Apparatus for treating a substrate

US12460863B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12460863-B2
Application numberUS-202217825420-A
CountryUS
Kind codeB2
Filing dateMay 26, 2022
Priority dateMay 26, 2022
Publication dateNov 4, 2025
Grant dateNov 4, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The inventive concept provides a substrate treating apparatus. The substrate treating apparatus includes a chamber having a treating space therein; a substrate support unit configured to support a substrate in the treating space; and a fluid supply unit configured to supply a fluid in a supercritical state to the treating space, wherein the fluid supply unit comprises: a supply line provided at a top wall of the chamber; and a discharge unit installed at the top wall of the chamber and configured to discharge a fluid to a substrate, and wherein the discharge unit comprises: a body having a discharge fluid channel for the fluid; a nozzle plate provided at a discharge end of the body; and a blocking plate within the discharge fluid channel and spaced apart from the nozzle plate.

First claim

Opening claim text (preview).

What is claimed is: 1 . A substrate treating apparatus comprising: a chamber having a treating space therein; a substrate support unit configured to support a substrate in the treating space; and a fluid supply unit configured to supply a fluid in a supercritical state to the treating space, wherein the fluid supply unit comprises: a supply line provided at a top wall of the chamber; and a discharge unit installed at the top wall of the chamber and configured to discharge a fluid to a substrate, and wherein the discharge unit comprises: a body having a discharge fluid channel for the fluid; a nozzle plate provided at a discharge end of the body; and a blocking plate within the discharge fluid channel and spaced apart from the nozzle plate. 2 . The substrate treating apparatus of claim 1 , wherein the nozzle plate has a plurality of first holes in a first region thereof, and a plurality of second holes in a second region thereof, the first region including peripheral region of the nozzle plate and the second region including a central region of the nozzle plate, wherein a cross-section area of the first hole is larger than a cross-sectional area of the second hole. 3 . The substrate treating apparatus of claim 2 , wherein the blocking plate is disposed such that the plurality of the second holes are located under the blocking plate. 4 . The substrate treating apparatus of claim 2 , wherein a diameter of the blocking plate is substantially equal to a diameter of the second region of the nozzle plate. 5 . The substrate treating apparatus of claim 4 , wherein the blocking plate is substantially aligned with the second region of the nozzle plate. 6 . The substrate treating apparatus of claim 2 , wherein a number of the plurality of the first holes is smaller than a number of the plurality of the second holes. 7 . The substrate treating apparatus of claim 1 , wherein the discharge fluid channel is formed through the body from a top surface to a bottom surface thereof, and a diameter of the discharge fluid channel is constant. 8 . The substrate treating apparatus of claim 1 , wherein the discharge fluid channel is formed through the body from a top surface to a bottom surface thereof, and a diameter of the discharge fluid channel gradually increases from the top surface of the body to the bottom surface of the body. 9 . The substrate treating apparatus of claim 1 , wherein the fluid includes a supercritical fluid. 10 . A substrate treating apparatus comprising: a chamber having a treating space therein; a substrate support unit configured to support a substrate in the treating space; and a fluid supply unit configured to supply a fluid in a supercritical state to the treating space, wherein the fluid supply unit comprises: a supply line provided at a top wall of the chamber; and a discharge unit installed at the top wall of the chamber and configured to discharge a fluid to a substrate, and wherein the discharge unit comprises: a body having a discharge fluid channel for the fluid; and a nozzle plate provided at a discharge end of the body; and wherein the nozzle plate comprises: a first region having a plurality of first holes, the first region including a peripheral region of the nozzle plate; and a second region having a plurality of second holes, the second region including a central region of the nozzle plate, and wherein a diameter of each of the plurality of first holes is larger than a diameter of each of the plurality of second holes. 11 . A substrate treating apparatus of claim 10 , wherein the discharge unit comprises a blocking plate within the discharge fluid channel and spaced apart from the nozzle plate. 12 . The substrate treating apparatus of claim 11 , wherein the blocking plate has a size substantially corresponding to a size of the second region of the nozzle plate. 13 . The substrate treating apparatus of claim 11 , wherein the blocking plate is substantially aligned with the second region of the nozzle plate. 14 . The substrate treating apparatus of claim 10 , wherein the number of the plurality of first holes is smaller than the number of the plurality of second holes. 15 . The substrate treating apparatus of claim 10 , wherein the plurality of first holes are spaced apart from each other along a circumferential direction of the nozzle plate such that the plurality of first holes surround the plurality of second holes. 16 . The substrate treating apparatus of claim 10 , wherein the discharge fluid channel is formed through the body from a top and surface to a bottom surface, and a diameter of the discharge fluid channel is constant from the top surface to the bottom surface. 17 . The substrate treating apparatus of claim 10 , the discharge fluid channel is formed through the body from a top surface to a bottom surface, and a inner diameter of the discharge fluid channel gradually increases from the top surface to the bottom surface. 18 . The substrate treating apparatus of claim 17 , wherein the nozzle plate has a size corresponding to a size of a discharge port of the discharge fluid channel formed at the bottom surface of the body. 19 . The substrate treating apparatus of claim 10 , wherein the fluid includes a supercritical fluid. 20 . A substrate treating apparatus comprising: a chamber having a treating space therein; a substrate support unit configured to support a substrate in the treating space; and a fluid supply unit configured to supply a fluid in a supercritical state to the treating space, wherein the fluid supply unit comprises: a supply line provided at a top wall of the chamber; and a discharge unit installed at the top wall of the chamber and configured to discharge a fluid to the substrate, and wherein the discharge unit comprises: a discharge fluid channel for the fluid; a nozzle plate provided at an end of the discharge fluid channel; and a blocking plate within the discharge fluid channel and spaced apart from the nozzle plate, and wherein the nozzle plate comprises: a first region having a plurality of first holes with a first diameter formed therein, the first region including a peripheral region of the nozzle plate; and a second region having a plurality of second holes with a second diameter smaller than the first diameter, the second region including a central region of the nozzle plate, and wherein the blocking plate has a size corresponding to a size of the second region of the nozzle plate, and the blocking plate is substantially aligned with the second region of the nozzle plate.

Assignees

Inventors

Classifications

  • characterised by a plurality of separate clamping members, e.g. clamping fingers · CPC title

  • characterised by edge clamping, e.g. clamping ring · CPC title

  • characterised by the construction of the processing chambers, e.g. modular processing chambers · CPC title

  • using mainly spraying means, e.g. nozzles · CPC title

  • F26B5/005Primary

    by dipping them into or mixing them with a chemical liquid, e.g. organic; chemical, e.g. organic, dewatering aids (F26B3/005 takes precedence; using chemical vapours or gases F26B21/40) · CPC title

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What does patent US12460863B2 cover?
The inventive concept provides a substrate treating apparatus. The substrate treating apparatus includes a chamber having a treating space therein; a substrate support unit configured to support a substrate in the treating space; and a fluid supply unit configured to supply a fluid in a supercritical state to the treating space, wherein the fluid supply unit comprises: a supply line provided at…
Who is the assignee on this patent?
Semes Co Ltd
What technology area does this patent fall under?
Primary CPC classification F26B5/005. Mapped technology areas include Mechanical Engineering.
When was this patent published?
Publication date Tue Nov 04 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 7 related publications on this page (citations in our corpus or others sharing the same primary CPC).