Spur detection in a sampled waveform in a mixed analog/digital system using the magnitude of the frequency response

Patent metadata

Field	Value
Publication number	US-12188964-B2
Application number	US-201916593025-A
Country	US
Kind code	B2
Filing date	Oct 4, 2019
Priority date	Oct 4, 2019
Publication date	Jan 7, 2025
Grant date	Jan 7, 2025

Abstract

Method, apparatus and computer program product for spur detection in a sampled waveform in a mixed analog/digital system using the magnitude of the frequency response comprising acquiring a sample waveform including a set of discrete uniformly spaced samples from a target system, wherein the sample waveform is a time domain vector; applying FFT transforming the time domain vector into the frequency domain; analyzing the frequency domain response including calculating the magnitude response; and determining whether the sample waveform has spurs including comparing the magnitude response to an average noise floor threshold including determining that the magnitude response having an average noise floor value above the average noise floor threshold has one or more spurs and determining that the magnitude response having an average noise floor value below the average noise floor threshold has no spurs, wherein a spur indicates unaligned data having a delayed bit flip.

First claim

What is claimed is:

1. A method comprising:
converting, by a target system, an analog signal to a digital signal, wherein the target system includes a digital to analog converter (DAC) and analog to digital converter (ADC) pair;
by program instructions on a computing device,
acquiring, from the digital signal, a sample waveform including a set of discrete uniformly spaced samples from the target system, wherein the sample waveform is a time domain vector;
applying FFT transforming the time domain vector into a frequency domain;
analyzing the frequency domain response including calculating a magnitude response; and
determining, based on comparing a noise value of the magnitude response to an average noise floor threshold, whether the sample waveform has spurs, including determining that the sample waveform has no spurs when the noise value of the magnitude response is below the average noise floor threshold and determining that the sample waveform has one or more spurs when the noise value of the magnitude response is above the average noise floor threshold, wherein a spur indicates unaligned data having a delayed bit flip.

2. The method of claim 1 , wherein the DAC and ADC pair in the target system are in a loopback connection.

3. The method of claim 2 , wherein the sample waveform is acquired from an output of the DAC.

4. The method of claim 2 , wherein the sample waveform is acquired from an output of the ADC.

5. An apparatus comprising:
a target system configured to carry out converting an analog signal to a digital signal, wherein the target system includes a digital to analog converter (DAC) and analog to digital converter (ADC) pair;
a computer processor; and
a computer memory operatively coupled to the computer processor, the computer memory comprising computer program instructions that, when executed by the computer processor, cause the apparatus to carry out the steps of:
acquiring a sample waveform from the target system, including sampling the digital signal in a set of discrete, periodic, uniformly spaced samples as a time domain vector;
applying FFT transforming the time domain vector into a frequency domain;
analyzing the frequency domain response including calculating a magnitude response; and
determining, based on comparing a noise value of the magnitude response to an average noise floor threshold, whether the sample waveform has spurs, including determining that the sample waveform has no spurs when the noise value of the magnitude response is below the average noise floor threshold and determining that the sample waveform has one or more spurs when the noise value of the magnitude response is above the average noise floor threshold, wherein a spur indicates unaligned data having a delayed bit flip.

6. The apparatus of claim 5 , wherein the DAC and ADC pair in the target system are in a loopback connection.

7. The apparatus of claim 6 , wherein the sample waveform is acquired from an output of the DAC.

8. The apparatus of claim 6 , wherein the sample waveform is acquired from an output of the ADC.

9. A computer program product including a non-transitory computer readable medium, the computer program product comprising computer program instructions that, when executed, cause a target system to carry out converting an analog signal to a digital signal, wherein the target system includes a digital to analog converter (DAC) and analog to digital converter (ADC) pair;
wherein the computer program instructions, when executed, further cause a computer to carry out:
acquiring a sample waveform of the digital signal including a set of discrete uniformly spaced samples from the target system, wherein the sample waveform is a time domain vector;
applying FFT transforming the time domain vector into a frequency domain;
analyzing the frequency domain response including calculating a magnitude response; and
determining, based on comparing a noise value of the magnitude response to an average noise floor threshold, whether the sample waveform has spurs, including determining that the sample waveform has no spurs when the noise value of the magnitude response is below the average noise floor threshold and determining that the sample waveform has one or more spurs when the noise value of the magnitude response is above the average noise floor threshold, wherein a spur indicates unaligned data having a delayed bit flip.

10. The computer program product of claim 9 , wherein the DAC and ADC pair in the target system are in a loopback connection.

11. The computer program product of claim 10 , wherein the sample waveform is acquired from an output of the DAC.

12. The computer program product of claim 10 , wherein the sample waveform is acquired from an output of the ADC.

Assignees

• IBM

Inventors

• Lindquist Timothy
• Dahlen Paul E
• Zettles Iv George R
• Berge Layne A
• Haselhorst Kent H
• Ramirez Daniel
• Spring Sierra

Classifications

• G10L21/14

  by displaying frequency domain information · CPC title

• G06F2218/10

  by analysing the shape of a waveform, e.g. extracting parameters relating to peaks · CPC title

• G01R13/0272 Primary

  for sampling · CPC title