Photoalignment polyimide copolymer and liquid crystal alignment layer
US-9791745-B2 · Oct 17, 2017 · US
US2022010072A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2022010072-A1 |
| Application number | US-201917295830-A |
| Country | US |
| Kind code | A1 |
| Filing date | Nov 21, 2019 |
| Priority date | Nov 21, 2018 |
| Publication date | Jan 13, 2022 |
| Grant date | — |
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A film forming material for lithography comprising a maleimide resin represented by the following formula (1A)
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1 . A film forming material for lithography comprising a maleimide resin represented by the following formula (1A): wherein each R is independently any one group selected from the group consisting of a hydrogen atom and an alkyl group having 1 to 4 carbon atoms; each Z is independently a trivalent or tetravalent hydrocarbon group having 1 to 100 carbon atoms and optionally containing a heteroatom; each R 1 is independently a group having 0 to 10 carbon atoms and optionally containing a heteroatom; each m1 is independently an integer of 0 to 4; and n is an integer of 1 or more. 2 . The film forming material for lithography according to claim 1 , wherein n is an integer of 2 or more. 3 . The film forming material for lithography according to claim 1 , wherein the maleimide resin of formula (1A) is represented by the following formula (2A): wherein R is as defined in formula (1A); each R 2 is independently a group having 0 to 10 carbon atoms and optionally containing a heteroatom; each m2 is independently an integer of 0 to 3; each m2′ is independently an integer of 0 to 4; and n is an integer of 1 or more, or by the following formula (3A): wherein R is as defined in formula (1A); R 3 and R 4 are each independently a group having 0 to 10 carbon atoms and optionally containing a heteroatom; each m3 is independently an integer of 0 to 4; each m4 is independently an integer of 0 to 4; and n is an integer of 2 or more. 4 . The film forming material for lithography according to claim 1 , wherein the heteroatom is selected from the group consisting of oxygen, fluorine, and silicon. 5 . The film forming material for lithography according to claim 1 , further comprising a crosslinking agent. 6 . The film forming material for lithography according to claim 5 , wherein the crosslinking agent is at least one selected from the group consisting of a phenol compound, an epoxy compound, a cyanate compound, an amino compound, a benzoxazine compound, a melamine compound, a guanamine compound, a glycoluril compound, a urea compound, an isocyanate compound, and an azide compound. 7 . The film forming material for lithography according to claim 5 , wherein the crosslinking agent has at least one allyl group. 8 . The film forming material for lithography according to claim 1 , further comprising a crosslinking promoting agent. 9 . The film forming material for lithography according to claim 8 , wherein the crosslinking promoting agent is at least one selected from the group consisting of an amine, an imidazole, an organic phosphine, and a Lewis acid. 10 . The film forming material for lithography according to claim 8 , wherein a content ratio of the crosslinking promoting agent is 0.1 to 5 parts by mass based on 100 parts by mass of a total mass of the maleimide resin. 11 . The film forming material for lithography according to claim 1 , further comprising a radical polymerization initiator. 12 . The film forming material for lithography according to claim 11 , wherein the radical polymerization initiator is at least one selected from the group consisting of a ketone-based photopolymerization initiator, an organic peroxide-based polymerization initiator, and an azo-based polymerization initiator. 13 . The film forming material for lithography according to claim 11 , wherein a content ratio of the radical polymerization initiator is 0.05 to 25 parts by mass based on 100 parts by mass of a total mass of the maleimide resin. 14 . A composition for film formation for lithography comprising the film forming material for lithography according to claim 1 and a solvent. 15 . The composition for film formation for lithography according to claim 14 , further comprising a base generating agent. 16 . The composition for film formation for lithography according to claim 14 , wherein the film for lithography is an underlayer film for lithography. 17 . An underlayer film for lithography formed by using the composition for film formation for lithography according to claim 16 . 18 . A method for forming a resist pattern, comprising the steps of: forming an underlayer film on a substrate by using the composition for film formation for lithography according to claim 16 ; forming at least one photoresist layer on the underlayer film; and irradiating a predetermined region of the photoresist layer with radiation for development. 19 . A method for forming a circuit pattern, comprising the steps of: forming an underlayer film on a substrate by using the composition for film formation for lithography according to claim 16 ; forming an intermediate layer film on the underlayer film by using a resist intermediate layer film material containing a silicon atom; forming at least one photoresist layer on the intermediate layer film; irradiating a predetermined region of the photoresist layer with radiation for development, thereby forming a resist pattern; etching the intermediate layer film with the resist pattern as a mask; etching the underlayer film with the obtained intermediate layer film pattern as an etching mask; and etching the substrate with the obtained underlayer film pattern as an etching mask, thereby forming a pattern on the substrate.
containing chain terminating or branching agents · CPC title
Unsaturated polyimide precursors · CPC title
the unsaturated precursors being wholly aromatic · CPC title
used for films · CPC title
Unsaturated polyimide precursors · CPC title
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