Image type electron spin polarimeter

Patent metadata

Field	Value
Publication number	US-9741533-B2
Application number	US-201314906254-A
Country	US
Kind code	B2
Filing date	Sep 10, 2013
Priority date	Jul 24, 2013
Publication date	Aug 22, 2017
Grant date	Aug 22, 2017

Abstract

Provided is an image type electron spin polarimeter. It at least comprises a scattering target, a two-dimensional electron detector and an electron bending unit, wherein the electron bending unit is used for bending the orbit of the incident (scattered) electrons to a first (second) angle to arrive the scattering target (two-dimensional electron detector) with an optimal incident angle, and to transfer the image of the electron intensities from the entrance plane (scattering target) to the scattering target (two-dimensional electron detector) with small aberrations, and to separate the orbits of incident and scattered electrons to increase the degree of freedom of the geometric configuration of each component of the spin polarimeter. At least one of the first and second angles is not 0°, thereby achieving the first transfer of the two-dimensional image of electron intensities on the entrance plane to the scattering target and the second transfer from scattering target to the two-dimensional electron detector respectively with small aberrations, and then achieving multichannel measurements of the electron spin.

First claim

What is claimed is:

1. An image type electron spin polarimeter comprising:
a scattering target, a two-dimensional electron detector and an electron bending unit;
wherein, the electron bending unit is used for:
bending orbits of incident electrons to a first angle to enable the incident electrons to arrive at the scattering target at an optimal incident angle and to transfer a first electron intensity image from an entrance plane to the scattering target;
bending orbits of scattered electrons to a second angle to enable the scattered electrons to arrive at the two-dimensional electron detector at an optimal emergence angle and to transfer a second electron intensity image from the scattering target to the two-dimensional electron detector;
separating orbits of the incident electrons and the scattered electrons; and

at least one of the first angle and the second angle is greater than 0°.

2. The image type electron spin polarimeter according to claim 1 , wherein the electron bending unit enables the incident electrons to move in a curved orbit with the first bending angle to arrive at the scattering target with a normal incident angle and to transfer the first electron intensity image from the entrance plane to the scattering target with a small aberration.

3. The image type electron spin polarimeter according to claim 2 , wherein the first bending angle in the range of [0° to 180°].

4. The image type electron spin polarimeter according to claim 3 , wherein the first bending angle that is 180° or 90°.

5. The image type electron spin polarimeter according to claim 1 , wherein the first bending angle in a range of [0° to 180°].

6. The image type electron spin polarimeter according to claim 5 , wherein the first bending angle is 180° or 90°.

7. The image type electron spin polarimeter according to claim 1 , wherein the electron bending unit enables the scattered electrons from the scattering target to move in a curved orbit with the second bending angle to arrive at the two-dimensional electron detector with a normal incident angle and transfer the second electron intensity image from the scattering target to the two dimensional electron detector with a small aberration.

8. The image type electron spin polarimeter according to claim 7 , wherein the second angle is in a range of [0° to 180°].

9. The image type electron spin polarimeter according to claim 8 , wherein the second angle is 180° or 90°.

10. The image type electron spin polarimeter according to claim 1 , wherein the second angle is in a range of [0° to 180°].

11. The image type electron spin polarimeter according to claim 10 , wherein the second angle is 180° or 90°.

12. The image type electron spin polarimeter according to claim 1 , wherein the electron bending unit comprises a magnetic field generation unit for generating magnetic field and an electron lens system.

13. The image type electron spin polarimeter according to claim 12 , wherein the electron lens system used for transferring the incident electrons from the magnetic field to the scattering target is also used for transferring the scattered electrons from the scattering target back to the magnetic field.

14. The image type electron spin polarimeter according to claim 12 , wherein the magnetic field generation unit comprises a main dipole magnet and at least one of correcting magnet for correcting edge effects of the main dipole magnet and for focusing a electron beam in a perpendicular direction relative to a electron orbital plane.

15. The image type electron spin polarimeter according to claim 1 , wherein the scattering target comprises a Fe (001)−p (1×1)O target or a W(100) target.

Assignees

• Shanghai Inst Microsystem & Information Tech Cas

Inventors

• Qiao Shan
• Wan Weishi
• Ji Fuhao

Classifications

• H01J37/252 Primary

  Tubes for spot-analysing by electron or ion beams; Microanalysers · CPC title

• H01J2237/2544

  Diffraction [LEED] · CPC title

• H01J2237/24557

  Spin polarisation (particles) · CPC title

• H01J37/29 Primary

  Reflection microscopes · CPC title

• H01J37/244

  Detectors; Associated components or circuits therefor · CPC title