Intracardiac catheter with x-ray emitting probe
US-2026033884-A1 · Feb 5, 2026 · US
Production of X-ray radiation generated from plasma
Production of X-ray radiation generated from plasma · Cooperative Patent Classification (CPC)
Electric circuits, power, telecommunications, and semiconductors.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | H05G2/001 |
| Official title | {Production of X-ray radiation generated from plasma} |
| Display label | Production of X-ray radiation generated from plasma |
| Total patents | 52 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is growing.
| Year | Patents |
|---|---|
| 2015 | 6 |
| 2016 | 6 |
| 2017 | 14 |
| 2018 | 5 |
| 2019 | 3 |
| 2020 | 3 |
| 2021 | 2 |
| 2022 | 4 |
| 2023 | 4 |
| 2024 | 1 |
| 2025 | 3 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Metrology apparatus based on high harmonic generation and associated method
US-12411421-B2 · Sep 9, 2025 · US
Insert for a source chamber of an EUV radiation source
US-12292690-B2 · May 6, 2025 · US
Electron beam-based extreme ultraviolet light source device
US-2025040022-A1 · Jan 30, 2025 · US
Metrology apparatus based on high harmonic generation and associated method
US-2024004312-A1 · Jan 4, 2024 · US
Graded interface in Bragg reflector
US-11720013-B2 · Aug 8, 2023 · US
Method and apparatus for EUV mask inspection
US-11635700-B2 · Apr 25, 2023 · US
Insert for a source chamber of an euv radiation source
US-2023019744-A1 · Jan 19, 2023 · US
EUV radiation source, insert for an EUV radiation source and insert for an insert for an EUV radiation source
US-11550225-B2 · Jan 10, 2023 · US
Method and Apparatus for EUV Mask Inspection
US-2022260928-A1 · Aug 18, 2022 · US
Graded Interface In Bragg Reflector
US-2022221786-A1 · Jul 14, 2022 · US
Graded interface in bragg reflector
US-11327394-B2 · May 10, 2022 · US
Method of operating semiconductor apparatus and semiconductor apparatus
US-11243479-B2 · Feb 8, 2022 · US
Euv radiation source, insert for an euv radiation source and insert for an insert for an euv radiation source
US-2021382395-A1 · Dec 9, 2021 · US
X-ray metrology system with broadband laser produced plasma illuminator
US-10959318-B2 · Mar 23, 2021 · US
Graded Interface In Bragg Reflector
US-2020333700-A1 · Oct 22, 2020 · US
Charged particle beam irradiation apparatus, charged particle beam image acquisition apparatus, and charged particle beam inspection apparatus
US-10790110-B2 · Sep 29, 2020 · US
High-temperature plasma raw material supply apparatus and extreme ultra violet light source apparatus
US-10609802-B2 · Mar 31, 2020 · US
Charged Particle Beam Irradiation Apparatus, Charged Particle Beam Image Acquisition Apparatus, and Charged Particle Beam Inspection Apparatus
US-2019304737-A1 · Oct 3, 2019 · US
Radiation system and optical device
US-10359710-B2 · Jul 23, 2019 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC H05G2/001?
- CPC H05G2/001 is the Cooperative Patent Classification code for “Production of X-ray radiation generated from plasma.”
- How many patents are filed under CPC H05G2/001 (Production of X-ray radiation generated from plasma)?
- Our database includes 52 publications tagged with this CPC code.
- Is patent activity under CPC H05G2/001 growing?
- Publication counts under this code: 1 in 2024 vs 3 in 2025 (latest complete years).