Metal nitride material for thermistor, method for producing same, and film-type thermistor sensor

US2016189831A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016189831-A1
Application numberUS-201414906913-A
CountryUS
Kind codeA1
Filing dateJul 24, 2014
Priority dateJul 25, 2013
Publication dateJun 30, 2016
Grant date

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A metal nitride material for a thermistor consists of a metal nitride represented by the general formula: M x Al y N z (where “M” represents at least one of Fe, Co, Mn, Cu, and Ni, 0.70≦y/(x+y)≦0.98, 0.4≦z≦0.5, and x+y+z=1), wherein the crystal structure thereof is a hexagonal wurtzite-type single phase. A method for producing the metal nitride material for a thermistor includes a deposition step of performing film deposition by reactive sputtering in a nitrogen-containing atmosphere using an M-Al alloy sputtering target (where “M” represents at least one of Fe, Co, Mn, Cu, and Ni).

First claim

Opening claim text (preview).

1 . A metal nitride material for a thermistor, consisting of a metal nitride represented by the general formula: M x Al y N z (where “M” represents at least one of Fe, Co, Mn, Cu, and Ni, 0.70≦y/(x+y)≦0.98, 0.4≦z≦0.5, and x+y+z=1), wherein the crystal structure thereof is a hexagonal wurtzite-type single phase. 2 . The metal nitride material for a thermistor according to claim 1 , wherein the metal nitride material is deposited as a film and is a columnar crystal extending in a vertical direction with respect to the surface of the film. 3 . A film-type thermistor sensor comprising: an insulating film; a thin film thermistor portion made of the metal nitride material for a thermistor according to claim 1 formed on the insulating film; and a pair of pattern electrodes formed at least on the top or the bottom of the thin film thermistor portion. 4 . A method for producing the metal nitride material for a thermistor according to claim 1 , the method comprising a deposition step of performing film deposition by reactive sputtering in a nitrogen-containing atmosphere using an M-Al alloy sputtering target (where “M” represents at least one of Fe, Co, Mn, Cu, and Ni). 5 . The method for producing the metal nitride material for a thermistor according to claim 4 , the method comprising a step of irradiating the deposited film with nitrogen plasma after the deposition step. 6 . A film-type thermistor sensor comprising: an insulating film; a thin film thermistor portion made of the metal nitride material for a thermistor according to claim 2 formed on the insulating film; and a pair of pattern electrodes formed at least on the top or the bottom of the thin film thermistor portion. 7 . A method for producing the metal nitride material for a thermistor according to claim 2 , the method comprising a deposition step of performing film deposition by reactive sputtering in a nitrogen-containing atmosphere using an M-Al alloy sputtering target (where “M” represents at least one of Fe, Co, Mn, Cu, and Ni).

Assignees

Inventors

Classifications

  • H01C7/008Primary

    Thermistors (H01C7/02 - H01C7/06 take precedence) · CPC title

  • characterised by the shape of the resistive element · CPC title

  • Nitrides (C23C14/0617 takes precedence) · CPC title

  • Reactive sputtering · CPC title

  • Treatment with charged particles (C23C14/582 takes precedence) · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US2016189831A1 cover?
A metal nitride material for a thermistor consists of a metal nitride represented by the general formula: M x Al y N z (where “M” represents at least one of Fe, Co, Mn, Cu, and Ni, 0.70≦y/(x+y)≦0.98, 0.4≦z≦0.5, and x+y+z=1), wherein the crystal structure thereof is a hexagonal wurtzite-type single phase. A method for producing the metal nitride material for a thermistor includes a deposition s…
Who is the assignee on this patent?
Mitsubishi Materials Corp
What technology area does this patent fall under?
Primary CPC classification H01C7/008. Mapped technology areas include Electricity.
When was this patent published?
Publication date Thu Jun 30 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).