Method of measuring measurement target

Patent metadata

Field	Value
Publication number	US-9256912-B2
Application number	US-77959910-A
Country	US
Kind code	B2
Filing date	May 13, 2010
Priority date	May 13, 2009
Publication date	Feb 9, 2016
Grant date	Feb 9, 2016

Abstract

In order to measure a measurement target on a PCB, height information of the PCB is acquired by using a first image photographed by illuminating a grating pattern light onto the PCB. Then, a first area protruding on the PCB by greater than a reference height is determined as the measurement target by using the height information. Thereafter, color information of the PCB is acquired by using a second image photographed by illuminating light onto the PCB. Then, the first color information of the first area determined as the measurement target out of the color information of the PCB is set as reference color information. Thereafter, the reference color information is compared with color information of an area except for the first area to judge whether the measurement target is formed in the area except for the first area. Thus, the measurement target may be accurately measured.

First claim

What is claimed is:

1. A method of determining a solder area on a printed circuit board (PCB) comprising:
taking a first photograph image;
taking a second photograph image;
acquiring a three dimensional height information of the PCB by using the first photographed image that is photographed by illuminating a grating pattern light using a first illumination unit onto the PCB;
determining a first area protruding on the PCB by a height greater than or equal to a reference height as a solder area by using the acquired height information;
acquiring a color information of the PCB by using the second photographed image that is photographed by illuminating a light generated from a second illumination unit onto the PCB;
defining the first color information of the first area that is determined as the solder area out of the acquired color information of the PCB as a reference color information;
classifying the reference color information of the first area and a color information of a second area different from the first area into first and second clusters, respectively; and
comparing the reference color information with the color information of the second area to determine whether the second area is an additional solder area or not, comprising:
checking whether the second cluster belongs to the first cluster or not; and
in case that the second cluster belongs the first cluster, determining that the second area is the additional solder area.

2. The method of claim 1 , wherein the first and second clusters include a feature extracted from the acquired color information by using a color coordinate system, and the feature includes at least one of hue, saturation, and intensity.

3. The method of claim 1 , further comprising:
acquiring a visibility information based on N grating pattern lights according to movement of a grating unit; and
comparing a visibility information of the first area and a visibility information of the second area to determine whether the second area is the additional solder area or not.

4. The method of claim 1 , further comprising:
acquiring a color information of a third area, in which a predetermined comparison object is located to protrude on the PCB, from the color information of the PCB; and
classifying the color information of the third area into a third cluster,
wherein the third area corresponding to the third cluster is excluded from the second area corresponding to the second cluster.

5. The method of claim 1 , further comprising:
acquiring a color information of a fourth area, in which the solder area is not formed, from the color information of the PCB; and
classifying the color information of the fourth area into a fourth cluster,
wherein the fourth area corresponding to the fourth cluster is excluded from the second area corresponding to the second cluster.

Assignees

• Jeong Joong-Ki
• Kim Min-Young
• You Hee-Wook
• Koh Young Tech Inc

Inventors

• Jeong Joong-Ki
• Kim Min-Young
• You Hee-Wook

Classifications

• G06T2207/10152

  Varying illumination · CPC title

• G01N21/8806

  Specially adapted optical and illumination features · CPC title

• G01N2021/95646

  Soldering · CPC title

• G01N2201/0635

  Structured illumination, e.g. with grating · CPC title

• G06T7/0008

  checking presence/absence · CPC title