Systems and methods for transfer of ions for analysis

Patent metadata

Field	Value
Publication number	US-9159540-B2
Application number	US-201514594217-A
Country	US
Kind code	B2
Filing date	Jan 12, 2015
Priority date	Oct 13, 2008
Publication date	Oct 13, 2015
Grant date	Oct 13, 2015

Abstract

The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.

First claim

What is claimed is:

1. A system for analyzing a sample, the system comprising:
an ionizing source for converting molecules of a sample into sample ions;
an ion analysis device;
a pump external to the ion analysis device; and
an ion transfer member, wherein the pump facilitates collection of the sample ions in the ion transfer member, which sample ions are transferred through the ion transfer member to an inlet of the ion analysis device, wherein the ion transfer member is a tube that has a diameter greater than a diameter of the inlet of the ion analysis device.

2. The system according to claim 1 , wherein the pump produces a laminar gas flow without regions of recirculation that transfers the sample ions through the ion transfer member to the inlet of the ion analysis device.

3. The system according to claim 1 , wherein the ionizing source comprises a gas inlet port and an electrode positioned within the source to interact with a gas introduced through the gas inlet port and to generate a discharge that interacts with the sample to produce the sample ions.

4. The system according to claim 1 , wherein the sample ions are produced in a region at about atmospheric pressure.

5. The system according to claim 1 , wherein the tube is composed of a rigid material.

6. The system according to claim 5 , wherein the rigid material is metal or glass.

7. The system according to claim 1 , wherein the tube is straight.

8. The system according to claim 1 , wherein the ionizing source is selected from the group consisting of: an electrospray ionization source, a nano-electrospray ionization source, an atmospheric pressure matrix-assisted laser desorption ionization source, an atmospheric pressure chemical ionization source, a desorption electrospray ionization source, an atmospheric pressure dielectric barrier discharge ionization source, an atmospheric pressure low temperature plasma desorption ionization source, and an electrospray-assisted laser desorption ionization source.

9. The system according to claim 1 , wherein the ion analysis device is selected from the group consisting of a mass spectrometer, a handheld mass spectrometer, and an ion mobility ion analysis device.

10. The system according to claim 9 , wherein the mass spectrometer is selected from the group consisting of: a quadrupole ion trap, a rectilinear ion trap, a cylindrical ion trap, a ion cyclotron resonance trap, an orbitrap, a sector, and a time of flight mass spectrometer.

11. The system according to claim 1 , further comprising a sample stage configured to hold the sample.

12. The system according to claim 11 , wherein the ionizing source is arranged such that a distal tip of the ionizing source is pointed at the sample stage.

13. A system for analyzing a sample, the system comprising:
a sample stage configured to hold a sample;
an ionizing source arranged such that a distal tip of the ionizing source is pointed at the sample stage so that sample ions are generated from the sample;
an ion analysis device;
a pump external to the ion analysis device; and
an ion transfer member, wherein the pump facilitates collection of the sample ions in the ion transfer member, which sample ions are transferred through the ion transfer member to an inlet of the ion analysis device, wherein the pump produces a laminar gas flow without regions of recirculation that transfers the sample ions through the ion transfer member to the inlet of the ion analysis device.

14. The system according to claim 13 , wherein the ionizing source comprises a gas inlet port and an electrode positioned within the source to interact with a gas introduced through the gas inlet port and to generate a discharge that interacts with the sample to produce the sample ions.

15. The system according to claim 13 , wherein the sample ions are produced in a region at about atmospheric pressure.

16. The system according to claim 13 , wherein the ion transfer member is a tube.

17. The system according to claim 16 , wherein the tube is composed of a rigid material.

18. The system according to claim 17 , wherein the rigid material is metal or glass.

19. The system according to claim 16 , wherein the tube has a diameter greater than a diameter of the inlet of the ion analysis device.

20. The system according to claim 16 , wherein the tube is straight.

21. The system according to claim 13 , wherein the ionizing source is selected from the group consisting of: an electrospray ionization source, a nano-electrospray ionization source, an atmospheric pressure matrix-assisted laser desorption ionization source, an atmospheric pressure chemical ionization source, a desorption electrospray ionization source, an atmospheric pressure dielectric barrier discharge ionization source, an atmospheric pressure low temperature plasma desorption ionization source, and an electrospray-assisted laser desorption ionization source.

22. The system according to claim 13 , wherein the ion analysis device is selected from the group consisting of a mass spectrometer, a handheld mass spectrometer, and an ion mobility ion analysis device.

23. The system according to claim 22 , wherein the mass spectrometer is selected from the group consisting of: a quadrupole ion trap, a rectilinear ion trap, a cylindrical ion trap, a ion cyclotron resonance trap, an orbitrap, a sector, and a time of flight mass spectrometer.

Assignees

• Purdue Research Foundation

Inventors

• Ouyang Zheng
• Cooks Robert Graham
• Garimella Sandilya Venkata
• Harper Jason David
• Charipar Nicholas Alan

Classifications

• H01J49/0459

  for solid samples · CPC title

• H01J49/0404 Primary

  Capillaries used for transferring samples or ions (electrospray nozzles H01J49/167) · CPC title

• H01J49/0031

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• H01J49/0027

  Methods for using particle spectrometers · CPC title

• H01J49/10

  Ion sources; Ion guns · CPC title