Sample analysis systems and methods of use thereof

Patent metadata

Field	Value
Publication number	US-11380534-B2
Application number	US-202016895082-A
Country	US
Kind code	B2
Filing date	Jun 8, 2020
Priority date	Jun 16, 2014
Publication date	Jul 5, 2022
Grant date	Jul 5, 2022

Abstract

The invention generally relates to sample analysis systems and methods of use thereof. In certain aspects, the invention provides a system for analyzing a sample that includes an ion generator configured to generate ions from a sample. The system additionally includes an ion separator configured to separate at or above atmospheric pressure the ions received from the ion generator without use of laminar flowing gas, and a detector that receives and detects the separated ions.

First claim

What is claimed is:

1. A system for manipulating a sample, the system comprising:
an ion generator configured to generate ions from a sample;
an ion separator configured to separate at or above atmospheric pressure the ions received
from the ion generator without use of laminar flowing gas, wherein the ion separator comprises a chamber and a plurality of electrodes physically coupled to each other, arranged sequential to each other, and that are configured such that upon application of voltage to the electrodes, ions received from the ion injector are separated as they travel through the chamber, wherein none of the plurality of electrodes are parallel to each other;
an electrical element that selectively prevents transmission of the generated ions into the ion separator until a threshold voltage is exceeded, wherein the electrical element comprises a plurality of wire meshes that are separated from each other and configured such that a second of the plurality of meshes is held flush to an opening of the ion separator; and
an ion focusing element that focuses the separated ions from the ion separator at or above atmospheric pressure.

2. The system according to claim 1 , further comprising a substrate positioned to the receive the focused separated ions at one or more discrete locations on the substrate.

3. The system according to claim 1 , further comprising a detector that receives and detects the focused separated ions.

4. The system according to claim 3 , wherein the ion generator comprises:
an ionization source; and
an ion injector configured to interface with the ionization source such that ions produced by the ionization source are received by the ion injector.

5. The system according to claim 4 , wherein the ionization source is out-of-line with the detector.

6. The system according to claim 4 , wherein the ion injector is maintained at or above atmospheric pressure.

7. The system according to claim 4 , wherein the ion injector comprises a cavity and one or more wire meshes that receive the ions produced by the ionization source.

8. The system according to claim 4 , wherein the ion injector receive the ions produced by the ionization source and transmits them as a focused beam to the ion separator.

9. The system according to claim 1 , wherein the plurality of electrodes are three curved electrodes.

10. A method for manipulating sample ions, the method comprising:
generating ions from a sample at or above atmospheric pressure;
separating the ions at or above atmospheric pressure without use of laminar flowing gas, wherein separating comprises sending the ions into a chamber that comprises a plurality of electrodes physically coupled to each other, arranged sequential to each other, and that are configured such that upon application of voltage to the electrodes, the ions received from the ion injector are separated as they travel through the chamber, wherein none of the plurality of electrodes are parallel to each other;
an electrical element that selectively prevents transmission of the generated ions into the ion separator until a threshold voltage is exceeded, wherein the electrical element comprises a plurality of wire meshes that are separated from each other and configured such that a second of the plurality of wire meshes is held flush to an opening of the ion separator; and
focusing the separated ions at or above atmospheric pressure, thereby manipulating the sample ions.

11. The method according to claim 10 , further comprising depositing the focused separated ions at one or more discrete locations on a substrate.

12. The method according to claim 10 , further comprising detecting the focused separated ions.

13. The method according to claim 12 , wherein the detecting step is at or above atmospheric pressure.

14. The method according to claim 12 , wherein the detecting step is below atmospheric pressure.

15. The method according to claim 12 , wherein detecting comprises receiving the ions into a mass spectrometer or a miniature mass spectrometer.

16. The method according to claim 10 , wherein the separating step comprises transferring the ions into an ion separator that comprises a chamber and a plurality of electrodes that are configured such that upon application of voltage to the electrodes, the ions are separated as they travel through the chamber.

Assignees

• Purdue Research Foundation

Inventors

• Cooks Robert Graham
• Baird Zane
• Wei Pu

Classifications

• G01N27/622

  Ion mobility spectrometry · CPC title

• G01N27/623

  combined with mass spectrometry · CPC title

• H01J49/061

  Ion deflecting means, e.g. ion gates · CPC title

• H01J49/0013

  Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components · CPC title

• H01J27/024 Primary

  Extraction optics, e.g. grids · CPC title