Dissipating an electrostatic charge from an optical element

Patent metadata

Field	Value
Publication number	US-2017088414-A1
Application number	US-201514865330-A
Country	US
Kind code	A1
Filing date	Sep 25, 2015
Priority date	Sep 25, 2015
Publication date	Mar 30, 2017
Grant date	—

Abstract

A method and apparatus for dissipating an electrostatic charge from an optical element are described. An apparatus includes the optical element, a microelectromechanical system (MEMS) device located proximate to the optical element, and a conductive coating over the optical element, wherein the conductive coating is substantially transparent, and wherein the conductive coating dissipates the electrostatic charge.

First claim

What is claimed is:

1 . An apparatus for dissipating an electrostatic charge from an optical element, comprising:
the optical element; a microelectromechanical system (MEMS) device located proximate to the optical element; and a conductive coating over the optical element, wherein the conductive coating is substantially transparent, and wherein the conductive coating dissipates the electrostatic charge.

2 . The apparatus of claim 1 , comprising an electrical coupling from the conductive coating to a ground connection.

3 . The apparatus of claim 1 , comprising a dichroic layer proximate to the conductive coating.

4 . The apparatus of claim 1 , wherein the conductive coating comprises a layer of indium-tin-oxide (ITO).

5 . The apparatus of claim 1 , wherein the conductive coating comprises a metal coating.

6 . The apparatus of claim 1 , wherein the conductive coating comprises a silver coating.

7 . A method for protecting a microelectromechanical system (MEMS) device from effects caused by an electrostatic charge on an optical element, comprising:
applying a conductive coating to the optical element; and installing the optical element in a case proximate to the MEMS device.

8 . The method of claim 7 , comprising applying the conductive coating to a side of the optical element to be installed facing towards the MEMS device.

9 . The method of claim 7 , comprising applying the conductive coating to a side of the optical element to be installed facing away from the MEMS device.

10 . The method of claim 7 , comprising applying the conductive coating to both sides of the optical element.

11 . The method of claim 7 , comprising coupling the conductive coating to a ground connection.

12 . The method of claim 7 , comprising applying an optical coating to the optical element, wherein the optical coating is selected to decrease reflections from a surface of the optical element.

13 . The method of claim 7 , comprising sputtering a metal coating on the optical element as the conductive coating.

14 . A computing device comprising an optoelectronic device, wherein the optoelectronic device comprises:
an optical element configured to allow light to pass from inside a case to outside the case; a microelectromechanical system (MEMS) device to control a mirror located proximate to the optical element; and a conductive coating over the optical element, wherein the conductive coating is substantially transparent, and wherein the conductive coating dissipates an electrostatic charge.

15 . The computing device of claim 14 , comprising a collimated light source directed at the mirror.

16 . The computing device of claim 14 , comprising a laser directed at the mirror.

17 . The computing device of claim 14 , comprising the conductive coating on a side of the optical element opposite the MEMS device.

18 . The computing device of claim 14 , comprising the conductive coating on a side of the optical element facing the MEMS device and on the side of the optical element opposite the MEMS device.

19 . The computing device of claim 14 , comprising an electrical coupling from the conductive coating to a ground connection.

20 . The computing device of claim 14 , comprising a dichroic layer proximate to the conductive coating.

21 . The computing device of claim 14 , comprising a dichroic layer on an opposite side of the optical element from the conductive coating.

22 . The computing device of claim 14 , wherein the conductive coating comprises a layer of indium-tin-oxide (ITO).

23 . The computing device of claim 14 , comprising a three-dimensional scanner comprising the MEMS device.

24 . The computing device of claim 14 , comprising an imaging device.

25 . The computing device of claim 24 , wherein the imaging device comprises a still shot camera, a three dimensional (3D) camera, or a video recording device, or any combinations thereof.

Assignees

• Intel Corp

Inventors

• Hirshberg Arnon
• Freedman Barak

Classifications

• H04N5/2254

  Electricity · mapped topic

• B81B7/0022 Primary

  Protection against electrostatic discharge (circuit arrangements for protecting electronic switching circuits used for pulse technique against overcurrent or overvoltage H03K17/08; electrostatic discharge protection for electronic semiconductor circuits H10D89/60) · CPC title

• H05F3/02

  by means of earthing connections · CPC title

• G02B1/11

  Anti-reflection coatings · CPC title

• H04N13/0203

  Electricity · mapped topic