EUV radiation source, insert for an EUV radiation source and insert for an insert for an EUV radiation source

US11550225B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11550225-B2
Application numberUS-202117336480-A
CountryUS
Kind codeB2
Filing dateJun 2, 2021
Priority dateJun 3, 2020
Publication dateJan 10, 2023
Grant dateJan 10, 2023

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

An inner insert for a passage opening in an outer insert for an EUV radiation source is embodied in multiple parts and/or has a plurality of sections that extend in the longitudinal direction and have different internal diameters (di, da).

First claim

Opening claim text (preview).

What is claimed is: 1. An EUV radiation source, comprising a source chamber with a chamber wall having at least one chamber opening, a first insert, inserted into the chamber opening, with an outer passage channel extending in a longitudinal direction, and an inner insert, arranged in the outer passage channel, with an inner passage channel extending in the longitudinal direction, wherein the inner insert is embodied in two or more separate parts that adjoin one another in the longitudinal direction and has a plurality of sections that extend in the longitudinal direction and have different internal diameters (di, da), which are constant in the longitudinal direction. 2. The EUV radiation source of claim 1 , wherein the inner insert is arranged in the outer passage channel such that it completely covers an inner wall, which extends parallel to the longitudinal direction from a first end region to a second end region, of the outer passage channel in the region of the first end region in the direction perpendicular to the longitudinal direction. 3. An insert configured to be disposed in a source chamber of an EUV radiation source, in which the source chamber comprises a chamber wall having at least one chamber opening, the insert comprising an outer passage channel extending in a longitudinal direction, and an inner insert, arranged in the outer passage channel, with an inner passage channel extending in the longitudinal direction, wherein the inner insert is embodied in two or more separate parts that adjoin one another in the longitudinal direction and has a plurality of sections that extend in the longitudinal direction and have different internal diameters (di, da), which are constant in the longitudinal direction. 4. The insert of claim 3 , wherein the inner insert lies flat against the inside of the outer passage channel. 5. The insert of claim 3 , wherein the inner insert is arranged in the outer passage channel such that it completely covers an inner wall, which extends parallel to the longitudinal direction from a first end region to a second end region, of the outer passage channel in the region of the first end region in the direction perpendicular to the longitudinal direction. 6. An illumination system for a projection exposure apparatus, a mask inspection apparatus or a metrology system, having an EUV radiation source with an insert according to claim 3 . 7. A projection exposure apparatus for EUV lithography, comprising the illumination system according to claim 6 for illuminating a reticle arranged in an object field, and a projection optical unit for imaging the reticle onto a wafer arranged in an image field. 8. The projection exposure apparatus of claim 7 , wherein the inner insert lies flat against the inside of the outer passage channel. 9. The projection exposure apparatus of claim 7 , wherein the inner insert is arranged in the outer passage channel such that it completely covers an inner wall, which extends parallel to the longitudinal direction from a first end region to a second end region, of the outer passage channel in the region of the first end region in the direction perpendicular to the longitudinal direction. 10. A metrology system for inspecting a mask for EUV lithography, having the illumination system according to claim 6 . 11. The illumination system of claim 6 , wherein the inner insert lies flat against the inside of the outer passage channel. 12. The illumination system of claim 6 , wherein the inner insert is arranged in the outer passage channel such that it completely covers an inner wall, which extends parallel to the longitudinal direction from a first end region to a second end region, of the outer passage channel in the region of the first end region in the direction perpendicular to the longitudinal direction. 13. The illumination system of claim 6 , wherein the inner insert is produced at least partially from molybdenum or a molybdenum compound.

Assignees

Inventors

Classifications

  • Mask illumination systems · CPC title

  • by plasma extreme ultraviolet [EUV] sources · CPC title

  • Assembly, maintenance, transport or storage of apparatus · CPC title

  • Production of X-ray radiation generated from plasma · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US11550225B2 cover?
An inner insert for a passage opening in an outer insert for an EUV radiation source is embodied in multiple parts and/or has a plurality of sections that extend in the longitudinal direction and have different internal diameters (di, da).
Who is the assignee on this patent?
Zeiss Carl Smt Gmbh
What technology area does this patent fall under?
Primary CPC classification G03F7/70033. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 10 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).