Method of producing silicon single crystal ingot

Patent metadata

Field	Value
Publication number	US-9777394-B2
Application number	US-201414758068-A
Country	US
Kind code	B2
Filing date	Jan 31, 2014
Priority date	Feb 22, 2013
Publication date	Oct 3, 2017
Grant date	Oct 3, 2017

Abstract

A method of producing silicon single crystal ingot by pulling the silicon single crystal ingot made of an N-region by the CZ method, including: performing an EOSF inspection including a heat treatment to manifest oxide precipitates and selective etching on sample wafer from the silicon single crystal ingot composed of the N-region to measure a density of EOSF; performing a shallow-pit inspection to investigate a pattern of occurrence of a shallow pit; adjusting the pulling conditions according to result of identification of a defect region of the sample wafer by the EOSF and shallow-pit inspections to pull a next silicon single crystal ingot composed of the N-region, wherein in the identification of the defect region, for an N-region, what portion of an Nv-region or Ni-region the defect region corresponds to is also identified.

First claim

The invention claimed is:

1. A method of producing a silicon single crystal ingot by pulling the silicon single crystal ingot composed of an N-region while controlling pulling conditions by a Czochralski method, comprising:
performing an EOSF inspection comprising a heat treatment to manifest oxide precipitates and selective etching on a sample wafer cut from the pulled silicon single crystal ingot composed of the N-region to measure a density of Enhanced-OSF, the heat treatment to manifest the oxide precipitates comprises a first heat treatment performed at 900° C. to 1050° C. for 30 to 300 minutes and a second heat treatment subsequently performed at 1100° C. to 1200° C. for 30 to 200 minutes;
performing a shallow-pit inspection to investigate a pattern of occurrence of a shallow pit in the sample wafer subjected to the EOSF inspection;
identifying a defect region of the sample wafer by the EOSF inspection and the shallow-pit inspection; and
adjusting the pulling conditions according to result of the identification to pull a next silicon single crystal ingot composed of the N-region, wherein
in the identification of the defect region,
a relation of the density of the Enhanced-OSF to a V-region and an N-region is previously investigated, and the V-region and the N-region are identified on a basis of the relation and the density of the Enhanced-OSF measured in the EOSF inspection;
a position of an oxide-precipitates formed region is decided from the pattern of the occurrence of the shallow pit investigated in the shallow-pit inspection, the oxide-precipitates formed region being formed at an interface between an I-region and an N-region, and the I-region and the N-region are identified; and

if the defect region is an N-region, what portion of an Nv-region the defect region corresponds to, or what portion of an Ni-region the defect region corresponds to is also identified, and the pulling conditions are adjusted according to the result of the identification.

2. The method according to claim 1 , wherein the pulling conditions are adjusted by adjusting at least one of a pulling rate F of the silicon single crystal ingot composed of the N-region, a distance D between a surface of a melt of raw material and a lower end of a heat shield, a position P H of a heater to heat the raw material, and a position Pc of a crucible to contain the melt of the raw material.

3. The method according to claim 2 , wherein in the identification of the defect region, if the defect region is identified as a portion on a V-region side of the Nv-region, then the pulling rate F is decreased, or the distance D is increased, and if the defect region is identified as a portion on an I-region side of the Ni-region, then the pulling rate F is increased, or the distance D is decreased.

Assignees

• Shinetsu Handotai Kk

Inventors

• Sonokawa Susumu
• Sato Wataru
• Mitamura Nobuaki
• Ohta Tomohiko

Classifications

• H10P74/203

  Structural properties, e.g. testing or measuring thicknesses, line widths, warpage, bond strengths or physical defects · CPC title

• H10P36/20

  Intrinsic gettering, i.e. thermally inducing defects by using oxygen present in the silicon body · CPC title

• C30B15/04

  adding doping materials, e.g. for n-p-junction · CPC title

• H01L22/12

  Electricity · mapped topic

• C30B15/203 Primary

  the relationship of pull rate (v) to axial thermal gradient (G) · CPC title