Gate test part and display device including the same

Patent metadata

Field	Value
Publication number	US-11908358-B2
Application number	US-202117152236-A
Country	US
Kind code	B2
Filing date	Jan 19, 2021
Priority date	May 4, 2020
Publication date	Feb 20, 2024
Grant date	Feb 20, 2024

Abstract

A gate test part includes a plurality of composite pads electrically connected to a plurality of gate lines. The gate lines extend in a first direction and are disposed along a second direction crossing the first direction. Each of the composite pads includes an antistatic pad, a first test pad spaced apart from the antistatic pad and providing a gate test signal to each of the gate lines, and a second test pad overlapping the antistatic pad and the first test pad. The second test pad electrically connects the antistatic pad and the first test pad.

First claim

What is claimed is:

1. A gate test part comprising a plurality of composite pads electrically connected to a plurality of gate lines, wherein the gate lines extend in a first direction and are disposed along a second direction crossing the first direction; and
a black matrix disposed on the composite pads,
wherein each of the composite pads comprises:
an antistatic pad;
a first test pad separated and spaced apart from the antistatic pad and providing a gate test signal to each of the gate lines; and
a second test pad overlapping the antistatic pad and the first test pad, the second test pad electrically connecting the antistatic pad and the first test pad,

wherein an area of the antistatic pad is smaller than an area of the first test pad,
wherein the second test pad contacts the antistatic pad through a plurality of first contact holes and contacts the first test pad through a second contact hole, and
wherein an area of each of the first contact holes is smaller than an area of the second contact hole.

2. The gate test part of claim 1 , wherein the composite pads are respectively connected to the gate lines.

3. The gate test part of claim 2 , wherein the composite pads are alternatively disposed in a zigzag pattern along the second direction.

4. The gate test part of claim 1 , wherein the second test pad is disposed on the antistatic pad and the first test pad.

5. The gate test part of claim 1 , wherein the antistatic pad includes a same material as the first test pad.

6. The gate test part of claim 1 , wherein lengths of the second test pad in the first direction and in the second direction is 100 um respectively.

7. The gate test part of claim 5 , wherein the area of the first test pad is smaller than an area of the second test pad.

8. The gate test part of claim 7 , wherein a length of the antistatic pad in the second direction is equal to a length of the first test pad in the second direction, and the length of the first pad in the second direction is equal to a length of the second test pad in the second direction.

9. The gate test part of claim 7 , wherein a length of the antistatic pad in the first direction is smaller than a length of the first test pad in the first direction, and the length of the first test pad is smaller than a length of the second test pad in the first direction.

10. A display device comprising:
a display panel including a plurality of gate lines;
a gate driver adjacent to the display panel and providing a gate signal to the gate lines; and
a gate test part including a plurality of composite pads and a black matrix disposed on the composite pads, wherein the composite pads are electrically connected to the gate lines,
wherein each of the composite pads comprises:
an antistatic pad;
a first test pad separated and spaced apart from the antistatic pad and providing a gate test signal to each of the gate lines; and
a second test pad overlapping the antistatic pad and the first test pad, the second test pad electrically connecting the antistatic pad and the first test pad through a plurality of contact holes,

wherein an area of the antistatic pad is smaller than an area of the first test pad,
wherein the second test pad contacts the antistatic pad through a plurality of first contact holes and contacts the first test pad through a second contact hole, and
wherein an area of each of the first contact holes is smaller than an area of the second contact hole.

11. The display device of claim 10 , wherein the gate test part is disposed between the display panel and the gate driver.

12. The display device of claim 10 , wherein the display panel further includes a plurality of pixel electrodes disposed on the gate lines, and
wherein the second test pad includes a same material as the pixel electrodes.

13. The display device of claim 12 , wherein the antistatic pad and the first test pad includes a same material as the gate lines.

14. The display device of claim 12 , wherein the display panel further includes:
an active layer disposed on the gate lines;
a source electrode disposed on the active layer; and
a drain electrode disposed on the active layer and spaced apart from the source electrode.

15. The display device of claim 10 , wherein the area of the first test pad is smaller than an area of the second test pad.

16. The display device of claim 15 , wherein the gate lines extend in a first direction and are disposed along a second direction crossing the first direction, and
wherein a length of the antistatic pad in the second direction is equal to a length of the first test pad in the second direction, and the length of the first test pad in the second direction is equal to a length of the second test pad.

17. The display device of claim 16 , wherein a length of the antistatic pad in the first direction is smaller than a length of the first test pad in the first direction, and the length of the first test pad is smaller than a length of the second test pad in the first direction.

Assignees

• Samsung Display Co Ltd

Inventors

• Shin Kwan-Yup
• Bae Jun-Ho
• Lee Mi-Sun

Classifications

• G09G3/006 Primary

  Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays (testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309) · CPC title

• G09G3/3648

  using an active matrix (G09G3/367 - G09G3/3696 take precedence) · CPC title

• G09G2300/0426

  Layout of electrodes and connections · CPC title

• G09G2330/12

  Test circuits or failure detection circuits included in a display system, as permanent part thereof · CPC title

• G09G2330/06

  Handling electromagnetic interferences [EMI], covering emitted as well as received electromagnetic radiation · CPC title