Substrate Etch

US2016208394A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016208394-A1
Application numberUS-201314913771-A
CountryUS
Kind codeA1
Filing dateAug 30, 2013
Priority dateAug 30, 2013
Publication dateJul 21, 2016
Grant date

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An example provides a method including providing a substrate including an area having a plurality of pores and etching the area of the substrate to remove the plurality of pores to form a recess in the substrate. In some examples, the recess may form, at least in part, a device.

First claim

Opening claim text (preview).

What is claimed is: 1 . A method comprising: arranging a mask with a plurality of openings on a surface of a substrate: depositing metal on the surface of the substrate through the plurality of openings to form a metal layer; etching the substrate using a solution that reacts with the metal layer to form a plurality of pores in the substrate; and etching the substrate to remove the plurality of pores to form a recess in the substrate. 2 . The method of claim 1 , wherein the metal layer is a discontinuous metal layer. 3 . The method of claim 1 , wherein the mask is a silicon carbide hard mask. 4 . The method of claim 1 , further comprising removing the mask after said depositing the metal. 5 . The method of claim 5 , wherein said removing is performed prior to said etching the substrate using the solution. 6 . The method of claim 1 , wherein the metal layer comprises a metal selected from a group consisting of gold, silver, platinum, ruthenium, platinum, palladium, molybdenum, chromium, copper, tantalum, titanium, tungsten, and alloys thereof. 7 . The method of claim 1 , wherein the solution comprises hydrogen peroxide, hydrofluoric acid, and water. 8 . The method of claim 1 , wherein the recess comprises a trench, a blind hole, or a through-hole. 9 . The method of claim 1 , wherein the recess has a width greater than about 20 μm. 10 . The method of claim 1 , wherein the substrate comprises silicon. 11 . A method comprising: forming a metal layer on a surface of a substrate by depositing metal on a substrate through a plurality of openings of a mask: etching the substrate using a solution that reacts with the metal layer to form a plurality of pores in the surface in the substrate; and etching the substrate to remove the plurality of pores to form a micro-electrical-mechanical-systems (MEMS) device. 12 . The method of claim 11 , further comprising forming a printhead with the MEMS device. 13 . The method of claim 11 , wherein the surface is a first surface, and wherein the method further comprises: forming another metal layer on an area of a second surface, opposite the first surface, of the substrate by depositing metal on the substrate through a plurality of openings of another mask; etching the substrate using the solution to form another plurality of pores in the second surface in the substrate; and etching the substrate to remove the other plurality of pores to further form the MEMS device. 14 . A method comprising: providing a substrate including an area having a plurality of pores; and etching the area of the substrate to remove the plurality of pores to form, at least in part, a printhead. 15 . The method of claim 14 , wherein said etching comprises bulk etching the substrate using tetra-methyl ammonium hydroxide or potassium hydroxide.

Assignees

Inventors

Classifications

  • C23F1/16Primary

    Acidic compositions (C23F1/42 takes precedence) · CPC title

  • photolithography · CPC title

  • Arrangement of basic structures like cavities or channels, e.g. suitable for microfluidic systems · CPC title

  • B41J2/1609Primary

    of finger type, chamber walls consisting integrally of piezoelectric material · CPC title

  • wet etching · CPC title

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Frequently asked questions

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What does patent US2016208394A1 cover?
An example provides a method including providing a substrate including an area having a plurality of pores and etching the area of the substrate to remove the plurality of pores to form a recess in the substrate. In some examples, the recess may form, at least in part, a device.
Who is the assignee on this patent?
Hewlett Packard Development Co
What technology area does this patent fall under?
Primary CPC classification C23F1/16. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Thu Jul 21 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).