Capacitance measurement circuit

US12352794B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12352794-B2
Application numberUS-202318299088-A
CountryUS
Kind codeB2
Filing dateApr 12, 2023
Priority dateAug 12, 2020
Publication dateJul 8, 2025
Grant dateJul 8, 2025

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  1. Title

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A capacitance measurement circuit includes an analog front-end (AFE) circuit with current mirror circuits, a parasitic capacitor, an AD converter, an output shift register, and a controller. The controller disconnects a capacitor to be measured and connects one current mirror circuit to record an AFE output voltage V N collected at an inverting input terminal of the AD converter, then connects the capacitor to be measured to collect an AFE output voltage V P at a non-inverting input terminal of the AD converter, and converts a value of (V P −V N ) into a first digital signal; determines, based on the value of the first digital signal, a connection number m of the current mirror circuits, controls the analog front-end circuit to connect m current mirror circuits, and repeat the steps to obtain a second digital signal; and shift the second digital signal based on the connection number m to obtain a capacitance measurement value.

First claim

Opening claim text (preview).

What is claimed is: 1. A capacitance measurement circuit, comprising: an analog front-end circuit, a parasitic capacitor, an analog to digital converter (ADC), an output shift register, and a controller; wherein input terminals of the ADC are connected to an output terminal of the analog front-end circuit, and an output terminal of the ADC is connected to the output shift register; wherein an input terminal of the analog front-end circuit is connected to the parasitic capacitor and a capacitor to be measured individually; the analog front-end circuit comprises M numbers of current mirror circuits connected in parallel, where M=2 N−1 and N is a positive integer; wherein the controller is configured to control the analog front-end circuit, the parasitic capacitor, the ADC, and the output shift register to measure the capacitor to be measured, specifically to: step 1, control one of the current mirror circuits of the analog front-end circuit to be turned on; step 2, disconnect the capacitor to be measured, and control an inverting input terminal of the ADC to continuously collect analog front end (AFE) output voltages of the analog front-end circuit before connection of the capacitor to be measured; step 3, control the analog front-end circuit to charge the parasitic capacitor to a first reference voltage, and record an AFE output voltage V N currently collected at the inverting input terminal of the ADC; step 4, connect the capacitor to be measured, after the analog front-end circuit is stabilized, control a non-inverting input terminal of the ADC to collect an AFE output voltage V P of the analog front-end circuit, and control the ADC to convert a difference value (V P −V N ) of the AFE output voltage V P and the AFE output voltage V N into a first digital signal; step 5, determine, based on a value of the first digital signal, a connection number m of the current mirror circuits, and control the m numbers of current mirror circuits of the analog front-end circuit to be turned on; where m=2 n−1 and n is a positive integer less than or equal to N; and step 6, repeat the step 2 to step 4 to obtain a second digital signal, and control, based on the connection number m, the output shift register to shift the second digital signal to obtain a capacitance measurement value of the capacitor to be measured. 2. The capacitance measurement circuit according to claim 1 , wherein after the step 5, the first digital signal is taken as the capacitance measurement value of the capacitor to be measured when a value of the connection number m is 1. 3. The capacitance measurement circuit according to claim 1 , wherein in the step 5, the determine, based on a value of the first digital signal, a connection number m of the current mirror circuits, specifically comprises: the connection number m is 1 when the value of the first digital signal is greater than D max /2; where D max is a maximum output value of the ADC; the connection number m is 2 when the value of the first digital signal is less than D max /2 and greater than D max /8; the connection number m is 2 i−1 when the value of the first digital signal is less than D max /2 i and greater than D max /2 i+1 ; where i is a positive integer greater than or equal to 3. 4. The capacitance measurement circuit according to claim 3 , wherein in the step S 6 , the control, based on the connection number m, the output shift register to shift the second digital signal to obtain a capacitance measurement value of the capacitor to be measured, specifically comprises: control, in response to the value of the connection number m being 1, the output shift register to not shift the second digital signal to obtain the capacitance measurement value of the capacitor to be measured; control, in response to the value of the connection number m being 2, the output shift register to shift the second digital signal by one bit to right to obtain the capacitance measurement value of the capacitor to be measured; control, in response to the value of the connection number m being 2 i−1 , the output shift register to shift the second digital signal to the right by i−1 bits to obtain the capacitance measurement value of the capacitor to be measured. 5. The capacitance measurement circuit according to claim 1 , wherein the analog front-end circuit comprises an operational amplifier, a first capacitor, a second capacitor, a voltage follower, and the M numbers of current mirror circuits connected in parallel; wherein each of the current mirror circuits comprises two current mirror sub-circuits with a width to length ratio of 1:1 and a reverser arranged between the two current mirror sub-circuits; wherein a non-inverting input terminal of the operational amplifier is connected to the input terminal of the analog front-end circuit, an inverting input terminal of the operational amplifier is connected to a first end of the first capacitor, and an output terminal of the operational amplifier is connected to the M numbers of current mirror circuits connected in parallel; wherein an input terminal of the voltage follower is individually connected to a first end of the second capacitor and the M numbers of current mirror circuits connected in parallel, and an output terminal of the voltage follower is connected to the output terminal of the analog front-end circuit; and wherein a second end of the first capacitor and a second end of the second capacitor each are connected to a signal ground. 6. The capacitance measurement circuit according to claim 5 , wherein the input terminal of the analog front-end circuit is connected to the capacitor to be measured, specifically: the input terminal of the analog front-end circuit is connected to the capacitor to be measured through a control switch S 3 ; the controller is further configured to control the control switch S 3 to switch on to thereby control the connection of the capacitor to be measured, or control the control switch S 3 to switch off to thereby control the disconnection of the capacitor to be measured. 7. The capacitance measurement circuit according to claim 5 , wherein the input terminals of the ADC are connected to the output terminal of the analog front-end circuit, specifically: the inverting input terminal of the ADC is connected to the output terminal of the analog front-end circuit through a control switch S 4 , and the non-inverting input terminal of the ADC is connected to the output terminal of the analog front-end circuit; the controller is further configured to control the control switch S 4 to switch on to thereby control connection of the inverting input terminal of the ADC, or control the control switch S 4 to switch off to thereby control disconnection of the inverting input terminal of the ADC.

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Classifications

  • Measuring capacitance (capacitive sensors G01D5/24) · CPC title

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What does patent US12352794B2 cover?
A capacitance measurement circuit includes an analog front-end (AFE) circuit with current mirror circuits, a parasitic capacitor, an AD converter, an output shift register, and a controller. The controller disconnects a capacitor to be measured and connects one current mirror circuit to record an AFE output voltage V N collected at an inverting input terminal of the AD converter, then connects…
Who is the assignee on this patent?
Univ Guangzhou
What technology area does this patent fall under?
Primary CPC classification G01R27/2605. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 08 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).