Inspection method

US9664628B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9664628-B2
Application numberUS-201113302895-A
CountryUS
Kind codeB2
Filing dateNov 22, 2011
Priority dateNov 23, 2010
Publication dateMay 30, 2017
Grant dateMay 30, 2017

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  1. Title

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  2. Abstract

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Abstract

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In order to inspect a board, a measurement area is set on a board, and reference data and measurement data of the measurement area are acquired. Then, a conversion condition is established for the measurement area, and a conversion relation is acquired according to a distortion degree between reference data and measurement data. Thereafter, validity of the conversion relation is verified by using at least one of verifying that a comparison feature object satisfies the conversion relation, verifying that a verification feature object selected from feature objects satisfies the conversion relation and verifying that a pad formed on the board satisfies the conversion relation. Then, the conversion condition is confirmed, and an inspection area for inspecting a measurement target is set according to the confirmed conversion condition. Thus, an inspection area may be correctly set so that distortion is compensated for.

First claim

Opening claim text (preview).

What is claimed is: 1. An inspection method comprising: setting, by a central processing unit, a measurement area on a board, the measurement area including a comparison feature object and a verification feature object; acquiring, by the central processing unit, reference data and measurement data of the measurement area; establishing, by the central processing unit, a conversion condition for the measurement area; acquiring, by the central processing unit, a conversion relation by comparing reference data and measurement data corresponding to the comparison feature object, wherein the conversion relation includes a distortion between the reference data and the measurement data corresponding to the comparison feature object; applying, by the central processing unit, the conversion relation with respect to reference data and measurement data corresponding to the verification feature object to obtain an error; verifying, by the central processing unit, validity of the conversion relation by determining whether the error exceeds a predetermined tolerance range; confirming, by the central processing unit, the conversion condition when the validity of the conversion relation is verified and the error does not exceed the predetermined tolerance range; and setting, by the central processing unit, an inspection area by compensating the distortion according to the confirmed conversion condition; inspecting, by the central processing unit, the board based on the inspection area to correctly judge whether the board is good or bad. 2. The inspection method of claim 1 , further comprising verifying, by a central processing unit, validity of the acquired conversion relation by using at least one of a first verification method of verifying that the verification feature object selected from feature objects except for the comparison feature object satisfies the conversion relation, and a second verification method of verifying that a pad corresponding to an inspection target formed on the board satisfies the conversion relation, and verifying validity of the conversion relation is performed in order of the first verification method and the second verification method. 3. The inspection method of claim 1 , in case that the conversion relation is not valid as a result of verification of the validity of the conversion relation, further comprising: changing the conversion condition; and repeating acquiring the conversion relation, confirming the conversion condition, and setting the inspection area. 4. The inspection method of claim 1 , wherein the conversion condition further includes at least one of a coordinate conversion model and an illumination setting of an illumination device. 5. The inspection method of claim 1 , wherein in case that the conversion relation is not valid as a result of verification of the validity of the conversion relation, further comprising repeating acquiring the conversion relation, confirming the conversion condition, and setting the inspection area, by using a conversion condition of an adjacent measurement area adjacent to the measurement area. 6. The inspection method of claim 1 , wherein the set measurement area is plural, and the conversion condition is established for each measurement area. 7. The inspection method of claim 1 , wherein the comparison feature object and the verification feature object are defined as a feature block by a block unit.

Assignees

Inventors

Classifications

  • Patterns showing highly reflecting parts, e.g. metallic elements · CPC title

  • for PCB's · CPC title

  • Inspecting patterns on the surface of objects {(contactless testing of electronic circuits G01R31/308; testing currency G07D; manufacturing processes per se of semiconductor devices implementing a measuring step H10P74/20)} · CPC title

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What does patent US9664628B2 cover?
In order to inspect a board, a measurement area is set on a board, and reference data and measurement data of the measurement area are acquired. Then, a conversion condition is established for the measurement area, and a conversion relation is acquired according to a distortion degree between reference data and measurement data. Thereafter, validity of the conversion relation is verified by usi…
Who is the assignee on this patent?
Cho Soo-Young, Hwang Bong-Ha, Kim Min-Young, and 2 more
What technology area does this patent fall under?
Primary CPC classification G01N21/95684. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 30 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).