Film forming material for lithography, composition for film formation for lithography, underlayer film for lithography, and method for forming pattern

US2022010072A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2022010072-A1
Application numberUS-201917295830-A
CountryUS
Kind codeA1
Filing dateNov 21, 2019
Priority dateNov 21, 2018
Publication dateJan 13, 2022
Grant date

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

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A film forming material for lithography comprising a maleimide resin represented by the following formula (1A)

First claim

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1 . A film forming material for lithography comprising a maleimide resin represented by the following formula (1A): wherein each R is independently any one group selected from the group consisting of a hydrogen atom and an alkyl group having 1 to 4 carbon atoms; each Z is independently a trivalent or tetravalent hydrocarbon group having 1 to 100 carbon atoms and optionally containing a heteroatom; each R 1 is independently a group having 0 to 10 carbon atoms and optionally containing a heteroatom; each m1 is independently an integer of 0 to 4; and n is an integer of 1 or more. 2 . The film forming material for lithography according to claim 1 , wherein n is an integer of 2 or more. 3 . The film forming material for lithography according to claim 1 , wherein the maleimide resin of formula (1A) is represented by the following formula (2A): wherein R is as defined in formula (1A); each R 2 is independently a group having 0 to 10 carbon atoms and optionally containing a heteroatom; each m2 is independently an integer of 0 to 3; each m2′ is independently an integer of 0 to 4; and n is an integer of 1 or more, or by the following formula (3A): wherein R is as defined in formula (1A); R 3 and R 4 are each independently a group having 0 to 10 carbon atoms and optionally containing a heteroatom; each m3 is independently an integer of 0 to 4; each m4 is independently an integer of 0 to 4; and n is an integer of 2 or more. 4 . The film forming material for lithography according to claim 1 , wherein the heteroatom is selected from the group consisting of oxygen, fluorine, and silicon. 5 . The film forming material for lithography according to claim 1 , further comprising a crosslinking agent. 6 . The film forming material for lithography according to claim 5 , wherein the crosslinking agent is at least one selected from the group consisting of a phenol compound, an epoxy compound, a cyanate compound, an amino compound, a benzoxazine compound, a melamine compound, a guanamine compound, a glycoluril compound, a urea compound, an isocyanate compound, and an azide compound. 7 . The film forming material for lithography according to claim 5 , wherein the crosslinking agent has at least one allyl group. 8 . The film forming material for lithography according to claim 1 , further comprising a crosslinking promoting agent. 9 . The film forming material for lithography according to claim 8 , wherein the crosslinking promoting agent is at least one selected from the group consisting of an amine, an imidazole, an organic phosphine, and a Lewis acid. 10 . The film forming material for lithography according to claim 8 , wherein a content ratio of the crosslinking promoting agent is 0.1 to 5 parts by mass based on 100 parts by mass of a total mass of the maleimide resin. 11 . The film forming material for lithography according to claim 1 , further comprising a radical polymerization initiator. 12 . The film forming material for lithography according to claim 11 , wherein the radical polymerization initiator is at least one selected from the group consisting of a ketone-based photopolymerization initiator, an organic peroxide-based polymerization initiator, and an azo-based polymerization initiator. 13 . The film forming material for lithography according to claim 11 , wherein a content ratio of the radical polymerization initiator is 0.05 to 25 parts by mass based on 100 parts by mass of a total mass of the maleimide resin. 14 . A composition for film formation for lithography comprising the film forming material for lithography according to claim 1 and a solvent. 15 . The composition for film formation for lithography according to claim 14 , further comprising a base generating agent. 16 . The composition for film formation for lithography according to claim 14 , wherein the film for lithography is an underlayer film for lithography. 17 . An underlayer film for lithography formed by using the composition for film formation for lithography according to claim 16 . 18 . A method for forming a resist pattern, comprising the steps of: forming an underlayer film on a substrate by using the composition for film formation for lithography according to claim 16 ; forming at least one photoresist layer on the underlayer film; and irradiating a predetermined region of the photoresist layer with radiation for development. 19 . A method for forming a circuit pattern, comprising the steps of: forming an underlayer film on a substrate by using the composition for film formation for lithography according to claim 16 ; forming an intermediate layer film on the underlayer film by using a resist intermediate layer film material containing a silicon atom; forming at least one photoresist layer on the intermediate layer film; irradiating a predetermined region of the photoresist layer with radiation for development, thereby forming a resist pattern; etching the intermediate layer film with the resist pattern as a mask; etching the underlayer film with the obtained intermediate layer film pattern as an etching mask; and etching the substrate with the obtained underlayer film pattern as an etching mask, thereby forming a pattern on the substrate.

Assignees

Inventors

Classifications

  • containing chain terminating or branching agents · CPC title

  • Unsaturated polyimide precursors · CPC title

  • the unsaturated precursors being wholly aromatic · CPC title

  • used for films · CPC title

  • C08G73/12Primary

    Unsaturated polyimide precursors · CPC title

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What does patent US2022010072A1 cover?
A film forming material for lithography comprising a maleimide resin represented by the following formula (1A)
Who is the assignee on this patent?
Mitsubishi Gas Chemical Co
What technology area does this patent fall under?
Primary CPC classification C08G73/12. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Thu Jan 13 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).