Techniques for programming of select gates in NAND memory

Patent metadata

Field	Value
Publication number	US-9659656-B2
Application number	US-201615062987-A
Country	US
Kind code	B2
Filing date	Mar 7, 2016
Priority date	Aug 20, 2014
Publication date	May 23, 2017
Grant date	May 23, 2017

Abstract

In a non-volatile memory formed according to a NAND-type architecture that has, on one or both ends of the NAND strings, multiple select gates including some with programmable threshold voltages, a structure and corresponding for efficiently programming of such select gates. On the drain side, the end most of multiple drain select transistors is individually controllable and used for biasing purposes while one or more other drain side select gates are collectively programmed to set adjust their threshold voltage. Independently, on the source side, the end most of multiple source select transistors is individually controllable and used for biasing purposes while other source side select gates are collectively programmed to set adjust their threshold voltage.

First claim

What is claimed is:

1. A memory structure, comprising:
a plurality of serially-connected drain select transistors each having a control gate;
a plurality of memory transistors coupled to the plurality of serially-connected drain select transistors; and
one or more source select transistors coupled to the plurality of memory transistors,
wherein the plurality of serially-connected drain select transistors comprises a first drain select transistor coupled to a bit line and two or more second drain select transistors coupled to the bit line via the first drain select transistor, the second drain select transistors having programmable threshold voltages, and
wherein the control gate of the first drain select transistor is coupled to a first control line and the control gates of the second drain select transistors are coupled to a second control line for concurrent programming of the second drain select transistors.

2. The memory structure of claim 1 , wherein the plurality of serially-connected drain select transistors is a first plurality of serially-connected drain select transistors, the plurality of memory transistors is a first plurality of memory transistors, and the one or more source select transistors is a first one or more source select transistors, the memory structure further comprising:
a second plurality of serially-connected drain select transistors each having a control gate;
a second plurality of memory transistors coupled to the second plurality of serially-connected drain select transistors; and
a second one or more source select transistors coupled to the second plurality of memory transistors;
wherein the second plurality of serially-connected drain select transistors comprises a third drain select transistor coupled to a second bit line and two or more fourth drain select transistors coupled to the bit line via the third drain select transistor, and
wherein the control gate of the third drain select transistor is coupled to the first control line and the control gates of the fourth drain select transistors are coupled to a third control line for concurrent programming of the fourth drain select transistors.

3. The memory structure of claim 2 , wherein the threshold voltages of the second drain select transistors are programmable independently from a threshold voltage of the first drain select transistor.

4. The memory structure of claim 3 , wherein during programming of the threshold voltages of the second drain select transistors, a conducting voltage level is applied to the first control line and a programming pulse is applied to the second control line.

5. The memory structure of claim 2 , wherein the threshold voltages of the second drain select transistors are configured to have positive values.

6. The memory structure of claim 5 , wherein during programming of the plurality of memory transistors, the second control line is biased at a voltage level below the threshold voltages of the second drain select transistors, thereby ensuring that the second drain select transistors are in a non-conducting state.

7. The memory structure of claim 1 , wherein the threshold voltages of the second drain select transistors are jointly programmable.

8. The memory structure of claim 1 , wherein the first drain select transistor is directly coupled to the bit line without an intervening transistor.

9. The memory structure of claim 1 , wherein the one or more source select transistors comprise a first source select transistor coupled to a source line and a second source select transistor coupled to the source line via the first source select transistor, and wherein the control gate of the first source select transistor is controllable separately from the control gate of the second source select transistor.

10. A memory array, comprising:
a plurality of source lines;
a plurality of bit lines; and
a plurality of memory structures,
wherein at least one of the plurality of memory structures comprises:
a plurality of serially-connected drain select transistors each having a control gate;
a plurality of memory transistors coupled to the plurality of serially-connected drain select transistors; and
one or more source select transistors coupled to the plurality of memory transistors,
wherein the plurality of serially-connected drain select transistors comprises a first drain select transistor coupled to a first bit line of the plurality of bit lines and two or more second drain select transistors coupled to the first bit line via the first drain select transistor, the second drain select transistors having programmable threshold voltages, and

wherein the control gate of the first drain select transistor is coupled to a first control line and the control gates of the second drain select transistors are coupled to a second control line for concurrent programming of the second drain select transistors.

11. The memory array of claim 10 , wherein the plurality of serially-connected drain select transistors is a first plurality of serially-connected drain select transistors, the plurality of memory transistors is a first plurality of memory transistors, and the one or more source select transistors is a first one or more source select transistors, the memory structure further comprising:
a second plurality of serially-connected drain select transistors each having a control gate;
a second plurality of memory transistors coupled to the second plurality of serially-connected drain select transistors; and
a second one or more source select transistors coupled to the second plurality of memory transistors;
wherein the second plurality of serially-connected drain select transistors comprises a third drain select transistor coupled to a second bit line and two or more fourth drain select transistors coupled to the bit line via the third drain select transistor, and
wherein the control gate of the third drain select transistor is coupled to the first control line and the control gates of the fourth drain select transistors are coupled to a third control line for concurrent programming of the fourth drain select transistors.

12. The memory array of claim 11 , wherein the threshold voltages of the second drain select transistors are programmable independently from a threshold voltage of the first drain select transistor.

13. The memory array of claim 12 , wherein during programming of the threshold voltages of the second drain select transistors, a conducting voltage level is applied to the first control line and a programming pulse is applied to the second control line.

14. The memory array of claim 11 , wherein the threshold voltages of the second drain select transistors are configured to have positive values.

15. The memory array of claim 14 , wherein during programming of the plurality of memory transistors, the second control line is biased at a voltage level below the threshold voltage of the second drain select transistors, thereby ensuring that the second drain select transistors are in a non-conducting state.

16. The memory array of claim 10 , wherein the one or more source select transistors comprise a first source select transistor coupled to a first source line of the plurality of source lines and a second source select transistor coupled to the first source line via the first source select transistor, and wherein a third control line of the first source select transistor is controllable separately from a fourth control line of the second source select transistor.

17. A memory structure, comprising:
a plurality of serially-connected source select transistors;

Assignees

• Sandisk Technologies Llc

Inventors

• Nguyen Hao
• Mui Man
• Nguyen Khanh
• Lee Seungpil
• Ishigaki Toru
• Dong Yingda

Classifications

• G11C16/24

  Bit-line control circuits · CPC title

• G11C16/3459

  Circuits or methods to verify correct programming of nonvolatile memory cells · CPC title

• G11C16/10

  Programming or data input circuits · CPC title

• G11C13/0069

  Writing or programming circuits or methods · CPC title

• G11C16/0483 Primary

  comprising cells having several storage transistors connected in series · CPC title