Detection device and method for gate drive circuit

Patent metadata

Field	Value
Publication number	US-2018331091-A1
Application number	US-201715523047-A
Country	US
Kind code	A1
Filing date	Mar 14, 2017
Priority date	Feb 23, 2017
Publication date	Nov 15, 2018
Grant date	—

Abstract

A detection device for a gate drive circuit and a detection method for the gate drive circuit are disclosed. In a connecting element of the detection device, a first end of the first connecting part is electrically connected with an output end of the gate drive circuit, and a second end thereof is electrically connected with the third connecting part. A first end of the second connecting part is electrically connected with the test pad, and a second end thereof is electrically insulated from the third connecting part. According to the present disclosure, the gate drive circuit can be prevented from being destroyed by electrostatic discharge (ESD), and a qualified rate of a liquid crystal display panel can be improved.

First claim

1 . A detection device for a gate drive circuit, comprising a test pad and a connecting element for electrically connecting the gate drive circuit and the test pad,
wherein the connecting element comprises a first connecting part, a second connecting part, and a third connecting part; wherein a first end of the first connecting part is electrically connected with an output end of the gate drive circuit, and a first end of the second connecting part is electrically connected with the test pad; and wherein a second end of the first connecting part is electrically connected with the third connecting part, and a second end of the second connecting part is electrically insulated from the third connecting part.

2 . The detection device according to claim 1 ,
wherein the first connecting part and the second connecting part are arranged on a first metal layer; wherein the third connecting part is arranged on a second metal layer; and wherein the first metal layer and the second metal layer are insulated from each other.

3 . The detection device according to claim 2 , wherein an insulation layer is arranged between the first metal layer and the second metal layer, so that the first metal layer and the second metal layer are insulated from each other.

4 . The detection device according to claim 3 , wherein the insulation layer is provided with at least one via hole, and the second end of the first connecting part is electrically connected with the third connecting part through the via hole.

5 . The detection device according to claim 2 , wherein the first metal layer further comprises a pattern of a scanning line of a display panel and a pattern of a gate of a switching element of the display panel.

6 . The detection device according to claim 2 , wherein the second metal layer further comprises a pattern of a data line of a display panel and a pattern of a source and a drain of a switching element of the display panel.

7 . The detection device according to claim 2 ,
wherein the insulation layer is made of silicon nitride; and/or wherein the first metal layer is made of Mo/Al, and the second metal layer is made of Mo/Al/Ge.

8 . The detection device according to claim 1 , wherein when an abnormity of a panel is detected, an insulating material between the second end of the second connecting part and the third connecting part is melted by a laser so that the second end of the second connecting part and the third connecting part are electrically connected with each other.

9 . The detection device according to claim 2 , wherein when an abnormity of a panel is detected, an insulating material between the second end of the second connecting part and the third connecting part is melted by a laser so that the second end of the second connecting part and the third connecting part are electrically connected with each other.

10 . The detection device according to claim 3 , wherein when an abnormity of a panel is detected, an insulating material between the second end of the second connecting part and the third connecting part is melted by a laser so that the second end of the second connecting part and the third connecting part are electrically connected with each other.

11 . The detection device according to claim 4 , wherein when an abnormity of a panel is detected, an insulating material between the second end of the second connecting part and the third connecting part is melted by a laser so that the second end of the second connecting part and the third connecting part are electrically connected with each other.

12 . The detection device according to claim 5 , wherein when an abnormity of a panel is detected, an insulating material between the second end of the second connecting part and the third connecting part is melted by a laser so that the second end of the second connecting part and the third connecting part are electrically connected with each other.

13 . The detection device according to claim 6 , wherein when an abnormity of a panel is detected, an insulating material between the second end of the second connecting part and the third connecting part is melted by a laser so that the second end of the second connecting part and the third connecting part are electrically connected with each other.

14 . The detection device according to claim 7 , wherein when an abnormity of a panel is detected, an insulating material between the second end of the second connecting part and the third connecting part is melted by a laser so that the second end of the second connecting part and the third connecting part are electrically connected with each other.

15 . A detection method for a gate drive circuit, comprising following steps:
providing a detection device, which comprises a test pad and a connecting element for electrically connecting the gate drive circuit and the test pad,
wherein the connecting element comprises a first connecting part, a second connecting part, and a third connecting part;
wherein a first end of the first connecting part is electrically connected with an output end of the gate drive circuit, and a first end of the second connecting part is electrically connected with the test pad; and
wherein a second end of the first connecting part is electrically connected with the third connecting part, and a second end of the second connecting part is electrically insulated from the third connecting part;
determining whether the gate drive circuit needs to be detected; and if yes, melting an insulating material between the second end of the second connecting part and the third connecting part by a laser, so that the second end of the second connecting part and the third connecting part are electrically connected with each other and an output signal of the gate drive circuit is output through the connecting element and the test pad in sequence.

16 . The detection method according to claim 15 , further comprising:
determining a state of the gate drive circuit according to a signal output by the test pad.

Assignees

• Wuhan China Star Optoelectronics Technology Co Ltd

Inventors

• Wang Jinglong

Classifications

• H10P74/273

  Interconnections for measuring or testing, e.g. probe pads · CPC title

• G09G3/006 Primary

  Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays (testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309) · CPC title

• G09G2330/12

  Test circuits or failure detection circuits included in a display system, as permanent part thereof · CPC title

• G09G2310/0267

  Details of drivers for scan electrodes, other than drivers for liquid crystal, plasma or OLED displays · CPC title

• H01L27/0251 Primary

  Electricity · mapped topic