Inspection system
US-2024369495-A1 · Nov 7, 2024 · US
Patterns showing highly reflecting parts, e.g. metallic elements
Patterns showing highly reflecting parts, e.g. metallic elements · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01N21/95684 |
| Official title | {Patterns showing highly reflecting parts, e.g. metallic elements} |
| Display label | Patterns showing highly reflecting parts, e.g. metallic elements |
| Total patents | 305 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 17 |
| 2016 | 13 |
| 2017 | 13 |
| 2018 | 24 |
| 2019 | 32 |
| 2020 | 38 |
| 2021 | 43 |
| 2022 | 37 |
| 2023 | 27 |
| 2024 | 35 |
| 2025 | 20 |
| 2026 | 6 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Method and apparatus for inspecting a sample
US-2018364563-A1 · Dec 20, 2018 · US
Inspection system and inspection method
US-2018357755-A1 · Dec 13, 2018 · US
Method of generating a compensation matrix during a substrate inspection
US-10151705-B2 · Dec 11, 2018 · US
Soldering Material, Solder Joint, and Method for Inspecting Soldering Material
US-2018281118-A1 · Oct 4, 2018 · US
Method and system of measuring semiconductor device and method of fabricating semiconductor device using the same
US-2018254225-A1 · Sep 6, 2018 · US
Inspection of microelectronic devices using near-infrared light
US-10066927-B2 · Sep 4, 2018 · US
Electronic component transport apparatus and electronic component inspection apparatus
US-2018180669-A1 · Jun 28, 2018 · US
Three-dimensional shape measurement apparatus
US-2018156606-A1 · Jun 7, 2018 · US
Method and system of measuring semiconductor device and method of fabricating semiconductor device using the same
US-9991174-B2 · Jun 5, 2018 · US
Three-dimensional shape measurement apparatus
US-2018128603-A1 · May 10, 2018 · US
Apparatus and method for optical inspection of objects, in particular metal lids
US-2018095044-A1 · Apr 5, 2018 · US
Method to determine connector metal wear via flouresence
US-2018095038-A1 · Apr 5, 2018 · US
Visual inspection apparatus and visual inspection method
US-9933371-B2 · Apr 3, 2018 · US
Apparatus and methods for weld measurement
US-9927367-B2 · Mar 27, 2018 · US
Inspection apparatus and quality control system for surface mounting line
US-2018049356-A1 · Feb 15, 2018 · US
Method to determine connector metal wear via flouresence
US-9885659-B1 · Feb 6, 2018 · US
Inspection apparatus and inspection method
US-2017307544-A1 · Oct 26, 2017 · US
Redirecting solder material to visually inspectable package surface
US-2017278762-A1 · Sep 28, 2017 · US
Systems and Methods for Enhancing Object Visibility for Overhead Imaging
US-2017270639-A1 · Sep 21, 2017 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01N21/95684?
- CPC G01N21/95684 is the Cooperative Patent Classification code for “Patterns showing highly reflecting parts, e.g. metallic elements.”
- How many patents are filed under CPC G01N21/95684 (Patterns showing highly reflecting parts, e.g. metallic elements)?
- Our database includes 305 publications tagged with this CPC code.
- Is patent activity under CPC G01N21/95684 growing?
- Publication counts under this code: 35 in 2024 vs 20 in 2025 (latest complete years).