Sample analysis systems and methods of use thereof

Patent metadata

Field	Value
Publication number	US-11837455-B2
Application number	US-202217831951-A
Country	US
Kind code	B2
Filing date	Jun 3, 2022
Priority date	Jun 16, 2014
Publication date	Dec 5, 2023
Grant date	Dec 5, 2023

Abstract

The invention generally relates to sample analysis systems and methods of use thereof. In certain aspects, the invention provides a system for analyzing a sample that includes an ion generator configured to generate ions from a sample. The system additionally includes an ion separator configured to separate at or above atmospheric pressure the ions received from the ion generator without use of laminar flowing gas, and a detector that receives and detects the separated ions.

First claim

What is claimed is:

1. A system for manipulating a sample, the system comprising:
an ion generator configured to generate ions from a sample;
an ion separator configured to separate at or above atmospheric pressure the ions received
from the ion generator, wherein the ion separator is comprised of a plurality of triangular electrode segments that operably align with each other to create a curved path for the generated ions; and
an ion focusing element that focuses the separated ions from the ion separator at or above atmospheric pressure.

2. The system according to claim 1 , further comprising a substrate positioned to receive the focused separated ions at one or more discrete locations on the substrate.

3. The system according to claim 1 , further comprising a detector that receives and detects the focused separated ions.

4. The system according to claim 3 , wherein the ion generator comprises:
an ionization source; and
an ion injector configured to interface with the ionization source such that ions produced by the ionization source are received by the ion injector.

5. The system according to claim 4 , wherein the ionization source is out-of-line with the detector.

6. The system according to claim 4 , wherein the ion injector is maintained at or above
atmospheric pressure.

7. The system according to claim 4 , wherein the ion injector comprises a cavity and one or more wire meshes that receive the ions produced by the ionization source.

8. The system according to claim 4 , wherein the ion injector receives the ions produced by the ionization source and transmits them as a focused beam to the ion separator.

9. The system according to claim 1 , wherein the ion separator comprises three triangular electrode segments.

10. The system according to claim 9 , wherein the ion separator further comprises an insulating material between each of the three triangular electrode segments.

11. A method for manipulating sample ions, the method comprising:
generating ions from a sample at or above atmospheric pressure;
separating the ions at or above atmospheric pressure using an ion separator configured to separate at or above atmospheric pressure the ions received from the ion generator, wherein the ion separator is comprised of a plurality of triangular electrode segments that operably align with each other to create a curved path for the generated ions; and
focusing the separated ions at or above atmospheric pressure, thereby manipulating the sample ions.

12. The method according to claim 11 , further comprising depositing the focused separated ions at one or more discrete locations on a substrate.

13. The method according to claim 11 , further comprising detecting the focused separated ions.

14. The method according to claim 13 , wherein the detecting step is at or above atmospheric pressure.

15. The method according to claim 13 , wherein the detecting step is below atmospheric
pressure.

16. The method according to claim 13 , wherein detecting comprises receiving the ions into a mass spectrometer or a miniature mass spectrometer.

17. The method according to claim 11 , wherein the ion separator comprises three triangular electrode segments.

Assignees

• Purdue Research Foundation

Inventors

• Cooks Robert Graham
• Baird Zane
• Wei Pu

Classifications

• H01J49/24 Primary

  Vacuum systems, e.g. maintaining desired pressures · CPC title

• G01N27/622

  Ion mobility spectrometry · CPC title

• G01N27/623

  combined with mass spectrometry · CPC title

• H01J49/0013

  Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components · CPC title

• H01J49/061

  Ion deflecting means, e.g. ion gates · CPC title