Semiconductor device including a groove within a resin insulating part positioned between and covering parts of a first electrode and a second electrode

US11569141B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11569141-B2
Application numberUS-201817058283-A
CountryUS
Kind codeB2
Filing dateAug 8, 2018
Priority dateAug 8, 2018
Publication dateJan 31, 2023
Grant dateJan 31, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A semiconductor device includes a first electrode; a second electrode; a resin case surrounding the first electrode and the second electrode; and a resin insulating part made of a material the same as a material of the resin case and covering part of the first electrode and part of the second electrode inside the resin case. The resin insulating part contacts an inner wall of the resin case or is separated from the inner wall of the resin case. A move positioned between the first electrode and the second electrode is formed at the resin insulating part, and thus a space in which the resin insulating part does not exist or a material different from the resin insulating part is provided between the first electrode and the second electrode.

First claim

Opening claim text (preview).

The invention claimed is: 1. A semiconductor device comprising: a first electrode; a second electrode; a resin case surrounding the first electrode and the second electrode; and a resin insulating part made of a material same as a material of the resin case and covering part of the first electrode and part of the second electrode inside the resin case, wherein a groove positioned between the first electrode and the second electrode is formed within the resin insulating part, the groove having an opening at each of two opposite ends of the groove. 2. The semiconductor device according to claim 1 , wherein the resin insulating part contacts an inner wall of the resin case. 3. The semiconductor device according to claim 2 , wherein the groove is provided at a part where the first electrode and the second electrode are closest to each other. 4. The semiconductor device according to claim 2 , wherein the first electrode is a collector electrode, and the second electrode is an emitter electrode. 5. The semiconductor device according to claim 2 , wherein the groove is one of a plurality of grooves formed within the resin insulating part, each of the plurality of grooves being positioned between the first electrode and the second electrode. 6. The semiconductor device according to claim 1 , wherein the groove is provided at a part where the first electrode and the second electrode are closest to each other. 7. The semiconductor device according to claim 6 , wherein the first electrode is a collector electrode, and the second electrode is an emitter electrode. 8. The semiconductor device according to claim 6 , wherein the groove is one of a plurality of grooves formed within the resin insulating part, each of the plurality of grooves being positioned between the first electrode and the second electrode. 9. The semiconductor device according to claim 1 , wherein the first electrode is a collector electrode, and the second electrode is an emitter electrode. 10. The semiconductor device according to claim 1 , wherein the groove is one of a plurality of grooves formed within the resin insulating part, each of the plurality of grooves being positioned between the first electrode and the second electrode. 11. The semiconductor device according to claim 1 , further comprising an insulator made of an organic material and provided to the groove. 12. The semiconductor device according to claim 1 , further comprising a semiconductor chip provided inside the resin case. 13. The semiconductor device according to claim 12 , wherein the semiconductor chip is formed of a wide bandgap semiconductor. 14. The semiconductor device according to claim 13 , wherein the wide bandgap semiconductor is silicon carbide, a gallium nitride material, or diamond. 15. The semiconductor device according to claim 1 , wherein the resin case includes outer walls having a height extending in a direction perpendicular to a plane and the groove extends longitudinally in a direction parallel to the plane. 16. The semiconductor device according to claim 1 , the semiconductor device further comprising an insulator made of a different material from the resin case and provided to the groove. 17. A semiconductor device comprising: a first electrode; a second electrode; a resin case surrounding the first electrode and the second electrode; and a resin insulating part made of a material same as a material of the resin case and covering part of the first electrode and part of the second electrode inside the resin case, wherein a groove positioned between the first electrode and the second electrode is formed at the resin insulating part, and a depth of the groove is equal to or larger than an embedding depth of the first electrode or the second electrode with respect to a position of an opening end of the groove. 18. The semiconductor device according to claim 17 , wherein the first electrode is a collector electrode, and the second electrode is an emitter electrode. 19. The semiconductor device according to claim 17 , wherein the resin insulating part contacts an inner wall of the resin case. 20. The semiconductor device according to claim 17 , wherein the groove is provided at a part where the first electrode and the second electrode are closest to each other. 21. A semiconductor device comprising: a first electrode; a second electrode; a resin case surrounding the first electrode and the second electrode; and a resin insulating part made of a material same as a material of the resin case and covering part of the first electrode and part of the second electrode inside the resin case, wherein a groove positioned between the first electrode and the second electrode is formed at the resin insulating part, and the semiconductor device further comprises a solid insulator made of an inorganic material and provided to the groove. 22. A semiconductor device comprising: a first electrode; a second electrode; a resin case surrounding the first electrode and the second electrode; and a resin insulating part made of a material same as a material of the resin case and covering part of the first electrode and part of the second electrode inside the resin case, wherein a groove positioned between the first electrode and the second electrode is formed at the resin insulating part, and the groove is provided with insulation gas having an insulating property higher than an insulating property of air.

Assignees

Inventors

Classifications

  • H01L23/057Primary

    Electricity · mapped topic

  • Electricity · mapped topic

  • Electricity · mapped topic

  • Insulating materials, e.g. resins, glasses or ceramics · CPC title

  • between a chip and a stacked insulating package substrate, interposer or RDL · CPC title

Patent family

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Frequently asked questions

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What does patent US11569141B2 cover?
A semiconductor device includes a first electrode; a second electrode; a resin case surrounding the first electrode and the second electrode; and a resin insulating part made of a material the same as a material of the resin case and covering part of the first electrode and part of the second electrode inside the resin case. The resin insulating part contacts an inner wall of the resin case or …
Who is the assignee on this patent?
Mitsubishi Electric Corp
What technology area does this patent fall under?
Primary CPC classification H01L23/057. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jan 31 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).