Auto-referenced memory cell read techniques

US11282574B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11282574-B2
Application numberUS-202017062127-A
CountryUS
Kind codeB2
Filing dateOct 2, 2020
Priority dateDec 22, 2017
Publication dateMar 22, 2022
Grant dateMar 22, 2022

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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Abstract

Official abstract text for this publication.

Methods, systems, and devices related to auto-referenced memory cell read techniques are described. The auto-referenced read may encode user data to include a predetermined number of bits having a first logic state prior to storing the user data in memory cells. The auto-referenced read may store a total number of bits of the user data having a first logic state in a separate set of memory cells. Subsequently, reading the user data may be carried out by applying a read voltage to the memory cells storing the user data while monitoring a series of switching events by activating a subset of the memory cells having the first logic state. During the read operation, the auto-referenced read may compare the number of activated memory cells to either the predetermined number or the total number to determine whether all the bits having the first logic state has been detected. When the number of activated memory cells matches either the predetermined number or the total number, the auto-referenced read may determine that the memory cells that have been activated correspond to the first logic state.

First claim

Opening claim text (preview).

What is claimed is: 1. A method, comprising: receiving, at a controller, a first set of bits of an input vector from a host device; allocating a block of memory to store the first set of bits of the input vector and a second set of bits based at least in part on a total number bits of the first set of bits; generating the second set of bits based at least in part on a number of bits of the first set of bits having a first logic state; and writing the first set of bits and the second set of bits at the block of memory. 2. The method of claim 1 , wherein: the second set of bits comprises multiple couples of bits representative of the number of bits of the first set of bits having the first logic state. 3. The method of claim 1 , wherein generating the second set of bits comprises: determining the number of bits of the first set of bits having the first logic state; and generating a set of bit values corresponding to the determined number of bits. 4. The method of claim 1 , wherein: the first logic state is associated with a logic state of 1. 5. The method of claim 1 , wherein: the first logic state is associated with a logic state corresponding to a first set of threshold voltages. 6. The method of claim 5 , wherein: the first set of threshold voltages are threshold voltages less than threshold voltages of a second set of threshold voltages associated with a second logic state. 7. The method of claim 6 , wherein: the second logic state is associated with a logic state of 0. 8. An apparatus, comprising: a block of memory; and a controller coupled with the block of memory and operable to cause the apparatus to: receive a first set of bits of an input vector from a host device; allocate the block of memory to store the first set of bits of the input vector and a second set of bits based at least in part on a total number bits of the first set of bits; generate the second set of bits based at least in part on a number of bits of the first set of bits having a first logic state; and write the first set of bits and the second set of bits at the block of memory. 9. The apparatus of claim 8 , wherein: the second set of bits comprises multiple couples of bits representative of the number of bits of the first set of bits having the first logic state. 10. The apparatus of claim 8 , wherein the controller is further operable to cause the apparatus to: determine the number of bits of the first set of bits having the first logic state; and generate a set of bit values corresponding to the determined number of bits. 11. The apparatus of claim 8 , wherein: the first logic state is associated with a logic state of 1. 12. The apparatus of claim 8 , wherein: the first logic state is associated with a logic state corresponding to a first set of threshold voltages. 13. The apparatus of claim 12 , wherein: the first set of threshold voltages are threshold voltages less than threshold voltages of a second set of threshold voltages associated with a second logic state. 14. The apparatus of claim 13 , wherein: the second logic state is associated with a logic state of 0. 15. An apparatus, comprising: means for receiving, at a controller, a first set of bits of an input vector from a host device; means for allocating a block of memory to store the first set of bits of the input vector and a second set of bits based at least in part on a total number bits of the first set of bits; means for generating the second set of bits based at least in part on a number of bits of the first set of bits having a first logic state; and means for writing the first set of bits and the second set of bits at the block of memory. 16. The apparatus of claim 15 , wherein: the second set of bits comprises multiple couples of bits representative of the number of bits of the first set of bits having the first logic state. 17. The apparatus of claim 15 , wherein the means for generating the second set of bits comprises: means for determining the number of bits of the first set of bits having the first logic state; and means for generating a set of bit values corresponding to the determined number of bits. 18. The apparatus of claim 15 , wherein: the first logic state is associated with a logic state of 1. 19. The apparatus of claim 15 , wherein: the first logic state is associated with a logic state corresponding to a first set of threshold voltages. 20. The apparatus of claim 19 , wherein: the first set of threshold voltages are threshold voltages less than threshold voltages of a second set of threshold voltages associated with a second logic state; and the second logic state is associated with a logic state of 0.

Assignees

Inventors

Classifications

  • Array using an access device for each cell which being not a transistor and not a diode · CPC title

  • Array wherein the access device being a diode · CPC title

  • Three dimensional array · CPC title

  • Read is performed on a reference element, e.g. cell, and the reference sensed value is used to compare the sensed value of the selected cell · CPC title

  • Cell access · CPC title

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What does patent US11282574B2 cover?
Methods, systems, and devices related to auto-referenced memory cell read techniques are described. The auto-referenced read may encode user data to include a predetermined number of bits having a first logic state prior to storing the user data in memory cells. The auto-referenced read may store a total number of bits of the user data having a first logic state in a separate set of memory cell…
Who is the assignee on this patent?
Micron Technology Inc
What technology area does this patent fall under?
Primary CPC classification G11C11/5678. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 22 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).