Edge ring arrangement with moveable edge rings
US-2024355667-A1 · Oct 24, 2024 · US
US9362148B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9362148-B2 |
| Application number | US-201313793501-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 11, 2013 |
| Priority date | Mar 21, 2008 |
| Publication date | Jun 7, 2016 |
| Grant date | Jun 7, 2016 |
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A shielded lid heater lid heater suitable for use with a plasma processing chamber, a plasma processing chamber having a shielded lid heater and a method for plasma processing are provided. The method and apparatus enhances positional control of plasma location within a plasma processing chamber, and may be utilized in etch, deposition, implant, and thermal processing systems, among other applications where the control of plasma location is desirable. In one embodiment, a shielded lid heater is provided that includes an aluminum base and RF shield sandwiching a heater element.
Opening claim text (preview).
What is claimed is: 1. A plasma processing chamber comprising: a chamber body; a lid enclosing an interior volume of the chamber body; a substrate support disposed in the interior volume; coils positioned adjacent the lid for coupling RF power to gases within the chamber body; and a shielded lid heater coupled to the lid, wherein the lid heater further comprises: a thermally conductive base disposed in contact with the lid; a heater element; and an RF shield sandwiching the heater element with the thermally conductive base, wherein the thermally conductive base of the shielded lid heater, further comprises: a first section and a second section, wherein the first and second sections of the thermally conductive base include a plurality of fingers forming a spoke-like pattern. 2. The plasma processing chamber of claim 1 , wherein the shielded lid heater further comprises: an inductor coil coupled to the thermally conductive base. 3. The plasma processing chamber of claim 2 , wherein the inductor coil is repositionable along the thermally conductive base. 4. The plasma processing chamber of claim 2 , wherein the inductor coil is a variable inductor. 5. The plasma processing chamber of claim 1 , wherein the thermally conductive base comprises: a channel housing the heater element. 6. The plasma processing chamber of claim 1 , wherein the heater element comprises: a first heater circuit disposed on a first section of the thermally conductive base; and a second heater circuit disposed on a second section of the thermally conductive base, wherein the first and second heater circuits are coupled by a connector bridging the first and second sections of the thermally conductive base. 7. The plasma processing chamber of claim 1 , wherein the plurality of fingers forming a spoke-like pattern comprises: interleaved fingers of different length. 8. A plasma processing chamber comprising: a chamber body; a lid enclosing an interior volume of the chamber body; a substrate support disposed in the interior volume; coils positioned adjacent the lid for coupling RF power to gases within the chamber body; and a shielded lid heater coupled to the lid, wherein the lid heater further comprises: a plurality of fingers forming a spoke-like pattern; and an RF shield disposed on the fingers. 9. The plasma processing chamber of claim 8 , wherein the shielded lid heater further comprises: a first heater circuit configured to heat a first section of a thermally conductive base; and a second heater circuit configured to heat a second section of the thermally conductive base, wherein the first and second heater circuits are coupled by a connector bridging the first and second sections of the thermally conductive base. 10. The plasma processing chamber of claim 9 , wherein the shielded lid heater further comprising: a thermal insulator disposed on the RF shield. 11. The plasma processing chamber of claim 9 , wherein the plurality of fingers forming a spoke-like pattern comprises: interleaved fingers of different length. 12. The plasma processing chamber of claim 9 , wherein the first section is separate and disconnectable from the second section. 13. The plasma processing chamber of claim 9 , wherein the shielded lid heater further comprises: an inductor coil. 14. The plasma processing chamber of claim 13 , wherein the inductor coil is repositionable along the thermally conductive base supporting the fingers. 15. The plasma processing chamber of claim 13 , wherein the inductor coil is a variable inductor.
for drying etching · CPC title
Apparatus for fluid treatment (H10P72/0441, H10P72/0448 take precedence) · CPC title
for heating a fluid · CPC title
Electricity · mapped topic
Electricity · mapped topic
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