System for monitoring a device

Patent metadata

Field	Value
Publication number	US-12044576-B2
Application number	US-202217721496-A
Country	US
Kind code	B2
Filing date	Apr 15, 2022
Priority date	Apr 20, 2021
Publication date	Jul 23, 2024
Grant date	Jul 23, 2024

Abstract

A system and method includes an infrared camera; a processing unit; and an output unit. The infrared camera is configured to acquire a plurality of infrared images of the device, wherein the plurality of infrared images comprises a first infrared image and a second infrared image acquired a time period after the first infrared image. The processing unit is configured to determine a pixel in the first infrared image with a hottest temperature and determine a pixel in the second infrared image with a hottest temperature. The processing unit is configured to determine a first number of pixels in the first infrared image that have a temperature within a threshold temperature of the hottest temperature of the first infrared image and determine a second number of pixels in the second infrared image that have a temperature within the threshold temperature of the hottest temperature of the second infrared image.

First claim

What is claimed is:

1. A system for monitoring a device, the system comprising:
an infrared camera
configured to acquire a plurality of infrared images of the device, wherein the plurality of infrared images comprises a first infrared image and a second infrared image acquired a time period after the first infrared image;
one or more processors; and
a non-transitory computer-readable medium having processor-executable instructions stored thereon, wherein the processor-executable instructions, when executed by the one or more processors, facilitate:
determining a pixel in the first infrared image with a hottest temperature and determine a pixel in the second infrared image with a hottest temperature;
determining a first number of pixels in the first infrared image that have a temperature within a threshold temperature of the hottest temperature of the first infrared image and determine a second number of pixels in the second infrared image that have a temperature within the threshold temperature of the hottest temperature of the second infrared image;
determining a temperature magnitude comprising utilization of the hottest temperature in the second infrared image and/or a hottest temperature in a different infrared image of the plurality of infrared images acquired at a different time to the second infrared image;
determining a rate of change of temperature comprising utilization of the hottest temperature in the second infrared image and the hottest temperature in the different infrared image and a time duration between the acquisition of the second infrared image and the acquisition of the different infrared image;
determining that a hot spot exists in the device and/or a hot spot is developing in the device comprising utilization of a comparison between the first number of pixels and the second number of pixels and the temperature magnitude and the rate of change of temperature; and
outputting an indication of a fault in the device on the basis of the determination that a hot spot exists and/or is developing.

2. The system according to claim 1 , wherein the different infrared image is the first infrared image.

3. The system according to claim 1 , wherein the different infrared image was acquired at a time between the first infrared image and the second infrared image, or the second infrared image was acquired at a time between the first infrared image and the different infrared image.

4. The system according to claim 3 , wherein the time period between acquisitions of the first infrared image and the second infrared image is greater than the time duration between acquisitions of the second infrared image and the different infrared image.

5. The system according to claim 1 , wherein the threshold temperature is a fixed temperature offset.

6. The system according to claim 1 , wherein the comparison between the first number of pixels and the second number of pixels comprises a determination of a pixel count difference equal to the second number of pixels subtracted from the first number of pixels.

7. The system according to claim 6 , wherein the determination that the hot spot exists in the device and/or the hot spot is developing in the device comprises a comparison of the pixel count difference with a threshold pixel count number.

8. The system according to claim 7 , wherein the threshold pixel count number is fixed.

9. The system according to claim 7 , wherein the threshold pixel count number is a function of the hottest temperature in the first infrared image and/or in the second infrared image.

10. The system according to claim 1 , wherein the determination that the hot spot exists in the device and/or the hot spot is developing in the device comprises an analysis of one or more of: a shape of at least one region within the determined pixels in the first infrared image and second infrared image; a size of the at least one region within the determined pixels in the first infrared image and second infrared image; a position of the at least one region within the determined pixels in the first infrared image and second infrared image.

11. The system according to claim 10 , wherein the determination that the hot spot exists in the device and/or the hot spot is developing in the device comprises a determination that a region in the second infrared image is smaller than a corresponding region in the first infrared image.

12. The system according to claim 10 , wherein the determination that the hot spot exists in the device and/or the hot spot is developing in the device comprises a determination that a number of regions in the second infrared image is smaller than a number of regions in the first infrared image.

13. The system according to claim 1 , wherein the determination that the hot spot exists in the device and/or the hot spot is developing in the device comprises utilization of a machine learning algorithm.

14. The system according to claim 1 , wherein the plurality of infrared images is acquired at different times, wherein the processor-executable instructions, when executed by the one or more processors, further facilitate:
determining a pixel in each of the plurality of infrared images associated with a hottest temperature in each of the plurality of infrared images; and
determining a number of threshold pixels in each of the plurality of infrared images associated with a temperature that is within the threshold temperature of the hottest temperature in each of the plurality of infrared images, and wherein the determination that the hot spot exists in the device and/or the hot spot is developing in the device comprises a determination of a rate of change of the number of threshold pixels with time.

15. A method for monitoring a device, the method comprising:
acquiring by an infrared camera a plurality of infrared images of the device, wherein the plurality of infrared images comprises a first infrared image and a second infrared image acquired a time period after the first infrared image;
determining a pixel in the first infrared image with a hottest temperature and determining a pixel in the second infrared image with a hottest temperature;
determining a first number of pixels in the first infrared image that have a temperature within a threshold temperature of the hottest temperature of the first infrared image and determining a second number of pixels in the second infrared image that have a temperature within the threshold temperature of the hottest temperature of the second infrared image;
determining a temperature magnitude comprising utilization of the hottest temperature in the second infrared image and/or a hottest temperature in a different infrared image of the plurality of infrared images acquired at a different time to the second infrared image;
determining a rate of change of temperature comprising utilization of the hottest temperature in the second infrared image and the hottest temperature in the different infrared image and a time duration between the acquisition of the second infrared image and the acquisition of the different infrared image;
determining that a hot spot exists in the device and/or a hot spot is developing in the device comprising utilizing:
a comparison between the first number of pixels and the second number of pixels; and
the temperature magnitude and the rate of change of temperature; and

outputting an indication of a fault in the device on the basis of the determination that a hot spot exists and/or is developing.

16. The system according to claim 1 , wherein determining that the hot spot exists in the device and/or the hot spot is de

Assignees

• Abb Schweiz Ag

Inventors

• Gitzel Ralf
• Gebhardt Joerg
• Ostrowski Joerg
• Mruczek Maciej
• Papageorgiou Anastasios

Classifications

• H04N23/20

  for generating image signals from infrared radiation only · CPC title

• G01J2005/0077

  Imaging · CPC title

• G01J5/027

  making use of sensor-related data, e.g. for identification of sensor parts or optical elements · CPC title

• G06T2207/30164

  Workpiece; Machine component · CPC title

• G06T2207/20084

  Artificial neural networks [ANN] · CPC title