Back grinding apparatus and wear amount measuring method using the same
US-2024424637-A1 · Dec 26, 2024 · US
US9627231B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9627231-B2 |
| Application number | US-201314015650-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 30, 2013 |
| Priority date | Sep 19, 2012 |
| Publication date | Apr 18, 2017 |
| Grant date | Apr 18, 2017 |
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Methods for bonding substrates, forming assemblies using the same, along with improved methods for refurbishing said assemblies are disclosed that take advantage of at least one channel formed in an adhesive utilized to join two substrates to improve fabrication, performance and refurbishment of the assemblies. In one embodiment an assembly includes a first substrate secured to a second substrate by an adhesive layer. The assembly includes a channel having at least one side bounded by the adhesive layer and having an outlet exposed to an exterior of the assembly.
Opening claim text (preview).
What is claimed is: 1. An assembly, comprising: a first substrate; a second substrate; an adhesive layer securing the first and second substrates, wherein the adhesive layer comprises a plurality of segments, and wherein the plurality of segments comprises: at least two segments fabricated from different adhesive materials; and a channel having at least one side bounded by the adhesive layer and having an outlet exposed to an exterior of the assembly, the substrates secured by the adhesive layer forming a component for a semiconductor vacuum processing chamber. 2. An assembly, comprising: a first substrate; a second substrate; an adhesive layer securing the first and second substrates, wherein the adhesive layer comprises a plurality of segments, and wherein the plurality of segments comprises: a first segment comprised of a first adhesive material having a coefficient of thermal conductivity different than a second adhesive material comprising a second segment; and a channel having at least one side bounded by the adhesive layer and having an outlet exposed to an exterior of the assembly, the substrates secured by the adhesive layer forming a component for a semiconductor vacuum processing chamber. 3. An assembly, comprising: a first substrate; a second substrate; an adhesive layer securing the first and second substrates, wherein the adhesive layer comprises a plurality of segments, and wherein the plurality of segments comprises: a first segment comprised of a first adhesive material having a strength different than a second adhesive material comprising a second segment; and a channel having at least one side bounded by the adhesive layer and having an outlet exposed to an exterior of the assembly, the substrates secured by the adhesive layer forming a component for a semiconductor vacuum processing chamber.
the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support · CPC title
Details of chemical or physical process used for separating the auxiliary support from a device or a wafer · CPC title
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