Edge emitting semiconductor laser

Patent metadata

Field	Value
Publication number	US-9559494-B2
Application number	US-201514805808-A
Country	US
Kind code	B2
Filing date	Jul 22, 2015
Priority date	Oct 30, 2009
Publication date	Jan 31, 2017
Grant date	Jan 31, 2017

Abstract

An edge emitting semiconductor laser includes a semiconductor body including a waveguide region, the waveguide region including first and second waveguide layers and an active layer arranged between the first and second waveguide layers, that generates laser radiation; the waveguide region is arranged between a first and second cladding layers disposed downstream of the waveguide region; a phase structure for selection of lateral modes of the laser radiation emitted by the active layer, wherein the phase structure includes at least one cutout extending from a top side of the semiconductor body into the second cladding layer; at least one first intermediate layer composed of a semiconductor material different from that of the second cladding layer embedded into the second cladding layer; and the cutout at least partly extends from the top side into the first intermediate layer; the second cladding layer contains a first partial layer adjoining the waveguide region.

First claim

The invention claimed is:

1. An edge emitting semiconductor laser comprising a semiconductor body which comprises a waveguide region wherein
the waveguide region comprises 1) a first waveguide layer, 2) a second waveguide layer and 3) an active layer arranged between the first waveguide layer and the second waveguide layer, that generates laser radiation,
the waveguide region is arranged between a first cladding layer and a second cladding layer disposed downstream of the waveguide region in a growth direction of the semiconductor body,
a phase structure for selection of lateral modes of the laser radiation emitted by the active layer formed in the semiconductor body, wherein the phase structure comprises at least one cutout extending from a top side of the semiconductor body into the second cladding layer,
at least one first intermediate layer composed of a semiconductor material different from semiconductor material of the second cladding layer that is embedded into the second cladding layer,
the cutout at least partly extends from a top side of the semiconductor body into the first intermediate layer,
the second cladding layer contains a first partial layer that adjoins the waveguide region, and a second partial layer arranged above the first partial layer, wherein the first partial layer has a greater refractive index than the second partial layer, and
the at least one intermediate layer is embedded into the first partial layer of the second cladding layer.

2. The laser according to claim 1 , wherein the semiconductor material of the intermediate layer contains at least one element of main group III or V that is not contained in the second cladding layer.

3. The laser according to claim 1 , wherein the second cladding layer comprises Al x Ga 1-x As where 0≦x≦1 and the intermediate layer contains In and/or P.

4. The laser according to claim 1 , wherein the intermediate layer has a thickness of 10 nm to 100 nm.

5. The laser according to claim 1 , wherein a second intermediate layer is embedded into the second cladding layer and the cutout at least partly extends into the second intermediate layer.

6. The laser according to claim 5 , wherein the cutout extends into the first intermediate layer at at least one first point, and extends into the second intermediate layer at at least one second point, wherein the cutout has a spatially varying depth between the first point and the second point.

7. The laser according to claim 1 , wherein the phase structure is at least partly provided with a cover layer.

8. The laser according to claim 7 , wherein the cover layer contains a silicon oxide, a silicon nitride, a silicon oxynitride, an aluminum oxide, zinc selenide, germanium or benzocyclobutene.

9. The laser according to claim 1 , wherein at least one contact strip is applied to the semiconductor body.

10. The laser according to claim 9 , wherein the contact strip has a width b of 10 μm to 500 μm.

11. The laser according to claim 9 , wherein the edge emitting semiconductor laser comprises a plurality of contact strips.

12. The laser according to claim 11 , wherein the contact strips have a distance d and a width b and satisfy: 0.01≦b/d≦0.5.

13. The laser according to claim 1 , wherein the semiconductor laser emits laser radiation in an infrared spectral range having a wavelength of 780 nm to 1500 nm during operation.

14. An edge emitting semiconductor laser comprising a semiconductor body comprising a waveguide region wherein:
the waveguide region comprises 1) a first waveguide layer, 2) a second waveguide layer and 3) an active layer arranged between the first waveguide layer and the second waveguide layer that generates laser radiation,
the waveguide region is arranged between a first cladding layer and a second cladding layer disposed downstream of the waveguide region in a growth direction of the semiconductor body,
a phase structure for selection of lateral modes of the laser radiation emitted by the active layer formed in the semiconductor body, wherein the phase structure comprises at least one cutout extending from a top side of the semiconductor body into the second cladding layer,
at least one first intermediate layer composed of a semiconductor material different from semiconductor material of the second cladding layer embedded into the second cladding layer,
the cutout at least partly extends from a top side of the semiconductor body into the first intermediate layer,
the second cladding layer contains a first partial layer adjoining the waveguide region, and a second partial layer arranged above the first partial layer, wherein the first partial layer has a greater refractive index than the second partial layer, and
the at least one intermediate layer is arranged between a first part and a second part of the first partial layer of the second cladding layer.

Assignees

• Osram Opto Semiconductors Gmbh

Inventors

• Lauer Christian
• Gomez-Iglesias Alvaro

Classifications

• H01S5/04256

  characterised by the configuration · CPC title

• H01S5/1082 Primary

  with a special facet structure, e.g. structured, non planar, oblique · CPC title

• H01S5/2081

  using special etching techniques · CPC title

• H01S5/4031

  Edge-emitting structures · CPC title

• H01S5/3211

  characterised by special cladding layers, e.g. details on band-discontinuities · CPC title