of simultaneously providing a vent hole through the lid structure to expose the sacrificial layer and to form a partial via over the electrode; generating a functional representation of venting the sacrificial layer to form a cavity; generating a functional representation of sealing the vent hole with material; and generating a functional representation of forming a final via in the lid structure to the electrode, through the partial via, wherein the partial via has a larger cross section diameter than a remaining portion of the final via, and the function design model of the MEMS is generated to manufacture a MEMS device. 2. The method of claim 1 , further comprising: generating a functional representation of forming a sacrificial material on discrete wires; generating a functional representation of forming the beam structure on the sacrificial material; generating a functional representation of forming the insulator layer over the sacrificial material; and generating a functional representation of forming a cavity via in the insulator layer, exposing a portion of the sacrificial material, wherein: the sacrificial layer is formed in the cavity via; and the venting comprises venting the sacrificial material and the sacrificial layer to form at least a lower cavity and an upper cavity, respectively. 3. The method of claim 1 , wherein the sealing the vent hole comprises depositing dielectric material, which covers a surface of the lid structure within the partial via. 4. The method of claim 1 , wherein the material includes dielectric material and a nitride cap. 5. The method of claim 1 , wherein the vent hole is provided greater than 5 microns away from both the partial via and the final via. 6. The method of claim 1 , wherein the sacrificial layer is vented using a XeF 2 etchant through the vent hole. 7. A method in a computer-aided design system for generating a functional design model of a MEMS, the method comprising: generating a functional representation of a beam structure; generating a functional representation of an electrode on an insulator layer, remote from the beam structure; generating a functional representation of at least one sacrificial layer over the beam structure, and remote from the electrode; generating a functional representation of a lid structure over the at least one sacrificial layer and the electrode; generating a functional representation of simultaneously providing a vent hole through the lid structure to expose the sacrificial layer and to form a partial via over the electrode; generating a functional representation of venting the sacrificial layer to form a cavity; generating a functional representation of sealing the vent hole with material; and generating a functional representation of forming a final via in the lid structure to the electrode, through the partial via; generating a functional representation of forming a sacrificial material on discrete wires; generating a functional representation of forming the beam structure on the sacrificial material; generating a functional representation of forming the insulator layer over the sacrificial material; and generating a functional representation of forming a cavity via in the insulator layer, exposing a portion of the sacrificial material, wherein: the sacrificial layer is formed in the cavity via, the venting comprises venting the sacrificial material and the sacrificial layer to form at least a lower cavity and an upper cavity, respectively, the function design model of the MEMS is generated to manufacture a MEMS device, the sealing the vent hole with material includes depositing the material on a surface of the partial via, and forming the final via includes etching through the material in the partial via and continuing to etch the lid structure to the electrode. 8. A method in a computer-aided design system for generating a functional design model of a MEMS, the method comprising: generating a functional representation of a beam structure; generating a functional representation of an electrode on an insulator layer, remote from the beam structure; generating a functional representation of at least one sacrificial layer over the beam structure, and remote from the electrode; generating a functional representation of a lid structure over the at least one sacrificial layer and the electrode; generating a functional representation of simultaneously providing a vent hole through the lid structure to expose the sacrificial layer and to form a partial via over the electrode; generating a functional representation of venting the sacrificial layer to form a cavity; generating a functional representation of sealing the vent hole with material; and generating a functional representation of forming a final via in the lid structure to the electrode, through the partial via, wherein the sealing the vent hole comprises depositing dielectric material, which covers a surface of the lid structure within the partial via, the function design model of the MEMS is generated to manufacture a MEMS device, and the forming the final via includes etching through the dielectric material within the partial via. 9. The method of claim 8 , further comprising forming a nitride cap on the dielectric material, including within the partial via. 10. The method of claim 9 , wherein the forming the final via includes etching through the nitride cap within the partial via. 11. The method of claim 10 , further comprising generating a functional representation of forming polyimide material on the nitride cap within the partial via, wherein the forming of the final via includes etching through an opening in the polymide material and within the partial via.

Assignees

Inventors

Classifications

  • Solid dielectric type · CPC title

  • Etching · CPC title

  • Assembling to base an electrical component, e.g., capacitor, etc. · CPC title

  • Electrostrictive relays; Piezoelectric relays · CPC title

  • Switches making use of microelectromechanical systems [MEMS] (for electromagnetic relays H01H50/005; for electrostatic relays H01H59/0009) · CPC title

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What does patent US9862598B2 cover?
A method of forming at least one Micro-Electro-Mechanical System (MEMS) includes forming a beam structure and an electrode on an insulator layer, remote from the beam structure. The method further includes forming at least one sacrificial layer over the beam structure, and remote from the electrode. The method further includes forming a lid structure over the at least one sacrificial layer and …
Who is the assignee on this patent?
IBM
What technology area does this patent fall under?
Primary CPC classification B81C1/00476. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Jan 09 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).